The space-air-ground integrated network(SAGIN)combines the superiority of the satellite,aerial,and ground communications,which is envisioned to provide high-precision positioning ability as well as seamless connectivi...The space-air-ground integrated network(SAGIN)combines the superiority of the satellite,aerial,and ground communications,which is envisioned to provide high-precision positioning ability as well as seamless connectivity in the 5G and Beyond 5G(B5G)systems.In this paper,we propose a three-dimensional SAGIN localization scheme for ground agents utilizing multi-source information from satellites,base stations and unmanned aerial vehicles(UAVs).Based on the designed scheme,we derive the positioning performance bound and establish a distributed maximum likelihood algorithm to jointly estimate the positions and clock offsets of ground agents.Simulation results demonstrate the validity of the SAGIN localization scheme and reveal the effects of the number of satellites,the number of base stations,the number of UAVs and clock noise on positioning performance.展开更多
Based on an avalanche photodiode( APD) detecting array working in Geiger mode( GM-APD), a high-performance infrared sensor readout integrated circuit( ROIC) used for infrared 3D( three-dimensional) imaging is ...Based on an avalanche photodiode( APD) detecting array working in Geiger mode( GM-APD), a high-performance infrared sensor readout integrated circuit( ROIC) used for infrared 3D( three-dimensional) imaging is proposed. The system mainly consists of three functional modules, including active quenching circuit( AQC), time-to-digital converter( TDC) circuit and other timing controller circuit. Each AQC and TDC circuit together constitutes the pixel circuit. Under the cooperation with other modules, the current signal generated by the GM-APD sensor is detected by the AQC, and the photon time-of-flight( TOF) is measured and converted to a digital signal output to achieve a better noise suppression and a higher detection sensitivity by the TDC. The ROIC circuit is fabricated by the CSMC 0. 5 μm standard CMOS technology. The array size is 8 × 8, and the center distance of two adjacent cells is 100μm. The measurement results of the chip showthat the performance of the circuit is good, and the chip can achieve 1 ns time resolution with a 250 MHz reference clock, and the circuit can be used in the array structure of the infrared detection system or focal plane array( FPA).展开更多
In order to solve the problem that the testing cost of the three-dimensional integrated circuit(3D IC)is too high,an optimal stacking order scheme is proposed to reduce the mid-bond test cost.A new testing model is bu...In order to solve the problem that the testing cost of the three-dimensional integrated circuit(3D IC)is too high,an optimal stacking order scheme is proposed to reduce the mid-bond test cost.A new testing model is built with the general consideration of both the test time for automatic test equipment(ATE)and manufacturing failure factors.An algorithm for testing cost and testing order optimization is proposed,and the minimum testing cost and optimized stacking order can be carried out by taking testing bandwidth and testing power as constraints.To prove the influence of the optimal stacking order on testing costs,two baselines stacked in sequential either in pyramid type or in inverted pyramid type are compared.Based on the benchmarks from ITC 02,experimental results show that for a 5-layer 3D IC,under different constraints,the optimal stacking order can reduce the test costs on average by 13%and 62%,respectively,compared to the pyramid type and inverted pyramid type.Furthermore,with the increase of the stack size,the test costs of the optimized stack order can be decreased.展开更多
The state-of-the-art multi-core computer systems are based on Very Large Scale three Dimensional (3D) Integrated circuits (VLSI). In order to provide high-speed vertical data transmission in such 3D systems, efficient...The state-of-the-art multi-core computer systems are based on Very Large Scale three Dimensional (3D) Integrated circuits (VLSI). In order to provide high-speed vertical data transmission in such 3D systems, efficient Through-Silicon Via (TSV) technology is critically important. In this paper, various Radio Frequency (RF) TSV designs and models are proposed. Specifically, the Cu-plug TSV with surrounding ground TSVs is used as the baseline structure. For further improvement, the dielectric coaxial and novel air-gap coaxial TSVs are introduced. Using the empirical parameters of these coaxial TSVs, the simulation results are obtained demonstrating that these coaxial RF-TSVs can provide two-order higher of cut-off frequencies than the Cu-plug TSVs. Based on these new RF-TSV technologies, we propose a novel 3D multi-core computer system as well as new architectures for manipulating the interfaces between RF and baseband circuit. Taking into consideration the scaling down of IC manufacture technologies, predictions for the performance of future generations of circuits are made. With simulation results indicating energy per bit and area per bit being reduced by 7% and 11% respectively, we can conclude that the proposed method is a worthwhile guideline for the design of future multi-core computer ICs.展开更多
Electrical ground looks simple on a schematic; unfortunately, the actual performance of a circuit is dictated by its layout (and by its printed-circuit-board). When the ground node moves, system performance suffers ...Electrical ground looks simple on a schematic; unfortunately, the actual performance of a circuit is dictated by its layout (and by its printed-circuit-board). When the ground node moves, system performance suffers and the system radiates electromagnetic interferences. But the understanding of the physics of ground noise can provide an intuitive sense for reducing the problem. Ground bounce can produce transients with amplitudes of volts; most often changing magnetic flux is the cause; in this work, the authors use a Finite-Difference Time-Domain to begin to understand such phenomena. Additionally, predicting substrate cross-talks in mixed-signal circuits has become a critical issue to preserve signal integrity in future integrated systems. Phenomena that involve parasitic signal propagation into the substrate are discussed. A simple methodology to predict the substrate cross-talk and some associated tools are presented. Finally, the authors indicate a stochastic method which could grasp both outer or inner RF (Radio-Frequency) radiations and substrate parasites.展开更多
三维集成电路(three dimensional integrated circuit,3DIC)和片上网络(network on chip,NoC)是集成电路设计发展的两个趋势.将两者结合的三维片上网络(three dimensional networks on chip,3DNoC)是当前研究的热点之一.针对现有3DNoC...三维集成电路(three dimensional integrated circuit,3DIC)和片上网络(network on chip,NoC)是集成电路设计发展的两个趋势.将两者结合的三维片上网络(three dimensional networks on chip,3DNoC)是当前研究的热点之一.针对现有3DNoC的研究没有充分关注硅片内与硅片间的异构通信特征.提出了面向通信特征的硅片间单跳步(single hop inter dies,SHID)体系结构,该结构采用异构拓扑结构和硅片间扩展路由器(express inter dies router,EIDR).通过实验数据的分析表明,与3DMesh和NoC-Bus这两种已有的3DNoC结构相比,SHID结构有以下特点:1)延迟较低,4层堆叠时比3D-Mesh低15.1%,比NoC-Bus低11.5%;2)功耗与NoC-Bus相当,比3D-Mesh低10%左右;3)吞吐率随堆叠层数增加下降缓慢,16层堆叠时吞吐率比3D-Mesh高66.98%,比NoC-Bus高314.49%.SHID体系结构同时具备性能和可扩展性的优势,是未来3DNoC体系结构良好设计选择.展开更多
Hierarchical art was used to solve the mixed mode placement for three dimensional (3-D) integrated circuit design. The 3-D placement flow stream includes hierarchical clustering, hierarchical 3-D floorplanning, vert...Hierarchical art was used to solve the mixed mode placement for three dimensional (3-D) integrated circuit design. The 3-D placement flow stream includes hierarchical clustering, hierarchical 3-D floorplanning, vertical via mapping, and recursive two dimensional (2-D) global/detailed placement phases. With state-of-the-art clustering and de-clustering phases, the design complexity was reduced to enhance the placement algorithm efficiency and capacity. The 3-D floorplanning phase solved the layer assignment problem and controlled the number of vertical vias. The vertical via mapping transformed the 3-D placement problem to a set of 2-D placement sub-problems, which not only simplifies the original 3-D placement problem, but also generates the vertical via assignment solution for the routing phase. The design optimizes both the wire length and the thermal load in the floorplan and placement phases to improve the performance and reliability of 3-D integrate circuits. Experiments on IBM benchmarks show that the total wire length is reduced from 15% to 35% relative to 2-D placement with two to four stacked layers, with the number of vertical vias minimized to satisfy a pre-defined upper bound constraint. The maximum temperature is reduced by 16% with two-stage optimization on four stacked layers.展开更多
Semiconducting carbon nanotube (CNT) field effect transistor (FET) is attractive for constructing three-dimensional (3D) integrated circuits (ICs) because of its low-temperature processes and low power dissipation. Ho...Semiconducting carbon nanotube (CNT) field effect transistor (FET) is attractive for constructing three-dimensional (3D) integrated circuits (ICs) because of its low-temperature processes and low power dissipation. However, CNT based 3D ICs reported usually suffered from lower performance than that of monolayer CNT ICs. In this work, we develop a 3D IC technology through integrating multi-layer high performance CNT film FETs into one chip, and show that it promotes the operation speed of CNT based 3D ICs considerably. We also explore the advantage on ICs of 3D architecture, which brings 38% improvement on speed over two-dimensional (2D) one. Specially, we demonstrate the fabrication of 3D five-stage ring-oscillator circuits with an oscillation frequency of up to 680 MHz and stage delay of 0.15 ns, which represents the highest speed of 3D CNT-based ICs.展开更多
Through silicon via (TSV)-TSV coupling is detrimental to the performance of three-dimensional (3D) integrated circuits (ICs) with the major negative effect of introducing coupling noise. In order to obtain an ac...Through silicon via (TSV)-TSV coupling is detrimental to the performance of three-dimensional (3D) integrated circuits (ICs) with the major negative effect of introducing coupling noise. In order to obtain an accurate estimation of the coupling level from TSV-TSV in the early design stage, this paper first proposes an impedance- level model of the coupling channel between TSVs based on a two-port network, and then derives the formula of the coupling coefficient to describe the TSV-TSV coupling effect. The accuracy of the formula is validated by comparing the results with 3D full-wave simulations. Furthermore, a design technique for optimizing the coupling between adjacent coupled signal TSVs is proposed. Through SPICE simulations, the proposed technique shows its feasibility to reduce the coupling noise for both a simple TSV-TSV circuit and a complicated circuit with more TSVs, and demonstrates its potential for designers in achieving the goal of improving the electrical pertbrmance of3D ICs.展开更多
Metallic carbon nanotubes (CNTs) have been proposed as a promising alternative to Cu interconnects in future integrated circuits (ICs) for their remarkable conductive, mechanical and thermal properties. Compact eq...Metallic carbon nanotubes (CNTs) have been proposed as a promising alternative to Cu interconnects in future integrated circuits (ICs) for their remarkable conductive, mechanical and thermal properties. Compact equiv alent circuit models for single-walled carbon nanotube (SWCNT) bundles are described, and the performance of SWCNT bundle interconnects is evaluated and compared with traditional Cu interconnects at different interconnect levels for through-silicon-via-based three dimensional (3D) ICs. It is shown that at a local level, CNT interconnects exhibit lower signal delay and smaller optimal wire size. At intermediate and global levels, the delay improvement becomes more significant with technology scaling and increasing wire lengths. For 1 mm intermediate and 10 mm global level interconnects, the delay of SWCNT bundles is only 49.49% and 52.82% that of the Cu wires, respec tively.展开更多
Three-dimensional integrated circuit technology with transistors stacked on top of one an-other in multi-layer silicon film has always been a vision in the future technology direction. While the idea is simple, the te...Three-dimensional integrated circuit technology with transistors stacked on top of one an-other in multi-layer silicon film has always been a vision in the future technology direction. While the idea is simple, the technique to obtain high performance multi-layer transistors is extraordinarily diffi-cult. Not until recently does such technology become feasible. In this paper, the background and vari-ous techniques to form three-dimensional circuits will be reviewed. Recent development of a simple and promising technology to achieve three-dimensional integration using Metal-Induced-Lateral-Crystalliza-tion will be described. Preliminary results of 3D inverters will also be provided to demonstrate the viabil-ity for 3D integration.展开更多
文摘The space-air-ground integrated network(SAGIN)combines the superiority of the satellite,aerial,and ground communications,which is envisioned to provide high-precision positioning ability as well as seamless connectivity in the 5G and Beyond 5G(B5G)systems.In this paper,we propose a three-dimensional SAGIN localization scheme for ground agents utilizing multi-source information from satellites,base stations and unmanned aerial vehicles(UAVs).Based on the designed scheme,we derive the positioning performance bound and establish a distributed maximum likelihood algorithm to jointly estimate the positions and clock offsets of ground agents.Simulation results demonstrate the validity of the SAGIN localization scheme and reveal the effects of the number of satellites,the number of base stations,the number of UAVs and clock noise on positioning performance.
基金The Natural Science Foundation of Jiangsu Province(No.BK2012559)Qing Lan Project of Jiangsu Province
文摘Based on an avalanche photodiode( APD) detecting array working in Geiger mode( GM-APD), a high-performance infrared sensor readout integrated circuit( ROIC) used for infrared 3D( three-dimensional) imaging is proposed. The system mainly consists of three functional modules, including active quenching circuit( AQC), time-to-digital converter( TDC) circuit and other timing controller circuit. Each AQC and TDC circuit together constitutes the pixel circuit. Under the cooperation with other modules, the current signal generated by the GM-APD sensor is detected by the AQC, and the photon time-of-flight( TOF) is measured and converted to a digital signal output to achieve a better noise suppression and a higher detection sensitivity by the TDC. The ROIC circuit is fabricated by the CSMC 0. 5 μm standard CMOS technology. The array size is 8 × 8, and the center distance of two adjacent cells is 100μm. The measurement results of the chip showthat the performance of the circuit is good, and the chip can achieve 1 ns time resolution with a 250 MHz reference clock, and the circuit can be used in the array structure of the infrared detection system or focal plane array( FPA).
基金The National Natural Science Foundation of China(No.61674048,61574052,61474036,61371025)the Project of Anhui Institute of Economics and Management(No.YJKT1417T01)
文摘In order to solve the problem that the testing cost of the three-dimensional integrated circuit(3D IC)is too high,an optimal stacking order scheme is proposed to reduce the mid-bond test cost.A new testing model is built with the general consideration of both the test time for automatic test equipment(ATE)and manufacturing failure factors.An algorithm for testing cost and testing order optimization is proposed,and the minimum testing cost and optimized stacking order can be carried out by taking testing bandwidth and testing power as constraints.To prove the influence of the optimal stacking order on testing costs,two baselines stacked in sequential either in pyramid type or in inverted pyramid type are compared.Based on the benchmarks from ITC 02,experimental results show that for a 5-layer 3D IC,under different constraints,the optimal stacking order can reduce the test costs on average by 13%and 62%,respectively,compared to the pyramid type and inverted pyramid type.Furthermore,with the increase of the stack size,the test costs of the optimized stack order can be decreased.
文摘The state-of-the-art multi-core computer systems are based on Very Large Scale three Dimensional (3D) Integrated circuits (VLSI). In order to provide high-speed vertical data transmission in such 3D systems, efficient Through-Silicon Via (TSV) technology is critically important. In this paper, various Radio Frequency (RF) TSV designs and models are proposed. Specifically, the Cu-plug TSV with surrounding ground TSVs is used as the baseline structure. For further improvement, the dielectric coaxial and novel air-gap coaxial TSVs are introduced. Using the empirical parameters of these coaxial TSVs, the simulation results are obtained demonstrating that these coaxial RF-TSVs can provide two-order higher of cut-off frequencies than the Cu-plug TSVs. Based on these new RF-TSV technologies, we propose a novel 3D multi-core computer system as well as new architectures for manipulating the interfaces between RF and baseband circuit. Taking into consideration the scaling down of IC manufacture technologies, predictions for the performance of future generations of circuits are made. With simulation results indicating energy per bit and area per bit being reduced by 7% and 11% respectively, we can conclude that the proposed method is a worthwhile guideline for the design of future multi-core computer ICs.
文摘Electrical ground looks simple on a schematic; unfortunately, the actual performance of a circuit is dictated by its layout (and by its printed-circuit-board). When the ground node moves, system performance suffers and the system radiates electromagnetic interferences. But the understanding of the physics of ground noise can provide an intuitive sense for reducing the problem. Ground bounce can produce transients with amplitudes of volts; most often changing magnetic flux is the cause; in this work, the authors use a Finite-Difference Time-Domain to begin to understand such phenomena. Additionally, predicting substrate cross-talks in mixed-signal circuits has become a critical issue to preserve signal integrity in future integrated systems. Phenomena that involve parasitic signal propagation into the substrate are discussed. A simple methodology to predict the substrate cross-talk and some associated tools are presented. Finally, the authors indicate a stochastic method which could grasp both outer or inner RF (Radio-Frequency) radiations and substrate parasites.
文摘三维集成电路(three dimensional integrated circuit,3DIC)和片上网络(network on chip,NoC)是集成电路设计发展的两个趋势.将两者结合的三维片上网络(three dimensional networks on chip,3DNoC)是当前研究的热点之一.针对现有3DNoC的研究没有充分关注硅片内与硅片间的异构通信特征.提出了面向通信特征的硅片间单跳步(single hop inter dies,SHID)体系结构,该结构采用异构拓扑结构和硅片间扩展路由器(express inter dies router,EIDR).通过实验数据的分析表明,与3DMesh和NoC-Bus这两种已有的3DNoC结构相比,SHID结构有以下特点:1)延迟较低,4层堆叠时比3D-Mesh低15.1%,比NoC-Bus低11.5%;2)功耗与NoC-Bus相当,比3D-Mesh低10%左右;3)吞吐率随堆叠层数增加下降缓慢,16层堆叠时吞吐率比3D-Mesh高66.98%,比NoC-Bus高314.49%.SHID体系结构同时具备性能和可扩展性的优势,是未来3DNoC体系结构良好设计选择.
基金Supported by the National Natural Science Foundation of China (Nos.60833004 and 60876026)the 3-D Floorplanning and Placement Project of the Intel Corporation
文摘Hierarchical art was used to solve the mixed mode placement for three dimensional (3-D) integrated circuit design. The 3-D placement flow stream includes hierarchical clustering, hierarchical 3-D floorplanning, vertical via mapping, and recursive two dimensional (2-D) global/detailed placement phases. With state-of-the-art clustering and de-clustering phases, the design complexity was reduced to enhance the placement algorithm efficiency and capacity. The 3-D floorplanning phase solved the layer assignment problem and controlled the number of vertical vias. The vertical via mapping transformed the 3-D placement problem to a set of 2-D placement sub-problems, which not only simplifies the original 3-D placement problem, but also generates the vertical via assignment solution for the routing phase. The design optimizes both the wire length and the thermal load in the floorplan and placement phases to improve the performance and reliability of 3-D integrate circuits. Experiments on IBM benchmarks show that the total wire length is reduced from 15% to 35% relative to 2-D placement with two to four stacked layers, with the number of vertical vias minimized to satisfy a pre-defined upper bound constraint. The maximum temperature is reduced by 16% with two-stage optimization on four stacked layers.
基金supported by the National Key Research & Development Program (No.2016YFA0201901)the National Natural Science Foundation of China (Nos.61621061,61427901 and 61888102)the Beijing Municipal Science and Technology Commission (No.D171100006617002 1-2).
文摘Semiconducting carbon nanotube (CNT) field effect transistor (FET) is attractive for constructing three-dimensional (3D) integrated circuits (ICs) because of its low-temperature processes and low power dissipation. However, CNT based 3D ICs reported usually suffered from lower performance than that of monolayer CNT ICs. In this work, we develop a 3D IC technology through integrating multi-layer high performance CNT film FETs into one chip, and show that it promotes the operation speed of CNT based 3D ICs considerably. We also explore the advantage on ICs of 3D architecture, which brings 38% improvement on speed over two-dimensional (2D) one. Specially, we demonstrate the fabrication of 3D five-stage ring-oscillator circuits with an oscillation frequency of up to 680 MHz and stage delay of 0.15 ns, which represents the highest speed of 3D CNT-based ICs.
基金supported by the National Natural Science Foundation of China(No.61334003)
文摘Through silicon via (TSV)-TSV coupling is detrimental to the performance of three-dimensional (3D) integrated circuits (ICs) with the major negative effect of introducing coupling noise. In order to obtain an accurate estimation of the coupling level from TSV-TSV in the early design stage, this paper first proposes an impedance- level model of the coupling channel between TSVs based on a two-port network, and then derives the formula of the coupling coefficient to describe the TSV-TSV coupling effect. The accuracy of the formula is validated by comparing the results with 3D full-wave simulations. Furthermore, a design technique for optimizing the coupling between adjacent coupled signal TSVs is proposed. Through SPICE simulations, the proposed technique shows its feasibility to reduce the coupling noise for both a simple TSV-TSV circuit and a complicated circuit with more TSVs, and demonstrates its potential for designers in achieving the goal of improving the electrical pertbrmance of3D ICs.
基金supported by the National Natural Science Foundation of China(Nos.61234002,61006028,61204044)the National High-Tech Program of China(Nos.2012AA012302,2013AA011203)
文摘Metallic carbon nanotubes (CNTs) have been proposed as a promising alternative to Cu interconnects in future integrated circuits (ICs) for their remarkable conductive, mechanical and thermal properties. Compact equiv alent circuit models for single-walled carbon nanotube (SWCNT) bundles are described, and the performance of SWCNT bundle interconnects is evaluated and compared with traditional Cu interconnects at different interconnect levels for through-silicon-via-based three dimensional (3D) ICs. It is shown that at a local level, CNT interconnects exhibit lower signal delay and smaller optimal wire size. At intermediate and global levels, the delay improvement becomes more significant with technology scaling and increasing wire lengths. For 1 mm intermediate and 10 mm global level interconnects, the delay of SWCNT bundles is only 49.49% and 52.82% that of the Cu wires, respec tively.
文摘Three-dimensional integrated circuit technology with transistors stacked on top of one an-other in multi-layer silicon film has always been a vision in the future technology direction. While the idea is simple, the technique to obtain high performance multi-layer transistors is extraordinarily diffi-cult. Not until recently does such technology become feasible. In this paper, the background and vari-ous techniques to form three-dimensional circuits will be reviewed. Recent development of a simple and promising technology to achieve three-dimensional integration using Metal-Induced-Lateral-Crystalliza-tion will be described. Preliminary results of 3D inverters will also be provided to demonstrate the viabil-ity for 3D integration.