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Deposition of hexagonal boron nitride thin films on silver nanoparticle substrates and surface enhanced infrared absorption 被引量:2
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作者 邓金祥 陈亮 +3 位作者 满超 孔乐 崔敏 高学飞 《Chinese Physics B》 SCIE EI CAS CSCD 2014年第4期513-516,共4页
Silver nanoparticle thin films with different average particle diameters are grown on silicon substrates. Boron nitride thin films are then deposited on the silver nanoparticle interlayers by radio frequency (RF) ma... Silver nanoparticle thin films with different average particle diameters are grown on silicon substrates. Boron nitride thin films are then deposited on the silver nanoparticle interlayers by radio frequency (RF) magnetron sputtering. The boron nitride thin films are characterized by Fourier transform infrared spectra. The average particle diameters of silver nanoparticle thin films are 126.6, 78.4, and 178.8 nm. The results show that the sizes of the silver nanoparticles have effects on the intensities of infrared spectra of boron nitride thin films. An enhanced infrared absorption is detected for boron nitride thin film grown on silver nanoparticle thin film. This result is helpful to study the growth mechanism of boron nitride thin film. 展开更多
关键词 hexagonal boron nitride thin film silver nanoparticles surface enhanced infrared absorption
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Reactive DC Magnetron Sputtering Deposition of Copper Nitride Thin Film
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作者 Xing'ao LI Zuli LIU Kailun YAO 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2007年第4期468-472,共5页
Copper nitride thin film was deposited on glass substrates by reactive DC (direct current) magnetron sputtering at a 0.5 Pa N2 partial pressure and different substrate temperatures. The as-prepared film, characteriz... Copper nitride thin film was deposited on glass substrates by reactive DC (direct current) magnetron sputtering at a 0.5 Pa N2 partial pressure and different substrate temperatures. The as-prepared film, characterized with X-Ray diffraction, atomic force microscopy, and X-ray photoelectron spectroscopy measurements, showed a composed structure of Cu3N crystallites with anti-ReO3 structure and a slight oxidation of the resulted film.The crystal structure and growth rate of Cu3N films were affected strongly by substrate temperature. The preferred crystalline orientation of Cu3N films were (111) and (200) at RT, 100℃. These peaks decayed at 200℃ and 300℃ only Cu (111) peak was noticed. Growth of Cu3N films at 100℃ is the optimum substrate temperature for producing high-quality (111) Cu3N films. The deposition rate of Cu3N films estimated to be in range of 18-30 nm/min increased while the resistivity and the microhardness of Cu3N films decreased when the temperature of glass substrate increased. 展开更多
关键词 DC magnetron sputtering Copper nitride thin film RESISTIVITY MICROHARDNESS
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