Proposed herein is a novel non planar cell structure for flash memory which has been fabricated to achieve high programming speed with low operating voltage.This memory cell preserves a simple stacked gate structure ...Proposed herein is a novel non planar cell structure for flash memory which has been fabricated to achieve high programming speed with low operating voltage.This memory cell preserves a simple stacked gate structure which only requires an additional masking step to form the novel structure in the channel.For the cell of the 1 2μm gate length,the programming speed of 43μs under the measuring condition of V g=15V, V d=5V,and the erasing time of 24ms under V g=-5V, V s=8V are obtained.The programming speed is faster than that of the conventional planar cell structure.This superior programming speed makes it suitable for high speed application.展开更多
The sufficient condition for the existence of non constant periodic solutions of the following planar system with four delays are obtained:x [FK(W1*1。*3/4]′ 1(t)=-a 0x α 1(t)+a 1f 1(x 1(t-τ 1),x 2...The sufficient condition for the existence of non constant periodic solutions of the following planar system with four delays are obtained:x [FK(W1*1。*3/4]′ 1(t)=-a 0x α 1(t)+a 1f 1(x 1(t-τ 1),x 2(t-τ 2)), x [FK(W1*1。*3/4]′ 2(t)=-b 0x α 2(t)+b 1f 2(x 1(t-τ 3),x 2(t-τ 4)).This approach is based on the continuation theorem of the coincidence degree, and the a priori estimate of periodic solutions.展开更多
Eddy-current (EC) testing is an effective electromagnetic non-destructive testing (NDT) technique.Planar eddy-current sensor arrays have several advantages such as good coherence,fast response speed,and high sensitivi...Eddy-current (EC) testing is an effective electromagnetic non-destructive testing (NDT) technique.Planar eddy-current sensor arrays have several advantages such as good coherence,fast response speed,and high sensitivity,which can be used for micro-damage inspection of crucial parts in mechanical equipments and aerospace aviation.The main purpose of this research is to detect the defect in a metallic material surface and identify the length of a crack using planar eddy-current sensor arrays in different directions.The principle and characteristics of planar eddy-current sensor arrays are introduced,and a crack length quantification algorithm in different directions is investigated.A damage quantitative detection system is established based on a field programmable gate array and ARM processor.The system is utilized to inspect the micro defect in a metallic material,which is carved to micro crack with size of 7mm(length)×0.1mm(width)×1mm(depth).The experimental data show that the sensor arrays can be used for the length measurement repeatedly,and that the uncertainty of the length measurement is below ±0.2mm.展开更多
文摘Proposed herein is a novel non planar cell structure for flash memory which has been fabricated to achieve high programming speed with low operating voltage.This memory cell preserves a simple stacked gate structure which only requires an additional masking step to form the novel structure in the channel.For the cell of the 1 2μm gate length,the programming speed of 43μs under the measuring condition of V g=15V, V d=5V,and the erasing time of 24ms under V g=-5V, V s=8V are obtained.The programming speed is faster than that of the conventional planar cell structure.This superior programming speed makes it suitable for high speed application.
文摘The sufficient condition for the existence of non constant periodic solutions of the following planar system with four delays are obtained:x [FK(W1*1。*3/4]′ 1(t)=-a 0x α 1(t)+a 1f 1(x 1(t-τ 1),x 2(t-τ 2)), x [FK(W1*1。*3/4]′ 2(t)=-b 0x α 2(t)+b 1f 2(x 1(t-τ 3),x 2(t-τ 4)).This approach is based on the continuation theorem of the coincidence degree, and the a priori estimate of periodic solutions.
基金supported by the National Natural Science Foundation of China (No.61171460)
文摘Eddy-current (EC) testing is an effective electromagnetic non-destructive testing (NDT) technique.Planar eddy-current sensor arrays have several advantages such as good coherence,fast response speed,and high sensitivity,which can be used for micro-damage inspection of crucial parts in mechanical equipments and aerospace aviation.The main purpose of this research is to detect the defect in a metallic material surface and identify the length of a crack using planar eddy-current sensor arrays in different directions.The principle and characteristics of planar eddy-current sensor arrays are introduced,and a crack length quantification algorithm in different directions is investigated.A damage quantitative detection system is established based on a field programmable gate array and ARM processor.The system is utilized to inspect the micro defect in a metallic material,which is carved to micro crack with size of 7mm(length)×0.1mm(width)×1mm(depth).The experimental data show that the sensor arrays can be used for the length measurement repeatedly,and that the uncertainty of the length measurement is below ±0.2mm.
