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Three-dimensional multilevel memory based on laser-polarization-dependence birefringence 被引量:1
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作者 程光华 刘青 +2 位作者 王屹山 赵卫 陈国夫 《Chinese Optics Letters》 SCIE EI CAS CSCD 2006年第2期111-113,共3页
The femtosecond laser-modified region in isot, ropic glass medium shows a big optical birefringence. Transmission of the birefringent regions between two crossed polarizers depends on phase retardation and the orienta... The femtosecond laser-modified region in isot, ropic glass medium shows a big optical birefringence. Transmission of the birefringent regions between two crossed polarizers depends on phase retardation and the orientation angle of the birefringent optical axes. Based on this effect, three-dimensional (3D) multilevel memory was proposed and demonstrated for nonvolatile memory up to eight levels, in contrast to the standard two-level technology. Eight-level writing and reading are distinguishable in fused silica with a near-infrared femtasecond laser. The retention of this memorv is characterized for nonvolatile annlications. 展开更多
关键词 BIREFRINGENCE Glass Infrared radiation Light polarization nonvolatile storage SILICA Three dimensional Ultrashort pulses
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Spectroscopic ellipsometric properties and resistance switching behavior in Si_x(ZrO_2)_(100-x) films
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作者 王骁栋 冯亮 +5 位作者 魏慎金 朱焕锋 陈坤 徐达 张颖 李晶 《Chinese Optics Letters》 SCIE EI CAS CSCD 2011年第5期85-88,共4页
We prepare Si x (ZrO 2 ) 100 x composite films using the co-sputtering method. The chemical structures of the films which are prepared under different conditions are analyzed with X-ray photoemission spectroscopy. T... We prepare Si x (ZrO 2 ) 100 x composite films using the co-sputtering method. The chemical structures of the films which are prepared under different conditions are analyzed with X-ray photoemission spectroscopy. Thermal treatment influences on optical property and resistance switching characteristics of these composite films are investigated by spectroscopic ellipsometry and semiconductor parameter ana- lyzer, respectively. With the proper Si-doped Si x (ZrO 2) 100 x interlayer, the Al/ Si x (ZrO 2 ) 100 x /Al device cell samples present very reliable and reproducible switching behaviors. It provides a feasible solution for easy multilevel storage and better fault tolerance in nonvolatile memory application. 展开更多
关键词 Chemical analysis Composite films Emission spectroscopy Fault tolerance nonvolatile storage Optical properties Spectroscopic ellipsometry Zirconium alloys
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