A 12-bit 30 MSPS pipeline analog-to-digital converter (ADC) implemented in 0.13μm 1P8M CMOS technology is presented. Low power design with the front-end sample-and-hold amplifier removed is proposed. Except for the...A 12-bit 30 MSPS pipeline analog-to-digital converter (ADC) implemented in 0.13μm 1P8M CMOS technology is presented. Low power design with the front-end sample-and-hold amplifier removed is proposed. Except for the first stage, two-stage cascode-compensated operational amplifiers with dual inputs are shared between successive stages to further reduce power consumption. The ADC presents 65.3 dB SNR, 75.8 dB SFDR and 64.6 dBSNDR at 5 MHz analog input with 30.7 MHz sampling rate. The chip dissipates 33.6 mW from 1.2 V power supply. FOM is 0.79 pJ/conv step.展开更多
A high-PSRR high-order curvature-compensated CMOS bandgap voltage reference( BGR),which has the performances of high power supply rejection ratio( PSRR) and low temperature coefficient,is designed in SMIC 0. 18 μm CM...A high-PSRR high-order curvature-compensated CMOS bandgap voltage reference( BGR),which has the performances of high power supply rejection ratio( PSRR) and low temperature coefficient,is designed in SMIC 0. 18 μm CMOS process. Compared to the conventional curvature-compensated BGR which adopted a piecewise-linear current,the temperature characterize of the proposed BGR is effectively improved by adopting two kinds of current including a piecewise-linear current and a current proportional 1. 5 party to the absolute temperature T. By adopting a low dropout( LDO) regulator whose output voltage is the operating supply voltage of the proposed BGR core circuit instead of power supply voltage VDD,the proposed BGR with LDO regulator achieves a well PSRR performance than the BGR without LDO regulator. Simulation results show that the proposed BGR with LDO regulator achieves a temperature coefficient of 2. 1 × 10-6/ ℃ with a 1. 8 V power supply voltage and a line regulation of 4. 9 μV / V at 27 ℃. The proposed BGR with LDO regulator at 10 Hz,100 Hz,1 k Hz,10 k Hz and 100 k Hz have the PSRR of- 106. 388,- 106. 388,- 106. 38,- 105. 93 and-88. 67 d B respectively.展开更多
A novel curvature-compensated CMOS bandgap voltage reference is presented. The reference utilizes two first order temperature compensations generated from the nonlinearity of the finite current gain β of vertical pnp...A novel curvature-compensated CMOS bandgap voltage reference is presented. The reference utilizes two first order temperature compensations generated from the nonlinearity of the finite current gain β of vertical pnp bipolar transistor. The proposed circuit, designed in a standard 0.18 μm CMOS process, achieves a good temperature coefficient of 2.44 ppm/℃ with temperature range from --40℃ to 85 ℃, and about 4 mV supply voltage variation in the range from 1.4 V to 2.4 V. With a 1.8 V supply voltage, the power supply rejection ratio is -56dB at 10MHz.展开更多
A high performance CMOS band-gap voltage reference circuit that can be used in interface integrated circuit of microsensor and compatible with 0. 6 μm ( double poly) mix process is proposed in this paper. The circuit...A high performance CMOS band-gap voltage reference circuit that can be used in interface integrated circuit of microsensor and compatible with 0. 6 μm ( double poly) mix process is proposed in this paper. The circuit can be employed in the range of 1. 8 - 8 V and carry out the first-order PTAT ( proportional to absolute temperature) temperature compensation. Through using a two-stage op-amp with a NMOS input pair as a negative feedback op-amp,the PSRR ( power supply rejection ratio) of the entire circuit is increased,and the temperature coefficient of reference voltage is decreased. Results from HSPICE simulation show that the PSRR is - 72. 76 dB in the condition of low-frequency,the temperature coefficient is 2. 4 × 10 -6 in the temperature range from - 10 ℃ to 90 ℃ and the power dissipation is only 14 μW when the supply voltage is 1. 8 V.展开更多
A lowtemperature coefficient( TC) bandgap reference( BGR) with novel process variation calibration technique is proposed in this paper. This proposed calibration technique compensating both TC and output value of ...A lowtemperature coefficient( TC) bandgap reference( BGR) with novel process variation calibration technique is proposed in this paper. This proposed calibration technique compensating both TC and output value of BGR achieves fine adjustment step towards the reference voltage,while keeping optimal TC by utilizing large resistance to help layout match. The high-order curvature compensation realized by poly and p-diffusion resistors is introduced into the design to guarantee the temperature characteristic. Implemented in 180 nm technology,the proposed BGR has been simulated to have a power supply rejection ratio( PSRR) of 91 dB@100 Hz. The calibration technique covers output voltage scope of 0. 49 V-0. 56 Vwith TC of 9. 45 × 10^(-6)/℃-9. 56 × 10^(-6)/℃ over the temperature range of-40 ℃-120 ℃. The designed BGR provides a reference voltage of 500 mV,with measured TC of 10. 1 × 10^(-6)/℃.展开更多
This paper takes full advantages of the I-V transconductance characteristics of metal-oxide semiconductor field effect transistor (MOSFET) operating in the subthreshold region and the enhancement pre-regulator techn...This paper takes full advantages of the I-V transconductance characteristics of metal-oxide semiconductor field effect transistor (MOSFET) operating in the subthreshold region and the enhancement pre-regulator technique with the high gain negative feedback loop. The proposed reference circuit, designed with the SMIC 0.18 μm standard complementary metal-oxide semiconductor (CMOS) logic process technology, exhibits a stable current of about 1.701 μA with much low temperature coefficient (TC) of 2.5×10^-4μA/℃ in the temperature range of-40 to 150℃ at 1.5 V supply voltage, and also achieves a best PSRR over a broad frequency. The PSRR is about - 126 dB at DC frequency and remains -92 dB at the frequency higher 100 MHz. Moreover the proposed reference circuit operates stably at the supply voltage higher 1.2 V and has good process compatibility.展开更多
Featuring low communication requirements and high reliability,the voltage droop control method is widely adopted in the voltage source converter based multi-terminal direct current(VSC-MTDC)system for autonomous DC vo...Featuring low communication requirements and high reliability,the voltage droop control method is widely adopted in the voltage source converter based multi-terminal direct current(VSC-MTDC)system for autonomous DC voltage regulation and power-sharing.However,the traditional voltage droop control method with fixed droop gain is criticized for over-limit DC voltage deviation in case of large power disturbances,which can threaten stable operation of the entire VSCMTDC system.To tackle this problem,this paper proposes an adaptive reference power based voltage droop control method,which changes the reference power to compensate the power deviation for droop-controlled voltage source converters(VSCs).Besides retaining the merits of the traditional voltage droop control method,both DC voltage deviation reduction and power distribution improvement can be achieved by utilizing local information and a specific control factor in the proposed method.Basic principles and key features of the proposed method are described.Detailed analyses on the effects of the control factor on DC voltage deviation and imbalanced power-sharing are discussed,and the selection principle of the control factor is proposed.Finally,the effectiveness of the proposed method is validated by the simulations on a five-terminal VSC based high-voltage direct current(VSC-HVDC)system.展开更多
在弱交流系统下对于附带有STATCOM的电网换相换流器高压直流输电(Line Commutated Converter based High Voltage Direct Current, LCC-HVDC)系统,存在着LCC逆变站与STATCOM之间耦合导致LCC-HVDC系统的稳定裕度下降问题,这会减弱LCC-HVD...在弱交流系统下对于附带有STATCOM的电网换相换流器高压直流输电(Line Commutated Converter based High Voltage Direct Current, LCC-HVDC)系统,存在着LCC逆变站与STATCOM之间耦合导致LCC-HVDC系统的稳定裕度下降问题,这会减弱LCC-HVDC抑制换相失败的能力。此外,HVDC控制环节之中的电压指令电流控制(voltage dependent current order limiter, VDCOL)环节的输出电流指令大幅剧烈波动还有几率会导致HVDC系统在首次换相失败之后发生后续换相失败。针对上述问题提出了一种“改进参考电压”的思想,对STATCOM和VDCOL的参考电压与输入电压分别进行修正。首先在STATCOM原本的参考电压经过一个“虚拟电抗”之后得到一个新的参考电压,通过这个改进参考电压弱化了STATCOM电压外环控制模块与LCC逆变站的耦合,减小了交流系统等效阻抗的大小,提升了系统对干扰的抵抗能力。然后对VDCOL的输入电压进行改进,新的改进输入电压改善了故障后VDCOL输出电流指令的大幅剧烈波动情况。最后通过三个层次的对照试验,验证了所提方法的有效性。展开更多
为了解决软击穿导致的压控磁各向异性磁隧道结(voltage-controlled magnetic anisotropy magnetic tunnel junction,VCMA-MTJ)及其读电路性能下降的问题,在对VCMA-MTJ软击穿机理深入分析的基础上,修正了VCMA-MTJ的电学模型,设计了一种...为了解决软击穿导致的压控磁各向异性磁隧道结(voltage-controlled magnetic anisotropy magnetic tunnel junction,VCMA-MTJ)及其读电路性能下降的问题,在对VCMA-MTJ软击穿机理深入分析的基础上,修正了VCMA-MTJ的电学模型,设计了一种具有固定参考电阻的VCMA-MTJ读电路和一种具有参考电阻调控单元的VCMA-MTJ读电路,研究了软击穿对VCMA-MTJ电阻R_(t)、隧穿磁阻比率M、软击穿时间T_(s)以及VCMA-MTJ读电路读错误率的影响。结果表明:软击穿的出现会导致R_(t)和M均随应力时间t的增加而降低,T_(s)随氧化层厚度t_(ox)的增大而缓慢增加,却随脉冲电压V_(b)的增大而迅速减少,与反平行态相比,平行态的T_(s)更短且M降低50%所需时间更少;具有固定参考电阻的VCMA-MTJ读电路可有效避免读“0”错误率的产生,但读“1”错误率却随t的增加而上升,而具有参考电阻调控单元的VCMA-MTJ读电路可在保持读“0”正确率的同时,对读“1”错误率改善达54%,在一定程度上削弱了软击穿对VCMA-MTJ读电路的影响。展开更多
基金Project supported by the National High Technology Research and Development Program of China(No.2009AA011607)the State Key Laboratory of China
文摘A 12-bit 30 MSPS pipeline analog-to-digital converter (ADC) implemented in 0.13μm 1P8M CMOS technology is presented. Low power design with the front-end sample-and-hold amplifier removed is proposed. Except for the first stage, two-stage cascode-compensated operational amplifiers with dual inputs are shared between successive stages to further reduce power consumption. The ADC presents 65.3 dB SNR, 75.8 dB SFDR and 64.6 dBSNDR at 5 MHz analog input with 30.7 MHz sampling rate. The chip dissipates 33.6 mW from 1.2 V power supply. FOM is 0.79 pJ/conv step.
基金Sponsored by the National Natural Science Foundation of China(Grant No.61471075)the 2013 Program for Innovation Team Building at Institutions of Higher Education in Chongqing(The Innovation Team of Smart Medical System and Key Technology)
文摘A high-PSRR high-order curvature-compensated CMOS bandgap voltage reference( BGR),which has the performances of high power supply rejection ratio( PSRR) and low temperature coefficient,is designed in SMIC 0. 18 μm CMOS process. Compared to the conventional curvature-compensated BGR which adopted a piecewise-linear current,the temperature characterize of the proposed BGR is effectively improved by adopting two kinds of current including a piecewise-linear current and a current proportional 1. 5 party to the absolute temperature T. By adopting a low dropout( LDO) regulator whose output voltage is the operating supply voltage of the proposed BGR core circuit instead of power supply voltage VDD,the proposed BGR with LDO regulator achieves a well PSRR performance than the BGR without LDO regulator. Simulation results show that the proposed BGR with LDO regulator achieves a temperature coefficient of 2. 1 × 10-6/ ℃ with a 1. 8 V power supply voltage and a line regulation of 4. 9 μV / V at 27 ℃. The proposed BGR with LDO regulator at 10 Hz,100 Hz,1 k Hz,10 k Hz and 100 k Hz have the PSRR of- 106. 388,- 106. 388,- 106. 38,- 105. 93 and-88. 67 d B respectively.
文摘A novel curvature-compensated CMOS bandgap voltage reference is presented. The reference utilizes two first order temperature compensations generated from the nonlinearity of the finite current gain β of vertical pnp bipolar transistor. The proposed circuit, designed in a standard 0.18 μm CMOS process, achieves a good temperature coefficient of 2.44 ppm/℃ with temperature range from --40℃ to 85 ℃, and about 4 mV supply voltage variation in the range from 1.4 V to 2.4 V. With a 1.8 V supply voltage, the power supply rejection ratio is -56dB at 10MHz.
文摘A high performance CMOS band-gap voltage reference circuit that can be used in interface integrated circuit of microsensor and compatible with 0. 6 μm ( double poly) mix process is proposed in this paper. The circuit can be employed in the range of 1. 8 - 8 V and carry out the first-order PTAT ( proportional to absolute temperature) temperature compensation. Through using a two-stage op-amp with a NMOS input pair as a negative feedback op-amp,the PSRR ( power supply rejection ratio) of the entire circuit is increased,and the temperature coefficient of reference voltage is decreased. Results from HSPICE simulation show that the PSRR is - 72. 76 dB in the condition of low-frequency,the temperature coefficient is 2. 4 × 10 -6 in the temperature range from - 10 ℃ to 90 ℃ and the power dissipation is only 14 μW when the supply voltage is 1. 8 V.
基金Supported by the National Natural Science Foundation of China(61604109)the National High-Tech R&D Program of China(2015AA042605)
文摘A lowtemperature coefficient( TC) bandgap reference( BGR) with novel process variation calibration technique is proposed in this paper. This proposed calibration technique compensating both TC and output value of BGR achieves fine adjustment step towards the reference voltage,while keeping optimal TC by utilizing large resistance to help layout match. The high-order curvature compensation realized by poly and p-diffusion resistors is introduced into the design to guarantee the temperature characteristic. Implemented in 180 nm technology,the proposed BGR has been simulated to have a power supply rejection ratio( PSRR) of 91 dB@100 Hz. The calibration technique covers output voltage scope of 0. 49 V-0. 56 Vwith TC of 9. 45 × 10^(-6)/℃-9. 56 × 10^(-6)/℃ over the temperature range of-40 ℃-120 ℃. The designed BGR provides a reference voltage of 500 mV,with measured TC of 10. 1 × 10^(-6)/℃.
基金Supported by the National Natural Science Foundation of China (60376019)
文摘This paper takes full advantages of the I-V transconductance characteristics of metal-oxide semiconductor field effect transistor (MOSFET) operating in the subthreshold region and the enhancement pre-regulator technique with the high gain negative feedback loop. The proposed reference circuit, designed with the SMIC 0.18 μm standard complementary metal-oxide semiconductor (CMOS) logic process technology, exhibits a stable current of about 1.701 μA with much low temperature coefficient (TC) of 2.5×10^-4μA/℃ in the temperature range of-40 to 150℃ at 1.5 V supply voltage, and also achieves a best PSRR over a broad frequency. The PSRR is about - 126 dB at DC frequency and remains -92 dB at the frequency higher 100 MHz. Moreover the proposed reference circuit operates stably at the supply voltage higher 1.2 V and has good process compatibility.
基金supported by the Key Science and Technology Projects of China Southern Power Grid Corporation(No.090000KK52180116)National Natural Science Foundation of China(No.51807135)。
文摘Featuring low communication requirements and high reliability,the voltage droop control method is widely adopted in the voltage source converter based multi-terminal direct current(VSC-MTDC)system for autonomous DC voltage regulation and power-sharing.However,the traditional voltage droop control method with fixed droop gain is criticized for over-limit DC voltage deviation in case of large power disturbances,which can threaten stable operation of the entire VSCMTDC system.To tackle this problem,this paper proposes an adaptive reference power based voltage droop control method,which changes the reference power to compensate the power deviation for droop-controlled voltage source converters(VSCs).Besides retaining the merits of the traditional voltage droop control method,both DC voltage deviation reduction and power distribution improvement can be achieved by utilizing local information and a specific control factor in the proposed method.Basic principles and key features of the proposed method are described.Detailed analyses on the effects of the control factor on DC voltage deviation and imbalanced power-sharing are discussed,and the selection principle of the control factor is proposed.Finally,the effectiveness of the proposed method is validated by the simulations on a five-terminal VSC based high-voltage direct current(VSC-HVDC)system.
文摘在弱交流系统下对于附带有STATCOM的电网换相换流器高压直流输电(Line Commutated Converter based High Voltage Direct Current, LCC-HVDC)系统,存在着LCC逆变站与STATCOM之间耦合导致LCC-HVDC系统的稳定裕度下降问题,这会减弱LCC-HVDC抑制换相失败的能力。此外,HVDC控制环节之中的电压指令电流控制(voltage dependent current order limiter, VDCOL)环节的输出电流指令大幅剧烈波动还有几率会导致HVDC系统在首次换相失败之后发生后续换相失败。针对上述问题提出了一种“改进参考电压”的思想,对STATCOM和VDCOL的参考电压与输入电压分别进行修正。首先在STATCOM原本的参考电压经过一个“虚拟电抗”之后得到一个新的参考电压,通过这个改进参考电压弱化了STATCOM电压外环控制模块与LCC逆变站的耦合,减小了交流系统等效阻抗的大小,提升了系统对干扰的抵抗能力。然后对VDCOL的输入电压进行改进,新的改进输入电压改善了故障后VDCOL输出电流指令的大幅剧烈波动情况。最后通过三个层次的对照试验,验证了所提方法的有效性。
文摘为了解决软击穿导致的压控磁各向异性磁隧道结(voltage-controlled magnetic anisotropy magnetic tunnel junction,VCMA-MTJ)及其读电路性能下降的问题,在对VCMA-MTJ软击穿机理深入分析的基础上,修正了VCMA-MTJ的电学模型,设计了一种具有固定参考电阻的VCMA-MTJ读电路和一种具有参考电阻调控单元的VCMA-MTJ读电路,研究了软击穿对VCMA-MTJ电阻R_(t)、隧穿磁阻比率M、软击穿时间T_(s)以及VCMA-MTJ读电路读错误率的影响。结果表明:软击穿的出现会导致R_(t)和M均随应力时间t的增加而降低,T_(s)随氧化层厚度t_(ox)的增大而缓慢增加,却随脉冲电压V_(b)的增大而迅速减少,与反平行态相比,平行态的T_(s)更短且M降低50%所需时间更少;具有固定参考电阻的VCMA-MTJ读电路可有效避免读“0”错误率的产生,但读“1”错误率却随t的增加而上升,而具有参考电阻调控单元的VCMA-MTJ读电路可在保持读“0”正确率的同时,对读“1”错误率改善达54%,在一定程度上削弱了软击穿对VCMA-MTJ读电路的影响。