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Photoelectric properties of p-β-FeSi_2/n-4H-SiC heteroj unction near-infrared photodiode 被引量:1
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作者 郑春蕾 蒲红斌 +1 位作者 李虹 陈治明 《Journal of Semiconductors》 EI CAS CSCD 2015年第5期58-60,共3页
We give the first report on the experimental investigation of a p-β-FeSi2/n-4H-SiC heterojunction. A β-/%FeSiE/n-4H-SiC heterojunction near-infrared photodiode was fabricated on 4H-SiC substrate by magnetron sputter... We give the first report on the experimental investigation of a p-β-FeSi2/n-4H-SiC heterojunction. A β-/%FeSiE/n-4H-SiC heterojunction near-infrared photodiode was fabricated on 4H-SiC substrate by magnetron sputtering and rapid thermal annealing (RTA). Sharp film-substrate interfaces were confirmed by scanning elec-tron microscopy (SEM). The current density-voltage and photoresponse characteristics were measured. The measurements showed that the device exhibited good rectifying properties. The photocurrent density was about 1.82 mA/cm^2 at a bias voltage of -1 V under illumination by a 5 mW, 1.31 μm laser, and the dark current density was approximately 0.537 mA/cm^2. The detectivity was estimated to be 8.8×10^9 cmHzl/2/W at 1.31 μm. All of the measurements were made at room temperature. The results suggest that the p-β-FeSiE/n-4H-SiC heterojunctions can be used as near-infrared photodiodes that are applicable to optically-activated SiC-based devices. 展开更多
关键词 β-fesi2 magnetron sputtering p-β-fesi2/n-4h-sic heterojunction photoelectric properties
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