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Energy spectrum of multi-radiation of X-rays in a low energy Mather-type plasma focus device 被引量:1
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作者 Farzin M.Aghamir Reza A.Behbahani 《Chinese Physics B》 SCIE EI CAS CSCD 2014年第6期375-380,共6页
The multi-radiation of X-rays was investigated with special attention to their energy spectrum in a Mather-type plasma focus device (operated with argon gas). The analysis is based on the effect of anomalous resista... The multi-radiation of X-rays was investigated with special attention to their energy spectrum in a Mather-type plasma focus device (operated with argon gas). The analysis is based on the effect of anomalous resistances. To study the energy spectrum, a four-channel diode X-ray spectrometer was used along with a special set of filters. The filters were suitable for detection of medium range X-rays as well as hard X-rays with energy exceeding 30 keV. The results indicate that the anomalous resistivity effect during the post pinch phase may cause multi-radiation of X-rays with a total duration of 300 ± 50 ns. The significant contribution of Cu-Kα was due to the medium range X-rays, nonetheless, hard X-rays with energies greater than 15 keV also participate in the process. The total emitted X-ray energy in the forms of Cu-K and Cu-K/3 was around 0.14 ± 0.02 (J/Sr) and 0.04 ±0.01 (J/Sr), respectively. The total energy of the emitted hard X-ray (〉 15 keV) was around 0.12± 0.02 (J/Sr). 展开更多
关键词 Mather-type plasma focus device hard X-rays multi-radiation tube multiple voltage peaks anomalous resistances
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