Gallium nitride(GaN)-based high-electron mobility transistors(HEMTs) are widely used in high power and high frequency application fields, due to the outstanding physical and chemical properties of the GaN material. Ho...Gallium nitride(GaN)-based high-electron mobility transistors(HEMTs) are widely used in high power and high frequency application fields, due to the outstanding physical and chemical properties of the GaN material. However, GaN HEMTs suffer from degradations and even failures during practical applications, making physical analyses of post-failure devices extremely significant for reliability improvements and further device optimizations. In this paper, common physical characterization techniques for post failure analyses are introduced, several failure mechanisms and corresponding failure phenomena are reviewed and summarized, and finally device optimization methods are discussed.展开更多
针对雷达电源组件因长期处于振动应力作用下易导致振动疲劳而出现失效,进而影响雷达可靠性的问题,提出了一种基于振动故障物理(physics of failure,PoF)和蒙特卡洛的雷达电源组件故障预计方法。首先根据雷达电源组件的硬件结构、产品材...针对雷达电源组件因长期处于振动应力作用下易导致振动疲劳而出现失效,进而影响雷达可靠性的问题,提出了一种基于振动故障物理(physics of failure,PoF)和蒙特卡洛的雷达电源组件故障预计方法。首先根据雷达电源组件的硬件结构、产品材料等参数建立雷达电源组件有限元分析(finite element analysis,FEA)数字样机模型,然后施加雷达电源组件的振动边界载荷,进行振动应力分析,对比模态实验结果,验证了振动应力分析的合理性;最后考虑雷达电源组件元器件参数的不确定性,结合PoF和蒙特卡洛抽样进行故障预计,得到雷达电源各组件潜在故障的寿命分布。结果表明,在振动应力下,16块电源板的预计寿命最短。与实际故障预计结果对比,验证了所提算法的合理性。该方法在对雷达电源组件进行故障预计方面有很好的应用前景,促进了基于PoF模型的故障预计技术发展。展开更多
基金supported by the National Key R&D Program of China (No. 2017YFB0403000)。
文摘Gallium nitride(GaN)-based high-electron mobility transistors(HEMTs) are widely used in high power and high frequency application fields, due to the outstanding physical and chemical properties of the GaN material. However, GaN HEMTs suffer from degradations and even failures during practical applications, making physical analyses of post-failure devices extremely significant for reliability improvements and further device optimizations. In this paper, common physical characterization techniques for post failure analyses are introduced, several failure mechanisms and corresponding failure phenomena are reviewed and summarized, and finally device optimization methods are discussed.
文摘针对雷达电源组件因长期处于振动应力作用下易导致振动疲劳而出现失效,进而影响雷达可靠性的问题,提出了一种基于振动故障物理(physics of failure,PoF)和蒙特卡洛的雷达电源组件故障预计方法。首先根据雷达电源组件的硬件结构、产品材料等参数建立雷达电源组件有限元分析(finite element analysis,FEA)数字样机模型,然后施加雷达电源组件的振动边界载荷,进行振动应力分析,对比模态实验结果,验证了振动应力分析的合理性;最后考虑雷达电源组件元器件参数的不确定性,结合PoF和蒙特卡洛抽样进行故障预计,得到雷达电源各组件潜在故障的寿命分布。结果表明,在振动应力下,16块电源板的预计寿命最短。与实际故障预计结果对比,验证了所提算法的合理性。该方法在对雷达电源组件进行故障预计方面有很好的应用前景,促进了基于PoF模型的故障预计技术发展。
