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Preparation of Diamond-like Carbon Film Assisted in the Plasma of Dielectric Barrier Discharge at Atmospheric Pressure
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作者 刘东平 马腾才 +2 位作者 俞世吉 宋志民 杨学锋 《Plasma Science and Technology》 SCIE EI CAS CSCD 1999年第1期57-60,共4页
Dielectric barrier discharge at atmospheric presure has been applied to prepare hydrocarbon films on large- area glass and silicon substrates. When hydrogen and methane mixture(2:1) is used as discharge gas and the s... Dielectric barrier discharge at atmospheric presure has been applied to prepare hydrocarbon films on large- area glass and silicon substrates. When hydrogen and methane mixture(2:1) is used as discharge gas and the substrate is heated to 300 C, hard hydrogenated amorphous carbon film is deposited. From the IR deconvolution analysis of the C-H stretching absorption for the coating, the hydrocarbon group ration (CH3:CH2:CH) and C-C bond type ratio (sp3c/sp2c) are about 10%: 21%: 69% and 3:1~6:1,respectively. Their Knoop hardness is up to 10Gpa. No film isdeposited when the content of methane in the mixed gases is decreased to 5% at 300 C silicon substrate. 展开更多
关键词 preparation of Diamond-like Carbon Film Assisted in the plasma of Dielectric Barrier Discharge at Atmospheric Pressure
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Preparation and properties of HA coating hydrothermally synthesized from plasma sprayed Ca HPO_4 coating
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《Chinese Journal of Biomedical Engineering(English Edition)》 2001年第3期138-140,共3页
关键词 HA preparation and properties of HA coating hydrothermally synthesized from plasma sprayed Ca HPO4 coating SBF CA HPO
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Study of SiO_2 Films Prepared by Electron CyclotronResonant Microwave Plasma
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作者 张劲松 任兆杏 +2 位作者 梁荣庆 隋毅峰 刘卫 《Plasma Science and Technology》 SCIE EI CAS CSCD 2000年第2期199-205,共7页
Microwave electron cyclotron resonance plasma enhanced chemical vapor depositionwas used to grow silicon dioxide films on crystalline silicon substrate for planar optical waveguides.The relationship between plasma par... Microwave electron cyclotron resonance plasma enhanced chemical vapor depositionwas used to grow silicon dioxide films on crystalline silicon substrate for planar optical waveguides.The relationship between plasma parameters and deposition rates was investigated, and the influ-ence of radio frequency substrate bias on properties of SiO2 films was also preliminarily studied.X-ray photoelectron spectroscopy, Fourier transform infrared spectroscopy, scanning electron mi-croscopy, atomic force microscopy and elllipsometry were used to characterize the deposited films,showing that SiO2 films with good structural and optical properties prepared at low temperaturehave been achieved. They can basically meet the requirements of integrated optical waveguides. 展开更多
关键词 OA OO Study of SiO2 Films Prepared by Electron CyclotronResonant Microwave plasma
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