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Fabrication and electrical properties of axial and radial GaAs nanowire pn junction diode arrays
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作者 李军帅 张霞 +5 位作者 颜鑫 陈雄 李亮 崔建功 黄永清 任晓敏 《Chinese Physics B》 SCIE EI CAS CSCD 2014年第12期555-558,共4页
We report on the fabrications and characterizations of axial and radial Ga As nanowire pn junction diode arrays.The nanowires are grown on n-doped Ga As(111)B substrates using the Au-catalyzed vapor–liquid–solid m... We report on the fabrications and characterizations of axial and radial Ga As nanowire pn junction diode arrays.The nanowires are grown on n-doped Ga As(111)B substrates using the Au-catalyzed vapor–liquid–solid mechanism by metal–organic chemical vapor deposition(MOCVD). Diethyl–zinc and silane are used as p- and n-type dopant precursors,respectively. Both the axial and radial diodes exhibit diode-like J–V characteristics and have similar performances under forward bias. Under backward bias, the axial diode has a large leakage current, which is attributed to the bending of the pn junction interface induced by two doping mechanisms in Au-catalyzed nanowires. The low leakage current and high rectification ratio make the radial diode more promising in electrical and optoelectronic devices. 展开更多
关键词 pn junction diode Ga As nanowire MOCVD
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Fabrication and characterization of a GaN/(4H)SiC vertical pn power diode using direct and interfaced epitaxial-growth approaches
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作者 Bose Srikanta Mazumder S K 《Journal of Semiconductors》 EI CAS CSCD 2013年第4期20-23,共4页
We report the fabrication and characterization of a vertical pn power diode which is realized using two separate epitaxial-growth mechanisms: (a) p-GaN over p-(4H)SiC, and (b) p-GaN over n-(4H)SiC with A1N as... We report the fabrication and characterization of a vertical pn power diode which is realized using two separate epitaxial-growth mechanisms: (a) p-GaN over p-(4H)SiC, and (b) p-GaN over n-(4H)SiC with A1N as the interface layer. In all of the cases, n+-doped (4H)SiC serves as the cathode substrate. Pd(200 A)/Au(10000 A) is used for the anode contact while Ni(1000A) is used for the bottom cathode contact. The measured forward drop of the pn diode with A1N as the interface material is found to be around 5.1 V; whereas, it is 3 V for the other sample structure. The measured reverse-blocking voltage is found to be greater than 200 V. 展开更多
关键词 GAN (4H)SiC vertical pn power diode power electronics
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