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Spectral anomalies and spectral switches of partially coherent and polychromatic light diffracted at an aperture 被引量:1
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作者 Lü Baida1, 3 & PAN Liuzhan1, 2 1. Institute of Laser Physics and Chemistry, Sichuan University, Chengdu 610064, China 2. Department of Physics, Luoyang Normal College, Luoyang 471022, China 3. State Key Laboratory of Laser Technology, Huazhong University of Science and Technology, Wuhan 430074, China Correspondence should be addressed to L Baida (email: badalu@scu.edu.cn) Received July 10, 2003 《Science China(Physics,Mechanics & Astronomy)》 SCIE EI CAS 2004年第1期24-35,共12页
Based on the propagation theory of partially coherent light in the space-frequency domain, the anomalous spectral behavior and spectral switches in the far field of partially coherent and polychromatic light diffracte... Based on the propagation theory of partially coherent light in the space-frequency domain, the anomalous spectral behavior and spectral switches in the far field of partially coherent and polychromatic light diffracted at an aperture are studied. It is shown that, as compared with spatially fully coherent and polychromatic light whose spectral anomalies are induced only by aperture diffraction, the spectral anomalies and spectral switches of partially coherent and polychromatic light depend on the aperture diffraction, spatial correlationβ and bandwidth of the original spectrum. Detailed numerical calculations are made to illustrate the behavior of spectral switches of partially coherent and polychromatic light, and the results for spatially fully coherent and polychromatic light are treated as a special case ofβ=1 and included in our theory. 展开更多
关键词 spectral anomaly spectral switch partially coherent and polychromatic light far field aperture diffraction
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Roughness Measurements with Polychromatic Speckles on Tilted Surfaces 被引量:2
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作者 Johannes Stempin Andreas Tausendfreund +1 位作者 Dirk Stobener Andreas Fischer 《Nanomanufacturing and Metrology》 2021年第4期237-246,共10页
Surface light scattering enables contactless and fast measurements of surface roughness.A surface inclination alters the direction of the scattering beam and thus the measured surface roughness is calculated from the ... Surface light scattering enables contactless and fast measurements of surface roughness.A surface inclination alters the direction of the scattering beam and thus the measured surface roughness is calculated from the detected intensity distribution.Hence,an accurate sensor-surface alignment is necessary.In order to achieve tilt-independent roughness measurements,a model-based evaluation approach for polychromatic speckle patterns is presented.By evaluating the shape of the superposed speckles,which occur for polychromatic illumination,with regard to the distance to the scattering centre,surfaces with an Sa roughness value in the range of 0.8-3.2μm are measurable.Experimental investigations demonstrate that the influence of a surface tilt up to±1.25°on the roughness measurement is reduced by 90%.As a result,the robustness of the polychromatic speckle roughness measurement is improved,which allows to speed up the adjustment of the measurement system or the surface sample,respectively. 展开更多
关键词 Surface roughness polychromatic light scattering Surface tilting In-process measurement
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