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Surface Microstructure Characterization of Sol-gel Derived Porous TiO_2 Thin Films 被引量:1
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作者 Jiaguo Yu, Jimmy C. Yu, Bei Cheng, A. S. K. Li, Pak Kan Tse 1) Department of Chemistry, The Chinese University of Hong Kong, Hong Kong, China 2) State Key Lab of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, W 《Rare Metals》 SCIE EI CAS CSCD 2001年第3期157-163,共7页
Porous TiO2 thin films were prepared from alkoxide solutions with and without polyethylene glycol (PEG) by sol-get route on soda lime glass, and were characterized by atomic force microscopy (AFM), transmission electr... Porous TiO2 thin films were prepared from alkoxide solutions with and without polyethylene glycol (PEG) by sol-get route on soda lime glass, and were characterized by atomic force microscopy (AFM), transmission electron microscopy (TEM) and X-ray diffraction (XRD). The results show that TiO2 film prepared from precursor solution without PEG is composed of spherical particles of about 100 nm and several nanometer mesoporous pores. With the increase of the amount of PEG added to the precursor solution, the diameter and the depth of the pores in the resultant films increas on the decomposition of PEG during heat-treatment, which lead to them increase of the surface roughness of the films. XRD and TEM results show that the single anatase phase is precipitated and there are some orientation effects in (101) direction. 展开更多
关键词 sol-gel route porous TiO2 thin films surface microstructure CHARACTERIZATION
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Positronium diffusion in porous methylsilsesquioxane thin films
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作者 董锡杰 胡一帆 吴玉莹 《Chinese Physics B》 SCIE EI CAS CSCD 2010年第1期276-283,共8页
Depth profiled positronium (Ps) annihilation lifetime spectroscopy (PALS) is an extremely useful probe of the pore characteristics in nanoporous low-dielectric (low-k) constant thin films. PALS has also been con... Depth profiled positronium (Ps) annihilation lifetime spectroscopy (PALS) is an extremely useful probe of the pore characteristics in nanoporous low-dielectric (low-k) constant thin films. PALS has also been considered as a potential probe to investigate diffusion barrier integrity and the structural changes of porous low-k films during their integration with Cu. Hence, it is essential to understand the diffusion behaviour of positronium/Cu atoms in the films. In this work, based on the fact that porous materials possess characteristics of statistical self-similarity, a fractal model, the Menger sponge model, has been applied to simulate the structure of a promising dielectric, porous methylsilsesquioxane (MSQ) films. The diffusion behaviour of Ps out of the fractal model and into the surrounding vacuum is studied by means of the diffusion equation and traditional adveetive diffusive theory. Predictive results from our model show good agreement with measurement data. 展开更多
关键词 POSITRONIUM porous methylsisesquioxane thin films low-k Menger sponge model
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