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Performance and Reliability of Multilayer Silicon Nanocrystal Nonvolatile Memory
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作者 王柳笛 张志刚 +2 位作者 赵悦 毛平 潘立阳 《Tsinghua Science and Technology》 SCIE EI CAS 2009年第1期103-105,共3页
Nonvolatile memories (NVMs) with triple layers of silicon nanocrystals were fabricated with conventional CMOS technology. This paper explores the program/erase performance and reliability of NVMs with three layers o... Nonvolatile memories (NVMs) with triple layers of silicon nanocrystals were fabricated with conventional CMOS technology. This paper explores the program/erase performance and reliability of NVMs with three layers of nanocrystais. The results indicate that the nanocrystals in the triple-layer nanocrystal NVM (NCNVM) are difficult to fully charge during the programming process. The programming speed of the triple-layer NCNVMs is quicker than that of single-layer NCNVMs, which means that the second and third layers of nanocrystals in the triple-layer NCNVM affect the charge of the first layer nanocrystals. Reliability tests show that the memory window has little degradation after 1× 10^4 cycles. 展开更多
关键词 nanocrystal nonvolatile memory program and erase ENDURANCE
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