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Carriers recombination processes in charge trapping memory cell by simulation
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作者 宋云成 刘晓彦 +2 位作者 杜刚 康晋锋 韩汝琦 《Chinese Physics B》 SCIE EI CAS CSCD 2008年第7期2678-2682,共5页
We have evaluated the effects of recombination processes in a charge storage layer, either between trapped electrons and trapped holes or between trapped carriers and free carriers, on charge trapping memory cell's p... We have evaluated the effects of recombination processes in a charge storage layer, either between trapped electrons and trapped holes or between trapped carriers and free carriers, on charge trapping memory cell's performances by numerical simulation. Recombination is an indispensable mechanism in charge trapping memory. It helps charge convert process between negative and positive charges in the charge storage layer during charge trapping memory programming/erasing operation. It can affect the speed of programming and erasing operations. 展开更多
关键词 recombination in insulator charge trapping memory programming/erasing characteristic
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