Modeling to predict the time evolution of negative bias temperature instability(NBTI) induced single event transient pulse broadening

An analytical model is proposed to calculate single event transient (SET) pulse width with bulk complementary metal oxide semiconductor (CMOS) technology based on the physics of semiconductor devices. Combining with the most prevalent negative bias temperature instability (NBTI) degradation model, a novel analytical model is developed to predict the time evolution of the NBTI induced SET broadening in the production, and NBTI experiments and three-dimensional numerical device simulations are used to verify the model. At the same time, an analytical model to predict the time evolution of the NBTI induced SET broadening in the propagation is also proposed, and NBTI experiments and the simulation program with integrated circuit emphasis (SPICE) are used to verify the proposed model.

High-Efficiency Generation of 0.12 mJ, 8.6 Fs Pulses at 400 nm Based on Spectral Broadening in Solid Thin Plates

We demonstrate eftlcient generation of continuous spectrum centered at 40Ohm from solid thin plates. By frequency doubling of 0.8m J, 3Ors Ti：sapphire laser pulses with a BBO crystal, 0.2m J, 33fs laser pulses at 400nm are generated. Focusing the 400-nm pulses into 7 thin fused silica plates, we obtain 0.15mJ continuous spectrum covering 350-450 nm. After compressing by 3 pairs of chirped mirrors, 0. 12 m J, 8.6 fs pulses are achieved. To the best of our knowledge, this is the first time that sub-10-fs pulses centered at 400nm are generated by solid thin plates, which shows that spectral broadening in solid-state materials works not only at 800nm but also at different wavelengths.

Effects of dispersion and filtering induced by periodic multilayer mirrors reflection on attosecond pulses

Using temporal and spectral methods,the effects of dispersion and filtering induced by Mo/Si multilayer mirrors reflection on incident attosecond pulses were studied.First,two temporal parameters,the pulse broadening factor,and the energy loss factor,were defined to evaluate the effects of dispersion and filtering.Then,by analyzing these temporal parameters,we investigated and compared the dispersion and filtering effects on attosecond pulses.In addition,we explored the origins of pulse broadening and energy loss by analyzing the spectral and temporal characteristics of periodic Mo/Si multilayer mirrors.The results indicate that the filtering effect induced by Mo/Si multilayer mirrors reflection is the dominant reason for pulse broadening and energy loss.

PIPBQ Effect Aware SER Analysis for Combinational Logic Circuits

Technology scaling results in the propagation-induced pulse broadening and quenching（PIPBQ） effect become more noticeable.In order to effectively evaluate the soft error rate for combinational logic circuits,a soft error rate analysis approach considering the PIPBQ effect is proposed.As different original pulse propagating through logic gate cells,pulse broadening and quenching are measured by HSPICE.After that,electrical effect look-up tables（EELUTs） for logic gate cells are created to evaluate the PIPBQ effect.Sensitized paths are accurately retrieved by the proposed re-convergence aware sensitized path search algorithm.Further,by propagating pulses on these paths to simulate fault injection,the PIPBQ effect on these paths can be quantified by EELUTs.As a result,the soft error rate of circuits can be effectively computed by the proposed technique.Simulation results verify the soft error rate improvement comparing with the PIPBQ-not-aware method.