Trap states induced by reactive ion etching in AlGaN/GaN high-electron-mobility transistors

Frequency-dependent conductance measurements were carried out to investigate the trap states induced by reactive ion etching in A1GaN/GaN high-electron-mobility transistors （HEMTs） quantitatively. For the non-recessed HEMT, the trap state density decreases from 2.48 × 1013 cm-2.eV-1 at an energy of 0.29 eV to 2.79 × 1012 cm-2.eV-1 at ET = 0.33 eV. In contrast, the trap state density of 2.38 × 1013-1.10× 1014 cm-2.eV-1 is located at ET in a range of 0.30-0.33 eV for the recessed HEMT. Thus, lots of trap states with shallow energy levels are induced by the gate recess etching. The induced shallow trap states can be changed into deep trap states by 350 ℃ annealing process. As a result, there are two different types of trap sates, fast and slow, in the annealed HEMT. The parameters of the annealed HEMT are ET = 0.29-0.31 eV and DT = 8.16× 1012-5.58 × 1013 cm-2.eV-1 for the fast trap states, and ET = 0.37-0.45 eV and DT = 1.84×1013- 8.50 × 1013 cm-2.eV-1 for the slow trap states. The gate leakage currents are changed by the etching and following annealing process, and this change can be explained by the analysis of the trap states.

Reactive Ion Etching of GaAs,GaSb,InP and InAs in Cl_2/Ar Plasma

Reactive ion etching characteristics of GaAs,GaSb,InP and InAs using Cl2/Ar plasma have been investigated,it is that,etching rates and etching profiles as functions of etching time,gas flow ratio and RF power.Etch rates of above 0.45 μm/min and 1.2 μm/min have been obtained in etching of GaAs and GaSb respectively, while very slow etch rates （<40 nm/min） were observed in etching of In-containing materials,which were linearly increased with the applied RF power.Etched surfaces have remained smooth over a wide range of plasma conditions in the etching of GaAs,InP and InAs,however,were partly blackened in etching of GaSb due to a rough appearance.

Reactive Ion Etching of ITO Transparent Electrode of TFT-AMLCD in Ar/CF_4 Plasma

The pattern of ITO transparent electrode of pixel cells in TFT-AMLCD is a critical step in the manufacturing process of flat panel display devices,the development of suitable plasma reactive ion etching is necessary to achieve high resolution display.In this work we investigated the Ar/CF 4 plasma etching of ITO as function of different parameters.We demonstrated the ability of this plasma to etch ITO and achieved an etching rate of about 3.73 nm/min,which is expected to increase for long pumping down period,and also through addition of hydrogen in the plasma.Furthermore we described the ITO etching mechanism in Ar/CF 4 plasma.The investigation of selectivity showed to be very low over silicon nitride and silicon dioxide but very high over aluminum.

Transfer of Machined Patterns on an Aluminum Plate to Pyrex Glass Using Reactive Ion Etching SF_(6) Plasma without Masks

A method for etching the surface of a Pyrex glass substrate using the Reactive Ion Etching process without the use of masks is reported. Variations in the machined surface on an auxiliary plate, manufactured in aluminum and placed below a Pyrex glass slide, were transferred to the upper surface of the substrate. SF6 as etching gas and low pressure chamber to promote the increase of mean free path of ions were used. Two etching ratios were found, general, that affects the entire surface of the substrate, and differential, which generates the relief on the surface of the glass. Differential etching depth showed a linear behavior with respect to time;the mean differential etching rate obtained was 43 nm/min. The same phase between the auxiliary plate machining and the etched pattern on the substrate is preserved. With this technique it was possible to manufacture convex and concave surfaces;some examples are given. The arithmetic mean roughness achieved with the proposed method was found to be N1 class, ideal for the development of optical corrector plates.

Optimization of Plasma Etching Parameters and Mask for Silica Optical Waveguides

Optical waveguides in silica-on-silicon are one of the key elements in optical communications.The processes of deep etching silica waveguides using resist and metal masks in RIE plasma are investigated.The etching responses,including etching rate and selectivity as functions of variation of parameters,are modeled with a 3D neural network.A novel resist/metal combined mask that can overcome the single-layer masks’ limitations is developed for enhancing the waveguides deep etching and low-loss optical waveguides are fabricated at last.

Fabrication of Diamond Microstructures by Using Dry and Wet Etching Methods

Diamond films have great potential for micro-electro-mechanical system（MEMS） application.For device realization,precise patterning of diamond films at micrometer scale is indispensable.In this paper,simple and facile methods will be demonstrated for smart patterning of diamond films,in which two etching techniques,i.e.,plasma dry etching and chemical wet etching（including isotropic-etching and anisotropic-etching） have been developed for obtaining diamond microstructures with different morphology demands.Free-standing diamond micro-gears and micro-combs were achieved as examples by using the experimental procedures.It is confirmed that as-designed diamond structures with a straight side wall and a distinct boundary can be fabricated effectively and efficiently by using such methods.

Fabrication of Ultra Deep Electrical Isolation Trenches with High Aspect Ratio Using DRIE and Dielectric Refill

A novel technique to fabricate ultra deep high aspect ratio electrical isolation trenches with DRIE and dielectric refill is presented.The relationship between trench profile and DRIE parameters is discussed.By optimizing DRIE parameters and RIE etching the trenches’ opening,the ideal trench profile is obtained to ensure that the trenches are fully refilled without voids.The electrical isolation trenches are 5μm wide and 92μm deep with 0.5μm thick oxide layers on the sidewall as isolation material.The measured I-V result shows that the trench structure has good electrical isolation performance:the average resistance in the range of 0～100V is more than 10 11Ω and no breakdown appears under 100V.This isolation trench structure has been used in fabrication of the bulk integrated micromachined gyroscope,which shows high performance.

Fabrication of metal suspending nanostructures by nanoimprint lithography(NIL) and isotropic reactive ion etching(RIE)

We report herein a rational approach for fabricating metal suspending nanostructures by nanoimprint lithography(NIL) and isotropic reactive ion etching(RIE).The approach comprises three principal steps:(1) mold fabrication,(2) structure replication by NIL,and(3) suspending nanostructures creation by isotropic RIE.Using this approach,suspending nanostructures with Au,Au/Ti or Ti/Au bilayers,and Au/Ti/Au sandwiched structures are demonstrated.For Au nanostructures,straight suspending nanostructures can be obtained when the thickness of Au film is up to 50 nm for nano-bridge and 90 nm for nano-finger patterns.When the thickness of Au is below 50 nm for nano-bridge and 90 nm for nano-finger,the Au suspending nanostructures bend upward as a result of the mismatch of thermal expansion between the thin Au films and Si substrate.This leads to residual stresses in the thin Au films.For Au/Ti or Ti/Au bilayers nanostructures,the cantilevers bend toward Au film,since Au has a larger thermal expansion coefficient than that of Ti.While in the case of sandwich structures,straight suspending nanostructures are obtained,this may be due to the balance of residual stress between the thin films.

基于DRIE的太赫兹行波管硅基低损耗慢波结构工艺技术研究

行波管慢波结构的制造通常采用计算机数字化控制精密机械加工技术。随着工作频率的提升,对慢波结构特征尺寸精度的要求达到微纳米级,导致加工难度大、周期长,成本高昂,一定程度上限制了技术的快速发展。硅基MEMS加工工艺具备优秀的三维形貌可控性,尺寸控制精度高,批次一致性较好。本文针对太赫兹行波管功率源对双槽深折叠波导慢波结构的设计要求,开发了基于硅基底材料的三维集成工艺制造技术。采用光刻胶掩蔽结合介质掩蔽工艺方法,聚焦优化深反应离子刻蚀(Deep reactive ion etching,DRIE)中刻蚀钝化平衡参数,完成了电镀金和金金键合的完整工艺流程开发,实现了工作频率达0.65 THz、单位长度插入损耗低至1.6 dB/mm的高性能硅基太赫兹慢波结构150 mm晶圆级工艺制备,为太赫兹行波管的技术突破和应用发展建立了技术基础。

Formation mechanism of multi-functional black silicon based on optimized deep reactive ion etching technique with SF_6/C_4F_8

This paper reports a controllable multi-functional black silicon surface with nanocone-forest structures fabricated by an optimized deep reactive ion etching(DRIE)technique using SF6/C4F8 in cyclic etching-passivation process,which is maskless,effective and controllable.The process conditions are investigated by systematically comparative experiments and core parameters have been figured out,including etching process parameters,pre-treatment,patterned silicon etching and inclined surface etching.Based on the experimental data,the formation mechanism of nanocone shape is developed,which provides a novel view for in-depth understanding of abnormal phenomena observed in the experiments under different process situations.After the optimization of the process parameters,the black silicon surfaces exhibit superhydrophobicity with tunable reflectance.Additionally,the quantitative relationship between nanocones aspect ratio and surface reflectance and static contact angle is obtained,which demonstrates that black silicon surfaces with unique functional properties(i.e.,cross-combination of reflectance and wettability)can be achieved by controlling the morphology of nanostructures.

Reactive ion etching of poly(vinylidene fluoride-trifluoroethylene) copolymer for flexible piezoelectric devices

A microfabrication process for poly(vinylidene fluoride-trifluoroethylene)(P(VDF-TrFE)) based flexible piezoelectric devices is proposed using heat controlled spin coating and reactive ion etching(RIE) techniques.Dry etching of P(VDF-TrFE) in CF 4 +O2 plasma is found to be more effective than that using SF 6 +O2 or Ar+O2 feed gas with the same radiofrequency power and pressure conditions.A maximum etching rate of 400 nm/min is obtained using the CF 4 +O2 plasma with an oxygen concentration of 60% at an antenna power of 200 W and a platen power of 20 W.The oxygen atoms and fluorine atoms are found to be responsible for the chemical etching process.Microstructuring of P(VDF-TrFE) with a feature size of 10 m is achieved and the patterned films show a high remanent polarization of 63.6mC/m 2.

A sliding-mode triboelectric nanogenerator with chemical group grated structure by shadow mask reactive ion etching

With the support by the National Natural Science Foundation of China,a collaboration by the research groups led by Prof.Cheng Gang(程纲)from Henan University and Prof.Wang Zhonglin(王中林)from Beijing Institute of Nanoenergy and Nanosystems,Chinese Academy of Sciences,invents'a sliding-mode triboelectric nanogenerator with chemical group grated structure by shadow mask reactive ion etching',which was published in ACS Nano(2017,11(9):8796-8803).

A photoluminescence study of plasma reactive ion etching-induced damage in GaN

GaN films with reactive ion etching （RIE） induced damage were analyzed using photoluminescence （PL）. We observed band-edge as well as donor-acceptor peaks with associated phonon replicas, all in agreement with previous studies. While both the control and damaged samples have their band-edge peak location change with temperature following the Varshni formula, its intensity however decreases with damage while the D-A peak increases considerably. Nitrogen post-etch plasma was shown to improve the band edge peak and decrease the D-A peak. This suggests that the N2 plasma has helped reduce the number of trapped carriers that were participating in the D-A transition and made the D°X transition more active, which reaffirms the N2 post-etch plasma treatment as a good technique to heal the GaN surface, most likely by filling the nitrogen vacancies previously created by etch damage.

Reactive ion etching of Si_2Sb_2Te_5 in CF_4/Ar plasma for a nonvolatile phase-change memory device

Phase change random access memory （PCRAM） is one of the best candidates for next generation non- volatile memory, and phase change SiESbETe5 material is expected to be a promising material for PCRAM. In the fabrication of phase change random access memories, the etching process is a critical step. In this paper, the etching characteristics of Si2Sb2Te5 films were studied with a CF4/Ar gas mixture using a reactive ion etching system. We observed a monotonic decrease in etch rate with decreasing CF4 concentration, meanwhile, Ar concentration went up and smoother etched surfaces were obtained. It proves that CF4 determines the etch rate while Ar plays an im- portant role in defining the smoothness of the etched surface and sidewall edge acuity. Compared with GeESbETe5, it is found that Si2Sb2Te5 has a greater etch rate. Etching characteristics of Si2SbETe5 as a function of power and pressure were also studied. The smoothest surfaces and most vertical sidewalls were achieved using a CF4/Ar gas mixture ratio of 10/40, a background pressure of 40 mTorr, and power of 200 W.

Reactive ion etching of Ti-diffused LiNbO_3 slab waveguides

Reactive ion etching（RIE） of LiNbO_3（LN） in SF_6 plasma atmosphere was studied for optimizing the preparation conditions for LN ridge waveguides.The samples to be etched are Ti-diffused LN slab waveguides overlaid with a chromium film mask that has a Mach-Zehnder interferometer（MZI） array pattern.The experimental results indicate that the LN-etching rate（R_（LN）） and the Cr-etching rate（R_（Cr）） as well as the rate ratio R_（LN）/R_（Cr） increase with either increasing the radio-frequency（RF） power at a given SF_6 flow rate or increasing the SF_6 flow rate at a fixed RF power.The maximum values of R_（LN） = 43.2 nm/min and R_（LN）/R_（Cr） = 3.27 were achieved with 300 W RF power and 40 sccm SF_6 flow.When the SF_6 flow rate exceeds 40 sccm,an increase in the flow rate causes the etching rates and the rate ratio to decrease.The scanning electron microscope images of the LN ridge prepared after～20 min etching show that the ridge height is 680 nm and the sidewall slope angle is about 60°.

RIE精确传递微光学三维结构于红外材料的方法

本文对红外光学材料锗的蚀刻性能、机制进行了深入的研究，在反应离子蚀刻（ＲＩＥ）实验基础上，建立了锗材料蚀刻性能与ＲＩＥ工艺参量的关系，经过大量的实验，找到了稳定蚀刻速率的方法和条件。

DRIE技术加工W波段行波管折叠波导慢波结构的研究

简要介绍了利用深反应离子刻蚀制作折叠波导慢波结构的现状及制作的工艺流程。对深反应离子刻蚀掩膜制作即光刻工艺,以及折叠波导慢波结构的深刻加工进行了深入的研究。详细分析了各光刻工艺对光刻胶图形的影响,尤其是前烘对光刻胶图像侧壁垂直度的影响;在深反应离子刻蚀中,还详细分析了刻蚀时间、下电极功率以及刻蚀气体气压对刻蚀结果的影响。经参数优化后获得最佳工艺参数,并制作出带有电子注通道的W波段折叠波导慢波结构,慢波结构深为946μm,侧壁垂直度为91°,电子注通道深为225μm,侧壁垂直度为90°。

DRIE工艺误差对MEMS梳齿谐振器频率的影响

针对深反应离子刻蚀(DRIE)工艺加工高深宽比梳齿电容存在侧壁倾斜角的情况,分析了该倾斜角对梳齿谐振器频率的影响。为了使设计的梳齿谐振器频率符合应用要求,推导出了梳齿谐振器在正负侧壁倾斜角θ下的谐振频率计算公式。利用ANSYS Workbench11.0平台,分别对侧壁倾斜角为0°,0.2°,0.35°和0.5°的情形进行了有限元建模与模态仿真。仿真结果表明:随着正倾斜角的增大,谐振频率减小;负倾斜角增大时,谐振频率增大,且一阶模态振形的平稳程度越差。比较数值仿真结果与考虑了正负倾斜角误差的梳齿谐振器谐振频率计算公式计算结果对比,吻合较好。

微机械加工中的RIE技术

简述了反应离子刻蚀(RIE)技术在微型传感器部件加工制造中的应用,报道了采用NF_3、SF_6等气体反应离子刻蚀Si的实验结果,研制出了φ300μm的微型Si齿轮。

反应离子深刻蚀(RIE)技术的研究

本文概述了微机械的发展前景和反应离子刻蚀技术在微机械研究中的应用.采用NF_3T SF_6/CCI_2F_2混合气体,在平板型反应离子刻蚀仪上,对硅进行了反应离子深刻蚀的研究,获得了一批经验数据.研制出了直径500μm,厚度为24.7μm的微型硅齿轮,刻蚀出厚度为50μm,侧向腐蚀为2μm的硅微细圆形.