期刊文献+
共找到1篇文章
< 1 >
每页显示 20 50 100
A low on-resistance SOI LDMOS using a trench gate and a recessed drain 被引量:2
1
作者 葛锐 罗小蓉 +6 位作者 蒋永恒 周坤 王沛 王琦 王元刚 张波 李肇基 《Journal of Semiconductors》 EI CAS CSCD 2012年第7期43-46,共4页
An integrable silicon-on-insulator (SOl) power lateral MOSFET with a trench gate and a recessed drain (TGRD MOSFET) is proposed to reduce the on-resistance. Both of the trench gate extended to the buried oxide (... An integrable silicon-on-insulator (SOl) power lateral MOSFET with a trench gate and a recessed drain (TGRD MOSFET) is proposed to reduce the on-resistance. Both of the trench gate extended to the buried oxide (BOX) and the recessed drain reduce the specific on-resistance (Ron, sp) by widening the vertical conduction area and shortening the extra current path. The trench gate is extended as a field plate improves the electric field distribution. Breakdown voltage (BV) of 97 V and Ron, sp of 0.985 mf2-cm2 (l/os = 5 V) are obtained for a TGRD MOSFET with 6.5/xm half-cell pitch. Compared with the trench gate SOI MOSFET (TG MOSFET) and the conventional MOSFET, Ron' sp of the TGRD MOSFET decreases by 46% and 83% at the same BV, respectively. Compared with the SOI MOSFET with a trench gate and a trench drain (TGTD MOSFET), BV of the TGRD MOSFET increases by 37% at the same Ron,sp. 展开更多
关键词 trench gate recessed drain ON-RESISTANCE breakdown voltage
原文传递
上一页 1 下一页 到第
使用帮助 返回顶部