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Influence of window layer thickness on double layer antireflection coating for triple junction solar cells
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作者 王莉娟 詹峰 +5 位作者 俞颖 朱岩 刘少卿 黄社松 倪海桥 牛智川 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2011年第6期137-140,共4页
The optimization of a SiO_2/TiO_2,SiO_2/ZnS double layer antireflection coating(ARC)on Ga_(0.5)In_(0.5)P/In_(0.02)Ga_(0.98)As/Ge solar cells for terrestrial application is discussed.The Al_(0.5)In_(0.5)P... The optimization of a SiO_2/TiO_2,SiO_2/ZnS double layer antireflection coating(ARC)on Ga_(0.5)In_(0.5)P/In_(0.02)Ga_(0.98)As/Ge solar cells for terrestrial application is discussed.The Al_(0.5)In_(0.5)P window layer thickness is also taken into consideration.It is shown that the optimal parameters of double layer ARC vary with the thickness of the window layer. 展开更多
关键词 reflection curves optical reflectivity ANTIreflection transfer matrix
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