期刊文献+
共找到1篇文章
< 1 >
每页显示 20 50 100
Measurement of the wavelength modulation indices with selective reflection spectroscopy
1
作者 肖连团 赵建明 +3 位作者 尹王保 赵延霆 Bernard Journet 贾锁堂 《Chinese Optics Letters》 SCIE EI CAS CSCD 2003年第7期426-428,共3页
The wavelength modulation indices are measured based on harmonic amplitude ratio of 4famp/6famp (4famp and 6famp are the 4- and 6-th harmonic central peak amplitudes correspondingly) with the Doppler-free selective re... The wavelength modulation indices are measured based on harmonic amplitude ratio of 4famp/6famp (4famp and 6famp are the 4- and 6-th harmonic central peak amplitudes correspondingly) with the Doppler-free selective reflection modulation spectroscopy. The experiments for the 6S1/2(F = 4) → 6P3/2(F' = 5) transition of cesium D2 line with 30-MHz linewidth were carried out. The 4f- and 6f-harmonic signals were detected with two digital lock-in amplifiers separately. The maximum error for modulation indices measurement was ±0.1 within the range of m from 3 to 6. The non-linear modulation behaviour of an external cavity diode laser induced by voltage tuning was studied with this method. The method for modulation indices measurement does not require a solid etalon as usual for measuring the wavelength modulation depth and the absorption linewidth correspondingly. 展开更多
关键词 of AS in on with Measurement of the wavelength modulation indices with selective reflection spectroscopy LINE FORM HFS
原文传递
上一页 1 下一页 到第
使用帮助 返回顶部