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Fine upper crustal structure of Jiashi strong earthquake swarm region in Xinjiang in-ferred from high resolution seismic refraction profile data
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作者 徐朝繁 张先康 +3 位作者 段永红 杨卓欣 鄷少英 胡修奇 《Acta Seismologica Sinica(English Edition)》 EI CSCD 2006年第1期62-71,共10页
The data obtained from a high resolution seismic refraction profile, which was carded out in Jiashi, Xinjiang, strong earthquake swarm area, were processed with both finite difference inversion and Hagedoorn refractor... The data obtained from a high resolution seismic refraction profile, which was carded out in Jiashi, Xinjiang, strong earthquake swarm area, were processed with both finite difference inversion and Hagedoorn refractor wavefront imaging technique and the fine upper crustal structure was determined. The results show that the upper crustal structure is relatively well-distributed in laterally and obviously by layers vertically.From surface to 11.0 km depth, there are about four layers. The P wave velocity of top two layers range from 1.65 to 4.5 km/s and their bottom boundaries, the buried depths of which are 0.4, 2.96-3.0 km respectively, are almost horizontal; The third layer is comparatively complicated and its P wave velocity presents inhomogeneous in both laterally and vertically. The bottom boundary of third layer is crystalline basement and shows a little uplift, which seemly suggest that the upper crust had been resisted while the hard Tarim block inserting into Tianshan Mountain; The forth layer is relatively even and its P wave velocity is about 6.3 km/s. There are a lateral velocity variation at the depth of about 4.0 km, and suggest that it has something to do with the hidden Meigaiti fault and Meigaiti-Xiasuhong fault but there are no the structure features about these faults stretching to the surface and passing through the crystalline basement. The seismogenic tectonic of Jiashi strong earthquake swarm at least lies in middle or lower crust beneath 11.0 km depth. 展开更多
关键词 Jiashi strong earthquake swarm region high resolution refraction finite different inversion Hagedoorn principle refractor wavefront imaging
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Temperature coefficient of the refractive index for PbTe film
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作者 徐嶺茂 周晖 +3 位作者 何延春 张凯锋 武生虎 熊玉卿 《Chinese Optics Letters》 SCIE EI CAS CSCD 2017年第4期73-75,共3页
Specimens of PbTe single film are deposited on Ge substrates by vacuum thermal evaporation.During the temperature range of 80–300 K,the transmittance of a PbTe film within 2–15μm is measured every 20 K by the Perki... Specimens of PbTe single film are deposited on Ge substrates by vacuum thermal evaporation.During the temperature range of 80–300 K,the transmittance of a PbTe film within 2–15μm is measured every 20 K by the Perkin Elmer Fourier transform infrared spectroscopy cryogenic testing system.Then,the relationship between the refractive index and wavelength within 7–12μm at different temperatures is received by the full spectrum inversion method fitting.It can be seen that the relationship conforms to the Cauchy formula,which can be fitted.Then,the relationship between the refractive index of the PbTe film and the temperature/wavelength can be expressed as n(λ,T)=5.82840-0.00304T+4.61458×10-6T2+8.00280∕λ2+0.21544∕λ4,which is obtained by the fitting method based on the Cauchy formula.Finally,the designed value obtained by the formula and the measured spectrum are compared to verify the accuracy of the formula. 展开更多
关键词 PbTe refractive fitting evaporation transmittance fitted verify Elmer Cauchy inversion
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