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Physico−mathematical model of the voltage−current characteristics of light-emitting diodes with quantum wells based on the Sah−Noyce−Shockley recombination mechanism
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作者 Fedor I.Manyakhin Dmitry O.Varlamov +3 位作者 Vladimir P.Krylov Lyudmila O.Morketsova Arkady A.Skvortsov Vladimir K.Nikolaev 《Journal of Semiconductors》 EI CAS CSCD 2024年第8期25-33,共9页
Herein,a physical and mathematical model of the voltage−current characteristics of a p−n heterostructure with quantum wells(QWs)is prepared using the Sah−Noyce−Shockley(SNS)recombination mechanism to show the SNS reco... Herein,a physical and mathematical model of the voltage−current characteristics of a p−n heterostructure with quantum wells(QWs)is prepared using the Sah−Noyce−Shockley(SNS)recombination mechanism to show the SNS recombination rate of the correction function of the distribution of QWs in the space charge region of diode configuration.A comparison of the model voltage−current characteristics(VCCs)with the experimental ones reveals their adequacy.The technological parameters of the structure of the VCC model are determined experimentally using a nondestructive capacitive approach for determining the impurity distribution profile in the active region of the diode structure with a profile depth resolution of up to 10Å.The correction function in the expression of the recombination rate shows the possibility of determining the derivative of the VCCs of structures with QWs with a nonideality factor of up to 4. 展开更多
关键词 light-emitting diodes with quantum wells voltage−current relation nonideality factor recombination mechanism Sah−Noyce−Shockley model
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Soft Fault Diagnosis for Analog Circuits Based on Slope Fault Feature and BP Neural Networks 被引量:6
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作者 胡梅 王红 +1 位作者 胡庚 杨士元 《Tsinghua Science and Technology》 SCIE EI CAS 2007年第S1期26-31,共6页
Fault diagnosis is very important for development and maintenance of safe and reliable electronic circuits and systems. This paper describes an approach of soft fault diagnosis for analog circuits based on slope fault... Fault diagnosis is very important for development and maintenance of safe and reliable electronic circuits and systems. This paper describes an approach of soft fault diagnosis for analog circuits based on slope fault feature and back propagation neural networks (BPNN). The reported approach uses the voltage relation function between two nodes as fault features; and for linear analog circuits, the voltage relation function is a linear function, thus the slope is invariant as fault feature. Therefore, a unified fault feature for both hard fault (open or short fault) and soft fault (parametric fault) is extracted. Unlike other NN-based diagnosis methods which utilize node voltages or frequency response as fault features, the reported BPNN is trained by the extracted feature vectors, the slope features are calculated by just simulating once for each component, and the trained BPNN can achieve all the soft faults diagnosis of the component. Experiments show that our approach is promising. 展开更多
关键词 soft fault diagnosis analog circuit back propagation neural network (BPNN) voltage relation function SLOPE
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