Reliability test and failure analysis of high power LED packages

A new type application specific light emitting diode （LED） package （ASLP） with freeform polycarbonate lens for street lighting is developed, whose manufacturing processes are compatible with a typical LED packaging process. The reliability test methods and failure criterions from different vendors are reviewed and compared. It is found that test methods and failure criterions are quite different. The rapid reliability assessment standards are urgently needed for the LED industry. 85℃/85 RH with 700 mA is used to test our LED modules with three other vendors for 1000 h, showing no visible degradation in optical performance for our modules, with two other vendors showing significant degradation. Some failure analysis methods such as C-SAM, Nano X-ray CT and optical microscope are used for LED packages. Some failure mechanisms such as delaminations and cracks are detected in the LED packages after the accelerated reliability testing. The finite element simulation method is helpful for the failure analysis and design of the reliability of the LED packaging. One example is used to show one currently used module in industry is vulnerable and may not easily pass the harsh thermal cycle testing.

An Energy Model of a Failure Mechanism and its Application

The energy expression is presented for a failure mechanism, and it is appliedin an Accelerated Life Test (ALT) and an Accelerated Reliability Growth Test (ARGT). The conditionsof the common failure mechanism are obtained. The essential relationship between the conditions andthe Accelerated Factor (A_f) is proposed by using the energy model.

Research of Step-down Stress Accelerated Degradation Data Assessment Method of a Certain Type of Missile Tank

The performance degradation rates of the missile tank are generally time-varying functions uneasily evaluated by general classical evaluation methods. This paper develops a segmented nonlinear accelerated degradation model （SNADM） based on the equivalent method of accumulative damage theory, which tackles the problem that product life is difficult to be determined with degradation rate being a function of the variable of time. A segmented expression of the function of population accumulative degradation is derived. And combined with nonlinear function, an accelerated degradation function, i.e., SNADM is obtained. The parameters of the SNADM are identified by numerical iteration, and the statistical function of degradation track is extrapolated. The reliability function is determined through the type of random process of the degradation distribution. Then an evaluation of product storage life is undertaken by combining the statistical function of degradation track, reliability function and threshold. An example of a missile tank undergoes a step-down stress accelerated degradation test （SDSADT）, in which the results with the SNADM and the classical method are evaluated and compared. The technology introduced is validated with the resultant coincidence of both evaluated and field storage lives.