期刊文献+
共找到1篇文章
< 1 >
每页显示 20 50 100
Residual lifetime prediction model of nonlinear accelerated degradation data with measurement error 被引量:12
1
作者 Zhongyi Cai Yunxiang Chen +1 位作者 Qiang Zhang Huachun Xiang 《Journal of Systems Engineering and Electronics》 SCIE EI CSCD 2017年第5期1028-1038,共11页
For the product degradation process with random effect (RE), measurement error (ME) and nonlinearity in step-stress accelerated degradation test (SSADT), the nonlinear Wiener based degradation model with RE and ME is ... For the product degradation process with random effect (RE), measurement error (ME) and nonlinearity in step-stress accelerated degradation test (SSADT), the nonlinear Wiener based degradation model with RE and ME is built. An analytical approximation to the probability density function (PDF) of the product's lifetime is derived in a closed form. The process and data of SSADT are analyzed to obtain the relation model of the observed data under each accelerated stress. The likelihood function for the population-based observed data is constructed. The population-based model parameters and its random coefficient prior values are estimated. According to the newly observed data of the target product in SSADT, an analytical approximation to the PDF of its residual lifetime (RL) is derived in accordance with its individual degradation characteristics. The parameter updating method based on Bayesian inference is applied to obtain the posterior value of random coefficient of the RL model. A numerical example by simulation is analyzed to verify the accuracy and advantage of the proposed model. 展开更多
关键词 accelerated degradation test residual lifetime (RL) prediction measurement error random effect NONLINEARITY
下载PDF
上一页 1 下一页 到第
使用帮助 返回顶部