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Reliability and sensitivity analyses of HPT blade-tip radial running clearance using multiply response surface model 被引量:5
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作者 翟学 费成巍 +1 位作者 翟庆刚 王建军 《Journal of Central South University》 SCIE EI CAS 2014年第11期4368-4377,共10页
To reasonably design the blade-tip radial running clearance(BTRRC) of high pressure turbine and improve the performance and reliability of gas turbine, the multi-object multi-discipline reliability sensitivity analysi... To reasonably design the blade-tip radial running clearance(BTRRC) of high pressure turbine and improve the performance and reliability of gas turbine, the multi-object multi-discipline reliability sensitivity analysis of BTRRC was accomplished from a probabilistic prospective by considering nonlinear material attributes and dynamic loads. Firstly, multiply response surface model(MRSM) was proposed and the mathematical model of this method was established based on quadratic function. Secondly, the BTRRC was decomposed into three sub-components(turbine disk, blade and casing), and then the single response surface functions(SRSFs) of three structures were built in line with the basic idea of MRSM. Thirdly, the response surface function(MRSM) of BTRRC was reshaped by coordinating SRSFs. From the analysis, it is acquired to probabilistic distribution characteristics of input-output variables, failure probabilities of blade-tip clearance under different static blade-tip clearances δ and major factors impacting BTRRC. Considering the reliability and efficiency of gas turbine, δ=1.87 mm is an optimally acceptable option for rational BTRRC. Through the comparison of three analysis methods(Monte Carlo method, traditional response surface method and MRSM), the results show that MRSM has higher accuracy and higher efficiency in reliability sensitivity analysis of BTRRC. These strengths are likely to become more prominent with the increasing times of simulations. The present study offers an effective and promising approach for reliability sensitivity analysis and optimal design of complex dynamic assembly relationship. 展开更多
关键词 high pressure turbine blade-tip radial running clearance reliability sensitivity analysis multiply response surface method
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Application of response surface method for contact fatigue reliability analysis of spur gear with consideration of EHL 被引量:2
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作者 胡贇 刘少军 +1 位作者 丁晟 廖雅诗 《Journal of Central South University》 SCIE EI CAS CSCD 2015年第7期2549-2556,共8页
In order to consider the effects of elastohydrodynamic lubrication(EHL) on contact fatigue reliability of spur gear, an accurate and efficient method that combines with response surface method(RSM) and first order sec... In order to consider the effects of elastohydrodynamic lubrication(EHL) on contact fatigue reliability of spur gear, an accurate and efficient method that combines with response surface method(RSM) and first order second moment method(FOSM) was developed for estimating the contact fatigue reliability of spur gear under EHL. The mechanical model of contact stress analysis of spur gear under EHL was established, in which the oil film pressure was mapped into hertz contact zone. Considering the randomness of EHL, material properties and fatigue strength correction factors, the proposed method was used to analyze the contact fatigue reliability of spur gear under EHL. Compared with the results of 1.5×105 by traditional Monte-Carlo, the difference between the two failure probability results calculated by the above mentioned methods is 2.2×10-4, the relative error of the failure probability results is 26.8%, and time-consuming only accounts for 0.14% of the traditional Monte-Carlo method(MCM). Sensitivity analysis results are in very good agreement with practical cognition. Analysis results show that the proposed method is precise and efficient, and could correctly reflect the influence of EHL on contact fatigue reliability of spur gear. 展开更多
关键词 response surface contact fatigue reliability spur gear elastohydrodynamic lubrication
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Reliability analysis of shallow tunnels using the response surface methodology 被引量:1
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作者 Adam Hamrouni Daniel Dias Badreddine Sbartai 《Underground Space》 SCIE EI 2017年第4期246-258,共13页
A probabilistic study of a circular tunnel excavated in a soil mass using the response surface methodology(RSM)is presented.A deterministic model based on two-dimensional numerical simulations in a transversal section... A probabilistic study of a circular tunnel excavated in a soil mass using the response surface methodology(RSM)is presented.A deterministic model based on two-dimensional numerical simulations in a transversal section is used,and the serviceability limit state(SLS)is considered in the analysis.The model permits the surface settlement curve and the bending moment on the tunnel lining to be obtained.Only the soil parameters are considered as random variables.Thefirst-order reliability method(FORM)and the response surface methodology(RSM)are utilized for the assessment of the Hasofer-Lind reliability index(bHL)optimized by the use of a genetic algorithm(GA).Two assumptions(normal and non-normal distribution)were used for the random variables.The comparison analysis considering a correlation between the friction angle and the cohesion indicates that the results are conservative if a negative correlation among strength parameters is not taken into account.The assumption of a non-normal distribution for the random variables has an important effect on the reliability index for the practical range of values of surface settlements. 展开更多
关键词 TUNNEL Convergence-confinement method FORM response surface reliability Limit states Approximate performance function Genetic algorithm
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Total dose responses and reliability issues of 65 nm NMOSFETs
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作者 余德昭 郑齐文 +3 位作者 崔江维 周航 余学峰 郭旗 《Journal of Semiconductors》 EI CAS CSCD 2016年第6期129-135,共7页
In this paper,total dose responses and reliability issues of MOSFETs fabricated by 65 nm CMOS technology were examined. "Radiation-induced narrow channel effect" is observed in a narrow channel device.Similar to tot... In this paper,total dose responses and reliability issues of MOSFETs fabricated by 65 nm CMOS technology were examined. "Radiation-induced narrow channel effect" is observed in a narrow channel device.Similar to total dose responses of NMOSFETs,narrow channel NMOSFEs have larger hot-carrier-induced degradation than wide channel devices.Step Time-Dependent Dielectric Breakdown(TDDB) stresses are applied,and narrow channel devices have higher breakdown voltage than wide channel devices,which agree with "weakest link" theory of TDDB.Experimental results show that linear current,transconductance,saturated drain current and subthreshold swing are superposed degenerated by total dose irradiation and reliability issues,which may result in different lifetime from that considering total dose irradiation reliability issues separately. 展开更多
关键词 total dose responses reliability lifetime
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