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Influence of temperature on tunneling-enhanced recombination in Si based p–i–n photodiodes 被引量:1
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作者 P.Dalapati N.B.Manik A.N.Basu 《Journal of Semiconductors》 EI CAS CSCD 2014年第8期10-14,共5页
We investigate the dominant dark current transport mechanism in Si based p-i-n photodiodes, namely, BPW 21R, SFH 205FA and BPX 61 photodiodes in the temperature range of 350 to 139 K. The forward current- voltage char... We investigate the dominant dark current transport mechanism in Si based p-i-n photodiodes, namely, BPW 21R, SFH 205FA and BPX 61 photodiodes in the temperature range of 350 to 139 K. The forward current- voltage characteristics of these photodiodes are explained via the tunneling enhanced recombination model, which gives a quantitative description of the electronic mechanism in the p-i-n junction photodiodes. The observed tem- perature dependence of the saturation current and the diode ideality factor of these devices agree well with theo- retical predictions; the analysis also indicates the importance of doping for enhancement of tunneling. The present study will be helpful in applying the devices at low temperature ambience. 展开更多
关键词 PHOTODIODE low temperature ideality factor reverse saturation current tunneling energy
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