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Fabrication of ridge waveguide of 808 nm GaAs-based laser diodes by wet chemical etching 被引量:2
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作者 李翔 赵德刚 +8 位作者 江德生 陈平 刘宗顺 朱建军 侍铭 赵丹梅 刘炜 张书明 杨辉 《Journal of Semiconductors》 EI CAS CSCD 2015年第7期98-102,共5页
The fabrication of ridge waveguide of 808 nm GaAs-based laser diodes by wet chemical etching is investigated. The etching behavior of GaAs, InGaP and A1GalnP in various solutions is evaluated. As a result, the etching... The fabrication of ridge waveguide of 808 nm GaAs-based laser diodes by wet chemical etching is investigated. The etching behavior of GaAs, InGaP and A1GalnP in various solutions is evaluated. As a result, the etching solutions simultaneously corroding InGaP and A1GalnP layers are searched successfully. Effects of etching time and the concentration of mixtures on etching depth and the geometrical shape of ridge are analyzed. It is found that under proper conditions, appropriate etching depth and smooth surfaces can be obtained and the steep degree of pattern can be accepted, especially for wide ridge waveguide laser diodes. 展开更多
关键词 GaAs-based laser ridge depth wet etching
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