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Sample indexed spatial orthogonal frequency division multiplexing 被引量:1
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作者 Pankil Butala Hany Elgala Thomas D.C.Little 《Chinese Optics Letters》 SCIE EI CAS CSCD 2014年第9期10-14,共5页
Optical spatial modulation (OSM) is a multiple-transmitter technique that can provide higher data rates with low system complexity as compared with single-input single-output systems. Orthogonal frequency division m... Optical spatial modulation (OSM) is a multiple-transmitter technique that can provide higher data rates with low system complexity as compared with single-input single-output systems. Orthogonal frequency division multiplexing (OFDM) is widely implemented to achieve better spectral efficiency in wireless channels. Asymmetrically clipped optical OFDM (O-OFDM) and DC-biased O-OFDM are two well-known O-OFDM techniques suitable for intensity-modulation direct-detection optical systems. In this work, sample indexed spatial OFDM (SIS-OFDM) is proposed to combine OSM and O-OFDM in a novel way and achieve significant per- formance gain. By assigning time-domain samples of the O-OFDM transmit symbol to different transmitters, SIS-OFDM achieves much better spectral efficiency and reduces computational complexity at the transmitter as compared with previous work that combines OSM with O-OFDM in the frequency domain. We also consider the impact of optical source biasing on overall performance, and the relative performance of imaging receiver (ImR) versus non-imaging receiver (NImR) design for our proposed SIS-OFDM technique. Results indicate that for an Ntx x Nrx multiple-input multiple-output configuration where Nix = N = 4, SIS-OFDM using ImR can achieve up to 135 dB of signal-to-noise ratio gain over comparable system using a NImR. Also, using Nc number of O-OFDM subcarriers provides up to Nsc × log2(Ntx) additional bits per symbol of spectral efficiency over technioues that combine OSM and O-OFDM in the freollencv domain. 展开更多
关键词 OFDM SIS DCO sample indexed spatial orthogonal frequency division multiplexing
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Refractive index measurement of dielectric samples using highly focused radially polarized light(Invited Paper)
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作者 Guadalupe López-Morales Victor-Manuel Rico-Botero +1 位作者 Rafael Espinosa-Luna Qiwen Zhan 《Chinese Optics Letters》 SCIE EI CAS CSCD 2017年第3期12-15,共4页
In this Letter, a refractive index measurement of a dielectric sample using highly focused radially polarized light is reported. Through imaging analysis of the optical field at the pupil plane of a high numerical ape... In this Letter, a refractive index measurement of a dielectric sample using highly focused radially polarized light is reported. Through imaging analysis of the optical field at the pupil plane of a high numerical aperture (NA) objective lens reflected by the sample under study, the Brewster angle is found. Employing a high NA objective lens allows the measurement of multiple angles of incidence from 0° to 64° in a single shot. The refractive index of the sample is estimated using the measured Brewster angle. The experimental results are compared with the theoretical images computed with the Fresnel theory, and a good agreement is obtained. 展开更多
关键词 high Refractive index measurement of dielectric samples using highly focused radially polarized light
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