A new algorithm of measurement slub yarn parameter was put forward to improve precision and efficient. The basic principal of measurement slub yarn by parallel-plate capacitor was introduced,and slub yarns were tested...A new algorithm of measurement slub yarn parameter was put forward to improve precision and efficient. The basic principal of measurement slub yarn by parallel-plate capacitor was introduced,and slub yarns were tested with a measurement system developed by ourselves. Time sequence for slub length and slub space can be got. And distributions of slub length,slub space and slub scaling factor can also be obtained. The agreement can be attained compared with those original settings. Some error was analyzed also. Consequently this system is effective,and can be adopted in practice.展开更多
To realize scale quantum processors,the surface-electrode ion trap is an effective scaling approach,including singlelayer,double-layer,and quasi-double-layer traps.To calculate critical trap parameters such as the tra...To realize scale quantum processors,the surface-electrode ion trap is an effective scaling approach,including singlelayer,double-layer,and quasi-double-layer traps.To calculate critical trap parameters such as the trap center and trap depth,the finite element method（FEM） simulation was widely used,however,it is always time consuming.Moreover,the FEM simulation is also incapable of exhibiting the direct relationship between the geometry dimension and these parameters.To eliminate the problems above,House and Madsen et al.have respectively provided analytic models for single-layer traps and double-layer traps.In this paper,we propose a semi-analytical model for quasi-double-layer traps.This model can be applied to calculate the important parameters above of the ion trap in the trap design process.With this model,we can quickly and precisely find the optimum geometry design for trap electrodes in various cases.展开更多
基金Pre-research Foundation of Jiangnan University,China(No.206000-52210761)
文摘A new algorithm of measurement slub yarn parameter was put forward to improve precision and efficient. The basic principal of measurement slub yarn by parallel-plate capacitor was introduced,and slub yarns were tested with a measurement system developed by ourselves. Time sequence for slub length and slub space can be got. And distributions of slub length,slub space and slub scaling factor can also be obtained. The agreement can be attained compared with those original settings. Some error was analyzed also. Consequently this system is effective,and can be adopted in practice.
文摘To realize scale quantum processors,the surface-electrode ion trap is an effective scaling approach,including singlelayer,double-layer,and quasi-double-layer traps.To calculate critical trap parameters such as the trap center and trap depth,the finite element method（FEM） simulation was widely used,however,it is always time consuming.Moreover,the FEM simulation is also incapable of exhibiting the direct relationship between the geometry dimension and these parameters.To eliminate the problems above,House and Madsen et al.have respectively provided analytic models for single-layer traps and double-layer traps.In this paper,we propose a semi-analytical model for quasi-double-layer traps.This model can be applied to calculate the important parameters above of the ion trap in the trap design process.With this model,we can quickly and precisely find the optimum geometry design for trap electrodes in various cases.
