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A novel phase-sensitive scanning near-field optical microscope 被引量:2
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作者 武晓宇 孙琳 +1 位作者 谭峭峰 王佳 《Chinese Physics B》 SCIE EI CAS CSCD 2015年第5期346-351,共6页
Phase is one of the most important parameters of electromagnetic waves. It is the phase distribution that determines the propagation, reflection, refraction, focusing, divergence, and coupling features of light, and f... Phase is one of the most important parameters of electromagnetic waves. It is the phase distribution that determines the propagation, reflection, refraction, focusing, divergence, and coupling features of light, and further affects the intensity distribution. In recent years, the designs of surface plasmon polariton (SPP) devices have mostly been based on the phase modulation and manipulation. Here we demonstrate a phase sensitive multi-parameter heterodyne scanning near-field opti- cal microscope (SNOM) with an aperture probe in the visible range, with which the near field optical phase and amplitude distributions can be simultaneously obtained. A novel architecture combining a spatial optical path and a fiber optical path is employed for stability and flexibility. Two kinds of typical nano-photonic devices are tested with the system. With the phase-sensitive SNOM, the phase and amplitude distributions of any nano-optical field and localized field generated with any SPP nano-structures and irregular phase modulation surfaces can be investigated. The phase distribution and the interference pattern will help us to gain a better understanding of how light interacts with SPP structures and how SPP waves generate, localize, convert, and propagate on an SPP surface. This will be a significant guidance on SPP nano-structure design and optimization. 展开更多
关键词 phase detection scanning near-field optical microscope (snom heterodyne interferometry surface plasmon polariton (SPP) devices
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Influence of the probe-sample interaction on scanning near-field optical microscopic images in the far field
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作者 李智 张家森 +1 位作者 杨景 龚旗煌 《Chinese Physics B》 SCIE EI CAS CSCD 2006年第11期2558-2563,共6页
We have studied the influence of probe-sample interaction in a scanning near-field optical microscopy (SNOM) in the far field by using samples with a step structure. For a sample with a step height of - λ/4, the SN... We have studied the influence of probe-sample interaction in a scanning near-field optical microscopy (SNOM) in the far field by using samples with a step structure. For a sample with a step height of - λ/4, the SNOM image contrast between the two sides of the step changes periodically at different scan heights. For a step height of-λ/2, the image contrast remains approximately the same. The probe-sample interaction determines the SNOM image contrast here. The influence of different refractive indices of the sample has been also analysed by using a simple theoretical model. 展开更多
关键词 snom probe-sample interaction near-field scanning optical microscopy
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Scanning Head for the Apertureless near Field Optical Microscope
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作者 D. V. Kazantsev H. Ryssel 《Modern Instrumentation》 2013年第2期33-40,共8页
The design and characterization of a tip control unit for an apertureless scanning near field optical microscope (ASNOM) is reported. To make the instrument operation easier, the cantilever control parts (piezo excita... The design and characterization of a tip control unit for an apertureless scanning near field optical microscope (ASNOM) is reported. To make the instrument operation easier, the cantilever control parts (piezo excitation of the cantilever vibration for the dynamic mode feedback and the parts necessary for the optical lever scheme of the vibration control) were placed in a separate detachable assembly. To suppress the influence of vibrations of the setup, the assembly was made lightweight. Good optical access to the ASNOM tip from various directions is provided in the system. High long-term mechanical stability of the system (~50 nm lateral drift in 18 hours) as well as low sensitivity to seismic vibrations (~400 pm RMS) is demonstrated. It is shown that external sound is not a main source of noise in the topography image (~200 pm RMS). The light field distribution (with its amplitude and phase) around the ASNOM tip was acquired by scanning the focal spot around the tip, and a high optical quality of the system is demonstrated. 展开更多
关键词 near-field opticS Apertureless snom scanning HEAD
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Development and prospect of near-field optical measurements and characterizations 被引量:2
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作者 Jia WANG Qingyan WANG Mingqian ZHANG 《Frontiers of Optoelectronics》 2012年第2期171-181,共11页
Scanning near-field optical microscopy (SNOM) is an ideal experimental measuring system in nano-optical measurements and characterizations. Besides microscopy with resolution beyond the diffraction limit, spectrosco... Scanning near-field optical microscopy (SNOM) is an ideal experimental measuring system in nano-optical measurements and characterizations. Besides microscopy with resolution beyond the diffraction limit, spectroscope with nanometer resolution and other instruments with novel performances have been indispensable for researches in nano-optics and nanophotonics. This paper reviews the developing history of near-field optical (NFO) measuring method and foresees its prospects in future. The development of NFO measurements has gone through four stages, including optical imaging with super resolution, near-field spectroscopy, measurements ofnanooptical parameters, and detections of near-field interac- tions. For every stage, research objectives, technological properties and application fields are discussed. 展开更多
关键词 scanning near-field optical microscopy(snom near-field optical (NFO) measurement super-resolution imaging near-field spectroscopy nano-optics nanophotonics
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原子力与光子扫描隧道组合显微镜 被引量:5
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作者 吴世法 章健 +7 位作者 潘石 简国树 李银丽 孙伟 王晓秋 黄玉起 宋林峰 张毅 《光学学报》 EI CAS CSCD 北大核心 2005年第8期1099-1104,共6页
介绍了超高分辨光子扫描隧道显微镜(PSTM)的研究历程,为解决第一代(单光束照明)光子扫描隧道显微镜中存在人为假象和样品光学图像与形貌图像难于分离两个难题,用π对称双光束照明方法消假象,用原子力与光子扫描隧道组合显微镜(AF/PSTM)... 介绍了超高分辨光子扫描隧道显微镜(PSTM)的研究历程,为解决第一代(单光束照明)光子扫描隧道显微镜中存在人为假象和样品光学图像与形貌图像难于分离两个难题,用π对称双光束照明方法消假象,用原子力与光子扫描隧道组合显微镜(AF/PSTM)图像分解方法分离样品光学透过率、折射率与形貌图像。研制成功新一代原子力与光子扫描隧道组合显微镜(AF/PSTM)样机。该样机在一次扫描中已获得两幅原子力显微镜图像(形貌与相位)和两幅光学图像(透过率和折射率),有效地减少了假象,分解了样品光学折射率、透过率与形貌图像。 展开更多
关键词 显微 超分辨 光子扫描隧道显微镜 原子力显微镜 扫描近场光学显微镜
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Ultrahigh spatiotemporal resolved spectroscopy 被引量:2
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作者 LI Zhi ZHANG JiaSen +1 位作者 YANG Jing GONG QiHuang 《Science China(Physics,Mechanics & Astronomy)》 SCIE EI CAS 2007年第6期681-690,共10页
We review the technique and research of the ultrahigh spatiotemporal resolved spectroscopy and its applications in the field of the ultrafast dynamics of mesoscopic systems and nanomaterials. Combining femtosecond tim... We review the technique and research of the ultrahigh spatiotemporal resolved spectroscopy and its applications in the field of the ultrafast dynamics of mesoscopic systems and nanomaterials. Combining femtosecond time-resolved spectroscopy and scanning near-field optical microscopy (SNOM),we can obtain the spectra with ultrahigh temporal and spatial resolutions simultaneously. Some problems in doing so are discussed. Then we show the important applications of the ultrahigh spatiotemporal resolved spectroscopy with a few typical examples. 展开更多
关键词 ultrahigh spatiotemporal resolved spectroscopy femtosecond near-field spectroscopy scanning near-field optical microscopy (snom) femtosecond time-resolved NANOMATERIAL
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