Fault Coverage-Based Test Case Prioritization and Selection Using African Buffalo Optimization

Software needs modifications and requires revisions regularly.Owing to these revisions,retesting software becomes essential to ensure that the enhancements made,have not affected its bug-free functioning.The time and cost incurred in this process,need to be reduced by the method of test case selection and prioritization.It is observed that many nature-inspired techniques are applied in this area.African Buffalo Optimization is one such approach,applied to regression test selection and prioritization.In this paper,the proposed work explains and proves the applicability of the African Buffalo Optimization approach to test case selection and prioritization.The proposed algorithm converges in polynomial time(O(n^(2))).In this paper,the empirical evaluation of applying African Buffalo Optimization for test case prioritization is done on sample data set with multiple iterations.An astounding 62.5%drop in size and a 48.57%drop in the runtime of the original test suite were recorded.The obtained results are compared with Ant Colony Optimization.The comparative analysis indicates that African Buffalo Optimization and Ant Colony Optimization exhibit similar fault detection capabilities(80%),and a reduction in the overall execution time and size of the resultant test suite.The results and analysis,hence,advocate and encourages the use of African Buffalo Optimization in the area of test case selection and prioritization.

Test selection and optimization for PHM based on failure evolution mechanism model

The test selection and optimization （TSO） can improve the abilities of fault diagnosis, prognosis and health-state evalua- tion for prognostics and health management （PHM） systems. Traditionally, TSO mainly focuses on fault detection and isolation, but they cannot provide an effective guide for the design for testability （DFT） to improve the PHM performance level. To solve the problem, a model of TSO for PHM systems is proposed. Firstly, through integrating the characteristics of fault severity and propa- gation time, and analyzing the test timing and sensitivity, a testability model based on failure evolution mechanism model （FEMM） for PHM systems is built up. This model describes the fault evolution- test dependency using the fault-symptom parameter matrix and symptom parameter-test matrix. Secondly, a novel method of in- herent testability analysis for PHM systems is developed based on the above information. Having completed the analysis, a TSO model, whose objective is to maximize fault trackability and mini- mize the test cost, is proposed through inherent testability analysis results, and an adaptive simulated annealing genetic algorithm （ASAGA） is introduced to solve the TSO problem. Finally, a case of a centrifugal pump system is used to verify the feasibility and effectiveness of the proposed models and methods. The results show that the proposed technology is important for PHM systems to select and optimize the test set in order to improve their performance level.

Application of Rollout Strategy to Test Points Selection for Integer-Coded Fault Wise Table

Test points selection for integer-coded fault wise table is a discrete optimization problem. The global minimum set of test points can only be guaranteed by an exhaustive search which is eompurationally expensive. In this paper, this problem is formulated as a heuristic depth-first graph search problem at first. The graph node expanding method and rules are given. Then, rollout strategies are applied, which can be combined with the heuristic graph search algorithms, in a computationally more efficient manner than the optimal strategies, to obtain solutions superior to those using the greedy heuristic algorithms. The proposed rollout-based test points selection algorithm is illustrated and tested using an analog circuit and a set of simulated integer-coded fault wise tables. Computa- tional results are shown, which suggest that the rollout strategy policies are significantly better than other strategies.

Selection of Minimal Test Points Set for Integer-Coded Fault Wise Table

Test points selection for integer-coded fault wise table is a discrete optimization problem. On one hand, traditional exhaustive search method is computationally expensive. On the other hand, the space complexity of traditional exhaustive is low. A tradeoff method between the high time complexity and low space complexity is proposed. At first, a new fault-pair table is constructed based on the integer-coded fault wise table. The fault-pair table consists of two columns： one column represents fault pair and the other represents test points set that can distinguish the corresponding faults. Then, the rows are arranged in ascending order according to the cardinality of corresponding test points set. Thirdly, test points in the top rows are selected one by one until all fault pair are isolated. During the test points selection process, the rows that contain selected test points are deleted and then the dimension of fault-pair table decreases gradually. The proposed test points selection algorithm is illustrated and tested using an integercoded fault wise table derived from a real analog circuit. Computational results suggest show policies are better than the exhaustive strategy.

System level test selection based on combinatorial dependency matrix

Test selection is to select the test set with the least total cost or the least total number from the alternative test set on the premise of meeting the required testability indicators.The existing models and methods are not suitable for system level test selection.The first problem is the lack of detailed data of the units’fault set and the test set,which makes it impossible to establish a traditional dependency matrix for the system level.The second problem is that the system level fault detection rate and the fault isolation rate(referred to as"two rates")are not enough to describe the fault diagnostic ability of the system level tests.An innovative dependency matrix(called combinatorial dependency matrix)composed of three submatrices is presented.The first problem is solved by simplifying the submatrix between the units’fault and the test,and the second problem is solved by establishing the system level fault detection rate,the fault isolation rate and the integrated fault detection rate(referred to as"three rates")based on the new matrix.The mathematical model of the system level test selection problem is constructed,and the binary genetic algorithm is applied to solve the problem,which achieves the goal of system level test selection.

Improved Test Case Selection Algorithm to Reduce Time in Regression Testing

Regression testing(RT)is an essential but an expensive activity in software development.RT confirms that new faults/errors will not have occurred in the modified program.RT efficiency can be improved through an effective technique of selected only modified test cases that appropriate to the modifications within the given time frame.Earlier,several test case selection approaches have been introduced,but either these techniques were not sufficient according to the requirements of software tester experts or they are ineffective and cannot be used for available test suite specifications and architecture.To address these limitations,we recommend an improved and efficient test case selection(TCS)algorithm for RT.Our proposed technique decreases the execution time and redundancy of the duplicate test cases(TC)and detects onlymodified changes that appropriate to themodifications in test cases.To reduce execution time for TCS,evaluation results of our proposed approach are established on fault detection,redundancy and already executed test case.Results indicate that proposed technique decreases the inclusive testing time of TCS to execute modified test cases by,on average related to a method of Hybrid Whale Algorithm(HWOA),which is a progressive TCS approach in regression testing for a single product.

Optimal Test Points Selection Based on Multi-Objective Genetic Algorithm

A new approach to select anoptimal set of test points is proposed. The described method uses fault-wise table and multi-objective genetic algorithm to find the optimal set of test points. First, the fault-wise table is constructed whose entries are measurements associated with faults and test points. The selection of optimal test points is transformed to the selection of the columns that isolate the rows of the table. Then, four objectives are described according to practical test requirements. The multi-objective genetic algorithm is explained. Finally, the presented approach is illustrated by a practical example. The results indicate that the proposed method can efficiently and accurately find the optimal set of test points and is practical for large scale systems.

IPSETFUL： an iterative process of selecting test cases for effective fault localization by exploring concept lattice of program spectra

Fault localization is an important and challeng- ing task during software testing. Among techniques studied in this field, program spectrum based fault localization is a promising approach. To perform spectrum based fault local- ization, a set of test oracles should be provided, and the ef- fectiveness of fault localization depends highly on the quality of test oracles. Moreover, their effectiveness is usually af- fected when multiple simultaneous faults are present. Faced with multiple faults it is difficult for developers to determine when to stop the fault localization process. To address these issues, we propose an iterative fauk localization process, i.e., an iterative process of selecting test cases for effective fault localization （IPSETFUL）, to identify as many faults as pos- sible in the program until the stopping criterion is satisfied. It is performed based on a concept lattice of program spec- trum （CLPS） proposed in our previous work. Based on the labeling approach of CLPS, program statements are catego- rized as dangerous statements, safe statements, and sensitive statements. To identify the faults, developers need to check the dangerous statements. Meantime, developers need to se- lect a set of test cases covering the dangerous or sensitive statements from the original test suite, and a new CLPS is generated for the next iteration. The same process is pro- ceeded in the same way. This iterative process ends until there are no failing tests in the test suite and all statements on the CLPS become safe statements. We conduct an empirical study on several subject programs, and the results show that IPSETFUL can help identify most of the faults in the program with the given test suite. Moreover, it can save much effort in inspecting unfaulty program statements compared with the existing spectrum based fault localization techniques and the relevant state of the art technique.