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Effect of CHF3/Ar Gas Flow Ratio on Self-masking Subwavelength Structures Prepared on Fused Silica Surface
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作者 伍景军 叶鑫 +7 位作者 HUANG Jin SUN Laixi ZENG Yong WEN Jibin GENG Feng YI Zao 蒋晓东 张魁宝 《Journal of Wuhan University of Technology(Materials Science)》 SCIE EI CAS 2018年第2期349-355,共7页
Based on an advanced technology, randomly-aligned subwavelength structures(SWSs) were obtained by a metal-nanodot-induced one-step self-masking reactive-ion-etching process on a fused silica surface. Metal-fluoride... Based on an advanced technology, randomly-aligned subwavelength structures(SWSs) were obtained by a metal-nanodot-induced one-step self-masking reactive-ion-etching process on a fused silica surface. Metal-fluoride(mainly ferrous-fluoride) nanodots induce and gather stable fluorocarbon polymer etching inhibitors in the reactive-ion-etching polymers as masks. Metal fluoride(mainly ferrous fluoride) is produced by the sputtering of argon plasma and the ion-enhanced chemical reaction of metal atoms. With an increase in CHF_3/Ar gas flow ratio, the average height of the SWSs increases, the number of SWSs per specific area increases and then decreases, and the optical transmittance of visible light increases and then decreases. The optimum CHF_3/Ar gas flow ratio for preparing SWSs is 1:5. 展开更多
关键词 metal-induced self-masking one-step reactive ion etching subwavelength structure
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