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A Diamond Electrochemical Cleaning Technique for Organic Contaminants on Silicon Wafer Surfaces 被引量:2
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作者 张建新 刘玉岭 +4 位作者 檀柏梅 牛新环 边永超 高宝红 黄妍妍 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2008年第3期473-477,共5页
Peroxodiphosphate anion (a powerful oxidant) can be formed in a special water-based cleaning agent through an electrochemical reaction on boron-doped diamond electrodes. This electrochemical reaction was applied dur... Peroxodiphosphate anion (a powerful oxidant) can be formed in a special water-based cleaning agent through an electrochemical reaction on boron-doped diamond electrodes. This electrochemical reaction was applied during the oxidation,decomposition, and removal of organic contaminations on a silicon wafer surface, and it was used as the first step in the diamond electrochemical cleaning technique (DECT). The cleaning effects of DECT were compared with the RCA cleaning technique, including the silicon surface chemical composition that was observed with X-ray photoelectron spectroscopy and the morphology observed with atomic force microscopy. The measurement results show that the silicon surface cleaned by DECT has slightly less organic residue and lower micro-roughness,so the new technique is more effective than the RCA cleaning technique. 展开更多
关键词 organic contaminations silicon wafer surface cleaning boron-doped diamond electrodes powerful oxidant micro-roughness electrochemical cleaning
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