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New DDSCR structure with high holding voltage for robust ESD applications 被引量:1
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作者 Zi-Jie Zhou Xiang-Liang Jin +1 位作者 Yang Wang Peng Dong 《Chinese Physics B》 SCIE EI CAS CSCD 2021年第3期529-539,共11页
A novel dual direction silicon-controlled rectifier(DDSCR)with an additional P-type doping and gate(APGDDSCR)is proposed and demonstrated.Compared with the conventional low-voltage trigger DDSCR(LVTDDSCR)that has posi... A novel dual direction silicon-controlled rectifier(DDSCR)with an additional P-type doping and gate(APGDDSCR)is proposed and demonstrated.Compared with the conventional low-voltage trigger DDSCR(LVTDDSCR)that has positive and negative holding voltages of 13.371 V and 14.038 V,respectively,the new DDSCR has high positive and negative holding voltages of 18.781 V and 18.912 V in a single finger device,respectively,and it exhibits suitable enough positive and negative holding voltages of 14.60 V and 14.319 V in a four-finger device for±12-V application.The failure current of APGDDSCR is almost the same as that of LVT-DDSCR in the single finger device,and the four-finger APGDDSCR can achieve positive and negative human-body model(HBM)protection capabilities of 22.281 kV and 23.45 kV,respectively,under 40-V voltage of core circuit failure,benefitting from the additional structure.The new structure can generate a snapback voltage on gate A to increase the current gain of the parasitic PNP in holding voltage.Thus,a sufficiently high holding voltage increased by the structure can ensure that a multi-finger device can also reach a sufficient holding voltage,it is equivalent to solving the non-uniform triggering problem of multi-finger device.The operating mechanism and the gate voltage are both discussed and verified in two-dimensional(2D)simulation and experiemnt. 展开更多
关键词 dual direction silicon-controlled rectifier(DDSCR) failure current snapback gate voltage simulation transmission line pulsing(TLP)
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Theoretical calculation of the p-emitter length for snapback-free reverse-conducting IGBT 被引量:2
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作者 朱利恒 陈星弼 《Journal of Semiconductors》 EI CAS CSCD 2014年第6期62-66,共5页
A physically based equation for predicting required p-emitter length of a snapback-free reverse- conducting insulated gate bipolar transistor (RC-IGBT) with field-stop structure is proposed. The n-buffer resis- tanc... A physically based equation for predicting required p-emitter length of a snapback-free reverse- conducting insulated gate bipolar transistor (RC-IGBT) with field-stop structure is proposed. The n-buffer resis- tances above the p-emitter region with anode geometries of linear strip, circular and annular type are calculated, and based on this, the minimum p-emitter lengths of those three geometries are given and verified by simulation. It is found that good agreement was achieved between the numerical calculation and simulation results. Moreover, the calculation results show that the annular case needs the shortest p-emitter length for RC-IGBT to be snapback-free. 展开更多
关键词 reverse conducting insulated gate bipolar transistor voltage snapback
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