Electroless nickel/immersion gold (ENIG) technology is widely used as one of the surface final finish for electronics packaging substrate and printed circuit board (PCB), providing a protective, conductive and soldera...Electroless nickel/immersion gold (ENIG) technology is widely used as one of the surface final finish for electronics packaging substrate and printed circuit board (PCB), providing a protective, conductive and solderable surface. However, there is a solder joint interfacial brittle fracture (or solderability failure) of using the ENIG coating. The characteristics and the application of ENIG technology were narrated in this paper. The research progress on the solderability failure of ENIG was introduced. The mechanism of 'black pad' and the possible measure of eliminating or alleviating the 'black pad' were also introduced. The development direction and market prospects of ENIG were prospected.展开更多
ZnO whiskers observation on the surface of SnZn/Cu solder joints in concentrator silicon solar cells solder layer is reported. In the experiment,SnZn/Cu samples are left in laboratory after reflow soldering for two ye...ZnO whiskers observation on the surface of SnZn/Cu solder joints in concentrator silicon solar cells solder layer is reported. In the experiment,SnZn/Cu samples are left in laboratory after reflow soldering for two years before an examination by SEM,then ZnO whiskers can be observed obviously,which grows out from the rich-Zn phase of the samples and causes electrical short circuit in the electronics appliances,which demonstrates that the SnZn solder shows a risk for the short circuiting failure of an electronic device. Moreover,the growth mechanism of ZnO whiskers is researched based on cracked oxide theory,which provides the reference support for SnZn solders application.展开更多
基金Project supported by the Specialized Research Fund for the Doctoral Programof Higher Education (20030213007)the Heilongjiang Province Natural Science Foundation (E0325)
文摘Electroless nickel/immersion gold (ENIG) technology is widely used as one of the surface final finish for electronics packaging substrate and printed circuit board (PCB), providing a protective, conductive and solderable surface. However, there is a solder joint interfacial brittle fracture (or solderability failure) of using the ENIG coating. The characteristics and the application of ENIG technology were narrated in this paper. The research progress on the solderability failure of ENIG was introduced. The mechanism of 'black pad' and the possible measure of eliminating or alleviating the 'black pad' were also introduced. The development direction and market prospects of ENIG were prospected.
基金Supported by the National Natural Science Foundation of China(No.51475220)State Foundation of Laboratory of Advanced Brazing Filler Metals&Technology(Zhengzhou Research Institute of Mechanical Engineering)(No.SKLABFMT-2015-03)High Level Talent Plan of Jiangsu Normal University(No.YQ2015002)
文摘ZnO whiskers observation on the surface of SnZn/Cu solder joints in concentrator silicon solar cells solder layer is reported. In the experiment,SnZn/Cu samples are left in laboratory after reflow soldering for two years before an examination by SEM,then ZnO whiskers can be observed obviously,which grows out from the rich-Zn phase of the samples and causes electrical short circuit in the electronics appliances,which demonstrates that the SnZn solder shows a risk for the short circuiting failure of an electronic device. Moreover,the growth mechanism of ZnO whiskers is researched based on cracked oxide theory,which provides the reference support for SnZn solders application.
