Quantifying Uncertainty in Dielectric Solids’ Mechanical Properties Using Isogeometric Analysis and Conditional Generative Adversarial Networks

Accurate quantification of the uncertainty in the mechanical characteristics of dielectric solids is crucial for advancing their application in high-precision technological domains,necessitating the development of robust com-putational methods.This paper introduces a Conditional Generation Adversarial Network Isogeometric Analysis(CGAN-IGA)to assess the uncertainty of dielectric solids’mechanical characteristics.IGA is utilized for the precise computation of electric potentials in dielectric,piezoelectric,and flexoelectric materials,leveraging its advantage of integrating seamlessly with Computer-Aided Design(CAD)models to maintain exact geometrical fidelity.The CGAN method is highly efficient in generating models for piezoelectric and flexoelectric materials,specifically adapting to targeted design requirements and constraints.Then,the CGAN-IGA is adopted to calculate the electric potential of optimum models with different parameters to accelerate uncertainty quantification processes.The accuracy and feasibility of this method are verified through numerical experiments presented herein.

Simulation of space charge transport in solid dielectric materials using transmission lines modeling method

In this paper,a lumped RC circuit model,which is based on the Transmission Line Modeling(TLM)method,is used to describe the space charge production and displacement mechanisms in three different solid dielectric materials(LDPE,PTFE and FR4).Each dielectric material is considered as a transmission line with the capacitive and resistance elements.The obtained circuit equations are solved along with the continuity equations for the various charged species in the bulk of solid dielectric material.The electric potential and field,density of different charged species and their recombination rates,resistive and capacitive properties of the solid dielectric material are calculated.In addition,the effects of the variations in the applied voltage,dielectric permittivity and temperature on these physical parameters are examined.Besides,compared with LDPE and PTFE,the net charge density increment rate in FR4 is much higher.Moreover,the influences of temperature on the net charge density in LDPE are not significant.Furthermore,at the higher applied voltages,the current density is increased.Interestingly,the effects of temperature variations on the recombination rates,net charge and current density in LDPE are much lower.Hence,the suitability of LDPE as solid dielectric material is proved.

Dielectric relaxation in pure and Co-doped Bi_(12)GeO_(20) single crystals

We report the results of investigation of dielectric spectroscopy study of single crystals of Bi_(12)GeO_(20) and Bi_(12)GeO_(20) doped with Co nanoparticles.The complex dielectric constant was measured in the temperature interval from 5 to 450K and frequencies from 1Hz to 1MHz.The electrical conductivity of both samples was thermally activated with potential barriers of 0.55eV and 0.59eV,respectively.Doped samples had bigger complex dielectric constants and σ′ exhibited slightly steeper temperature dependence than in the pure sample.The dielectric relaxation was observed in pure and doped single crystals and relaxation frequencies showed similar activation energies as electrical conductivities.

Experimental study on the effect of applying a crossed magnetic field on the insulator flashover behavior in high vacuum

In this study,a possible method of reducing the flashover stress is achieved by the effect of an additional magnetic field in the transverse direction on the main applied electric field.The degree of vacuum used in this study was 5×10^(5) Pa.The magnetic flux density B employed in this study extends from 4×10^(3) to 24×10^(3) T.From the results obtained throughout this work,the transverse magnetic field increases the flashover voltage and decreases the leakage current.The effect of the transverse magnetic field on the surface flashover of the dielectric solid in vacuum shows a marked dependence on the material and the thickness of the test specimen,the vacuum degree,the type of electric field(AC or DC)as well as the type of magnetic field(AC or DC).