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Measurement of the surface morphology of plasma facing components on the EAST tokamak by a laser speckle interferometry approach 被引量:1
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作者 王宏北 崔晓倩 +4 位作者 李元博 赵梦鸽 李树华 罗广南 丁洪斌 《Plasma Science and Technology》 SCIE EI CAS CSCD 2018年第3期172-178,共7页
The laser speckle interferometry approach provides the possibility of an in situ optical noncontacted measurement for the surface morphology of plasma facing components(PFCs), and the reconstruction image of the PFC... The laser speckle interferometry approach provides the possibility of an in situ optical noncontacted measurement for the surface morphology of plasma facing components(PFCs), and the reconstruction image of the PFC surface morphology is computed by a numerical model based on a phase unwrapping algorithm. A remote speckle interferometry measurement at a distance of three meters for real divertor tiles retired from EAST was carried out in the laboratory to simulate a real detection condition on EAST. The preliminary surface morphology of the divertor tiles was well reproduced by the reconstructed geometric image. The feasibility and reliability of this approach for the real-time measurement of PFCs have been demonstrated. 展开更多
关键词 plasma facing components laser speckle interferometry morphology measurement
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Measurement of in-plane deformations of microsystems by digital holography and speckle interferometry(Invited Paper) 被引量:1
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作者 G. Pedrini J. Gaspar +1 位作者 O. Paul W. Osten 《Chinese Optics Letters》 SCIE EI CAS CSCD 2009年第12期1109-1112,共4页
The reliability of microsystems is an important issue and for their quality inspection, it is necessary to know the displacements or deformations due to the applied mechanical, thermal, or electrostatic loads. We show... The reliability of microsystems is an important issue and for their quality inspection, it is necessary to know the displacements or deformations due to the applied mechanical, thermal, or electrostatic loads. We show how interferometrical techniques like digital holography and speckle interferometry can be used for the measurement of in plane deformations of microsystems with nanometric accuracy and we give a description of the measurement uncertainties. 展开更多
关键词 Invited Paper Measurement of in-plane deformations of microsystems by digital holography and speckle interferometry
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Review of Electronic Speckle Pattern Interferometry(ESPI) for Three Dimensional Displacement Measurement 被引量:22
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作者 YANG Lianxiang XIE Xin +2 位作者 ZHU Lianqing WU Sijin WANG Yonghong 《Chinese Journal of Mechanical Engineering》 SCIE EI CAS CSCD 2014年第1期1-13,共13页
Three dimensional(3D) displacements, which can be translated further into 3D strain, are key parameters tor design, manufacturing and quality control. Using different optical setups, phase-shift methods, and algorit... Three dimensional(3D) displacements, which can be translated further into 3D strain, are key parameters tor design, manufacturing and quality control. Using different optical setups, phase-shift methods, and algorithms, several different 3D electronic speckle pattern interferometry(ESPl) systems for displacement and strain measurements have been achieved and commercialized. This paper provides a review of the recent developments in ESPI systems for 3D displacement and strain measurement. After an overview of the fundamentals of ESP! theory, temporal phase-shift, and spatial phase-shift techniques, 3D deformation measurements by the temporal phase-shift ESPI system, which is suited well for static measurement, and by the spatial phase-shift ESPI system, which is particularly useful for dynamic measurement, are discussed. For each method, the basic theory, a brief derivation and different optical layouts are presented. The state of art application, potential and limitation of the ESPI systems are shown and demonstrated. 展开更多
关键词 electronic speckle pattern interferometry(ESPI) three dimensional displacement and strain measurement static loading dynamic loading phase-shift technology
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New speckle pattern interferometry for precise in situ deformation measurements
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作者 章如月 Yu Fu 缪泓 《Chinese Optics Letters》 SCIE EI CAS CSCD 2024年第1期34-40,共7页
A new electronic speckle pattern interferometry method is proposed to realize in situ deformation measurements.The feature of the method is the combination of a high-speed camera and multiple laser Doppler vibrometers... A new electronic speckle pattern interferometry method is proposed to realize in situ deformation measurements.The feature of the method is the combination of a high-speed camera and multiple laser Doppler vibrometers(LDVs)for synchronous measurements.The high-speed camera is used to record and select effective interferograms,while the LDVs are used to measure the rigid body displacement caused by vibrations.A series of effective interferograms with known shifted phase values are obtained to calculate the deformation phase.The experimental results show that the method performs well in measuring static and dynamic deformations with high accuracy in vibrating environments. 展开更多
关键词 speckle pattern interferometry laser Doppler vibrometers in situ deformation measurements
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LASER SPECKLE MOVEMENT CAUSED BY SURFACE DEFORMATION AND LIGHT WAVELENGTH CHANGE
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作者 Wu Xiaoping Li Zhichao He Shiping (University of Science and Technology of China,Hefei) 《Acta Mechanica Sinica》 SCIE EI CAS CSCD 1991年第2期186-192,共7页
When a surface is illuminated by laser,the field of diffusing reflective light can be described by Fresnel-Kirchhoff integration in the region of Fresnel.If the correlation,before and after the change of intensity fie... When a surface is illuminated by laser,the field of diffusing reflective light can be described by Fresnel-Kirchhoff integration in the region of Fresnel.If the correlation,before and after the change of intensity field,is analysed by statistical method,three governing equations for variations of intensity field and speckle movement formulas can be obtained.In these equations,the surface motion,deformation and wavelength change are all considered to cause the speckle movement. 展开更多
关键词 laser speckle speckle interferometry speckle metrology
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POLARIZED SPECKLE-PHOTOELASTICITY FOR 3-D STRESS ANALYSIS
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作者 Dai Fulong Fang Jing (Department of Engineering Mechanics,Tsinghua University) 《Acta Mechanica Sinica》 SCIE EI CAS CSCD 1989年第1期70-76,共7页
Combining speckle interferometry with photoelasticity,the absolute retardation fringes in 3-D model are obtained by interference of the polarized rays reflected from the two surfaces of a sandwiched plate inside the m... Combining speckle interferometry with photoelasticity,the absolute retardation fringes in 3-D model are obtained by interference of the polarized rays reflected from the two surfaces of a sandwiched plate inside the model.This method can avoid the troubles introduced by Poisson's ratio μ=0.5 and stress-optical constants ratio A/B=-2 of the photoelastic material in a stress-frozenstate,and yield the re- sults which provide necessary supplementary information for the completely-experimental solution of 3-D stress state.A comparison of experimental results with theoretical ones shoves the feasibility of the method proposed in the present paper. 展开更多
关键词 speckle interferometry absolute retardation fringes in 3-D model
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On the correctness of orbital solutions obtained from a small set of points.Orbit of HIP 53731
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作者 Arina Mitrofanova Vladimir Dyachenko +4 位作者 Anatoly Beskakotov Yury Balega Alexander Maksimov Denis Rastegaev Sergey Komarinsky 《Research in Astronomy and Astrophysics》 SCIE CAS CSCD 2020年第11期321-324,共4页
HIP 53731 is a binary consisting of stars of the spectral types K0 and K9.The orbit of this object was constructed previously by Cvetkovic et al.and improved by Tokovinin.It should be noted that there is a 180°am... HIP 53731 is a binary consisting of stars of the spectral types K0 and K9.The orbit of this object was constructed previously by Cvetkovic et al.and improved by Tokovinin.It should be noted that there is a 180°ambiguity in the position angles of some published measurements.Speckle interferometric observations were obtained in 2007–2020(21 measurements)at the 6-m telescope of the SAO RAS(BTA)by the authors of this article.The analysis of new data together with previously published ones made it possible to construct an accurate orbit of HIP 53731 and to halve the already known values of the orbital period of the system.As a result of the study,the mass sum,the masses of each component and their spectral types were determined by two independent methods.According to the qualitative classification of orbits,the orbital solution has grade 2–"good"(observations cover more than half of the orbital period and correspond to different phases). 展开更多
关键词 techniques high angular resolution speckle interferometry STARS low-mass fundamental parameters STARS BINARIES spectroscopic STARS individual HIP 53731
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Research on the HIP 18856 binary system
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作者 Polina Efremova Arina Mitrofanova +4 位作者 Vladimir Dyachenko Anatoly Beskakotov Alexander Maksimov Denis Rastegaev Yury BalegaSergey Komarinsky 《Research in Astronomy and Astrophysics》 SCIE CAS CSCD 2021年第3期69-72,共4页
The results of a study on the binary HIP 18856 and construction of its orbit are presented.New observational data were obtained at the BTA of SAO RAS in 2007-2019.Earlier,Cvetkovic et al.constructed the orbit for this... The results of a study on the binary HIP 18856 and construction of its orbit are presented.New observational data were obtained at the BTA of SAO RAS in 2007-2019.Earlier,Cvetkovic et al.constructed the orbit for this system.However,it is based on six measurements,which cover a small part of the orbit.The positional parameters of the ESA astrometric satellite Hipparcos published speckle interferometric data(Mason et al.,Balega et al.,Horch et al.)and new ones were used in this study.Based on the new orbital parameters,the mass sum was calculated and the physical parameters of the components were found.The obtained orbital and fundamental parameters were compared with the data from the study by Cvetkovic et al..The comparison shows that the new orbital solution is better than the old one,since it fits new observational data accurately.Also based on a qualitative evaluation performed by Worley&Heintz,the new orbit was classified as"reliable",which means data cover more than half of the orbit with sufficient quantities of residuals of measurements. 展开更多
关键词 techniques:high angular resolution speckle interferometry stars:low-mass fundamental parameters stars:binaries:spectroscopic stars:individual:HIP 18856
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Variability on Raman Shift to Stress Coefficient of Porous Silicon 被引量:3
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作者 雷振坤 亢一澜 +1 位作者 岑皓 胡明 《Chinese Physics Letters》 SCIE CAS CSCD 2006年第6期1623-1626,共4页
Porous silicon film is a capillary-like medium, which is able to reveal different meso-elastic modulus with porosity. During the preparation of porous silicon samples, the capillary force is a non-classic force relate... Porous silicon film is a capillary-like medium, which is able to reveal different meso-elastic modulus with porosity. During the preparation of porous silicon samples, the capillary force is a non-classic force related to the liquid evaporation which directly influences the evolution of residual stress. In this study, a non-linear relation of Raman shift to stress coefficient and the porosity is obtained from the elastic modulus measured with nano-indentation by Bellet et al. [J. Appl. Phys. 60 (1996) 3772] Dynamic capillarity during the drying process of porous silicon is investigated using micro-Raman spectroscopy, and the results reveal that the residual stress resulted from the capillarity increased rapidly. Indeed, the dynamic capillarity has a close relationship with a great deal of micro-pore structures of the porous silicon. 展开更多
关键词 speckle PATTERN interferometry X-RAY-DIFFRACTION RESIDUAL-STRESS DEFORMATION MEASUREMENT SPECTROSCOPY MODULUS
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Experimental Investigation of Polycrystalline Material Deformation Based on a Grain Scale 被引量:3
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作者 李喜德 杨燕 魏成 《Chinese Physics Letters》 SCIE CAS CSCD 2005年第10期2553-2556,共4页
We propose an experimental approach for investigation of the polycrystalline deformation behaviour at a grain scale. The technique is characterized by the joint application of micro material testing systems and the in... We propose an experimental approach for investigation of the polycrystalline deformation behaviour at a grain scale. The technique is characterized by the joint application of micro material testing systems and the intragranular deformation analysis methods, It is attempting to map the deformation evolution at grain scale during the elastic and plastic deformations of polycrystalline specimens. 展开更多
关键词 speckle PATTERN interferometry MICRO-RAMAN SPECTROSCOPY MULTICRYSTAL
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Measurement of out-of-plane deformation of curved objects with digital speckle pattern interferometry 被引量:1
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作者 李鹏飞 蔡萍 +2 位作者 隆军 刘持越 闫浩 《Chinese Optics Letters》 SCIE EI CAS CSCD 2018年第11期40-46,共7页
Digital speckle pattern interferometry (DSPI) is a high-precision deformation t technique for planar objects. However, for curved objects, the three-dimensional (3D) shape information is needed in order to obtain ... Digital speckle pattern interferometry (DSPI) is a high-precision deformation t technique for planar objects. However, for curved objects, the three-dimensional (3D) shape information is needed in order to obtain correct deformation measurement in DSPI. Thus, combined shape and deformation measurement techniques of DSPI have been proposed. However, the current techniques are either complex in setup or complicated in operation. Furthermore, the operations of some techniques are too slow for real-time measurement. In this work, we propose a DSPI technique for both 3D shape and out-of-plane deformation measurement. Compared with current techniques, the proposed technique is simple in both setup and operation and is capable of fast deformation measurement. Theoretical analysis and experiments are performed. For a cylinder surface with an arch height of 9 mm, the error of out-of-plane deformation measurement is less than 0.15 μm. The effectiveness of the proposed scheme is verified. 展开更多
关键词 Measurement of out-of-plane deformation of curved objects with digital speckle pattern interferometry
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Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations 被引量:1
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作者 朱云龙 Julien Vaillant +3 位作者 Guillaume Montay Manuel Fran?ois Yassine Hadjar Aurélien Bruyant 《Chinese Optics Letters》 SCIE EI CAS CSCD 2018年第7期40-44,共5页
Electronic speckle pattern interferometry(ESPI) and digital speckle pattern interferometry are wellestablished non-contact measurement methods. They have been widely used to carry out precise deformation mapping. Ho... Electronic speckle pattern interferometry(ESPI) and digital speckle pattern interferometry are wellestablished non-contact measurement methods. They have been widely used to carry out precise deformation mapping. However, the simultaneous two-dimensional(2D) or three-dimensional(3D) deformation measurements using ESPI with phase shifting usually involve complicated and slow equipment. In this Letter, we solve these issues by proposing a modified ESPI system based on double phase modulations with only one laser and one camera. In-plane normal and shear strains are obtained with good quality. This system can also be developed to measure 3D deformation, and it has the potential to carry out faster measurements with a highspeed camera. 展开更多
关键词 Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations
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Image processing of ESPI based on measurement the welding dynamic displacement fields
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作者 陶军 李冬青 +1 位作者 范成磊 刘忠国 《China Welding》 EI CAS 2004年第2期111-114,共4页
A dual-beam electronic speckle pattern interferometry (ESPI) system was adopted to get speckle patterns for the measurement of welding dynamic displacement fields. The mathematical model of this system was described, ... A dual-beam electronic speckle pattern interferometry (ESPI) system was adopted to get speckle patterns for the measurement of welding dynamic displacement fields. The mathematical model of this system was described, based on which methods of the ESPI pattern image processing were discussed. Gray transformation and histogram equalization were used to enhance the contrast of speckle patterns. A discrete cosine image processing method was carried out and an exponent low-pass filter was chosen to reduce multiplicative noise in speckle patterns. Speckle grain noise can be eliminated effectively after these processes. 展开更多
关键词 WELDING electronic speckle pattern interferometry image processing discrete cosine low-pass exponent filter
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New multiplexed system for synchronous measurement of out-of-plane deformation and two orthogonal slopes
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作者 王永红 张肖 +3 位作者 赵琪涵 姚彦峰 闫佩正 王标 《Chinese Physics B》 SCIE EI CAS CSCD 2022年第3期259-264,共6页
We propose a novel system for synchronous measurement of out-of-plane deformation and two orthogonal slopes using a single camera. The linearly polarized reference beam introduced by an optical fiber interferes with t... We propose a novel system for synchronous measurement of out-of-plane deformation and two orthogonal slopes using a single camera. The linearly polarized reference beam introduced by an optical fiber interferes with the unpolarized object beam to measure the out-of-plane deformation. A modified Mach–Zehnder interferometer is used to measure the two orthogonal slopes of the out-of-plane deformation. One of the object beams of the Mach–Zehnder interferometer is an unpolarized beam, and the other object beam is split into two orthogonal linearly polarized object beams by a polarizing prism. The two beams are orthogonally polarized. Hence, they will not interfere with each other. The two polarized beams respectively interfere with the unpolarized beam to simultaneously measure the two orthogonal slopes of the out-of-plane deformation. In addition, the imaging lens and apertures are respectively placed in three optical paths to independently control the carrier frequencies and shearing amounts. The effectiveness of this method can be proved by measuring two pressure-loaded circular plates. 展开更多
关键词 digital speckle pattern interferometry digital shearography simultaneous measurement of displacement and two orthogonal slopes
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Digital Speckle Technique Applied to Flow Visualization
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作者 宋耀祖 张卫 +1 位作者 吴鹰 姚雪丰 《Tsinghua Science and Technology》 EI CAS 2000年第1期89-95,共7页
Digital speckle technique uses a laser, a CCD camera, and digital processing to generate interference fringes at the television framing rate. Its most obvious advantage is that neither darkroom facilities nor photogra... Digital speckle technique uses a laser, a CCD camera, and digital processing to generate interference fringes at the television framing rate. Its most obvious advantage is that neither darkroom facilities nor photographic wet chemical processing is required. In addition, it can be used in harsh engineering environments. This paper discusses the strengths and weaknesses of three digital speckle methodologies. (1) Digital speckle pattern interferometry (DSPI) uses an optical polarization phase shifter for visualization and measurement of the density field in a flow field. (2) Digital shearing speckle interferometry (DSSI) utilizes speckle\|shearing interferometry in addition to optical polarization phase shifting. (3) Digital speckle photography (DSP) with computer reconstruction. The discussion describes the concepts, the principles and the experimental arrangements with some experimental results. The investigation shows that these three digital speckle techniques provide an excellent method for visualizing flow fields and for measuring density distributions in fluid mechanics and thermal flows. 展开更多
关键词 digital speckle flow visualization digital speckle pattern interferometry (DSPI) shearing speckle interferometry speckle photography
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Holography in the invisible. From the thermal infrared to the terahertz waves: outstanding applications and fundamental limits 被引量:4
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作者 Marc Georges Yuchen Zhao Jean-François Vandenrijt 《Light(Advanced Manufacturing)》 2022年第2期157-170,共14页
Since its invention,holography has been mostly applied at visible wavelengths in a variety of applications.Specifically,non-destructive testing of manufactured objects was a driver for developing holographic methods a... Since its invention,holography has been mostly applied at visible wavelengths in a variety of applications.Specifically,non-destructive testing of manufactured objects was a driver for developing holographic methods and all related ones based on the speckle pattern recording.One substantial limitation of holographic non-destructive testing is the setup stability requirements directly related to the laser wavelength.This observation has driven some works for 15 years:developing holography at wavelengths much longer than visible ones.In this paper,we will first review researches carried out in the infrared,mostly digital holography at thermal infrared wavelengths around 10 micrometers.We will discuss the advantages of using such wavelengths and show different examples of applications.In nondestructive testing,large wavelengths allow using digital holography in perturbed environments on large objects and measure large deformations,typical of the aerospace domain.Other astonishing applications such as reconstructing scenes through smoke and flames were proposed.When moving further in the spectrum,digital holography with so-called Terahertz waves(up to 3 millimeters wavelength)has also been studied.The main advantage here is that these waves easily penetrate some materials.Therefore,one can envisage Terahertz digital holography to reconstruct the amplitude and phase of visually opaque objects.We review some cases in which Terahertz digital holography has shown potential in biomedical and industrial applications.We will also address some fundamental bottlenecks that prevent fully benefiting from the advantages of digital holography when increasing the wavelength. 展开更多
关键词 Long wave infrared Terahertz waves Digital holography speckle interferometry
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A symmetry concept and significance of fringe patterns as a direct diagnostic tool in artwork conservation 被引量:2
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作者 Vivi Tornari 《Light(Advanced Manufacturing)》 2022年第2期58-79,共22页
Previous collaborative studies have shown the main fringe patterns and their typical classification with regard to defects.Nevertheless,the complexity of the results prevents defect detection automation based on a fri... Previous collaborative studies have shown the main fringe patterns and their typical classification with regard to defects.Nevertheless,the complexity of the results prevents defect detection automation based on a fringe pattern classification table.The use of fringe patterns for the structural diagnosis of artwork is important for conveying crucial detailed information and dense data sources that are unmatched compared to those obtained using other conventional or modern techniques.Hologram interferometry fringe patterns uniquely reveal existing and potential structural conditions independent of object shape,surface complexity,material inhomogeneity,multilayered and mixed media structures,without requiring contact and interaction with the precious surface.Thus,introducing a concept that from one hand allows fringe patterns to be considered as a powerful standalone physical tool for direct structural condition evaluation with a focus on artwork conservators'need for structural diagnosis while sets a conceptual basis for defect detection automation is crucial.The aim intensifies when the particularities of ethics and safety in the field of art conservation are considered.There are ways to obtain the advantages of fringe patterns even when specialized software and advanced analysis algorithms fail to convey usable information.Interactively treating the features of fringe patterns through step-wise reasoning provides direct diagnosis while formulates the knowledge basis to automate defect isolation and identification procedures for machine learning and artificial intelligence(AI)development.The transfer of understanding of the significance of fringe patterns through logical steps to an AI system is this work's ultimate technical aim.Research on topic is ongoing. 展开更多
关键词 HOLOGRAPHY Holographic interferometry speckle interferometry Fringe patterns ARTWORK Cultural heritage Heritage science SYMMETRY
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Pitting Kinetics of 304 Stainless Steel Using ESPI Detection Technique 被引量:4
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作者 Wen-Ming Tian Ying-Jun Ai +2 位作者 Song-Mei Li Nan Du Chao Ye 《Acta Metallurgica Sinica(English Letters)》 SCIE EI CAS CSCD 2015年第4期430-437,共8页
The electronic speckle pattern interferometer was used to in situ monitor the pitting corrosion of 304 stainless steel at anodic polarization. The pitting current and pitting current density of a single pit were obtai... The electronic speckle pattern interferometer was used to in situ monitor the pitting corrosion of 304 stainless steel at anodic polarization. The pitting current and pitting current density of a single pit were obtained. The pit growth was controlled by the corrosion products diffusion. The pit morphology was observed by a scanning electron microscope. The results showed that the pit was dish shaped, and the geometric parameters and pit growth time conformed to the function of Y = A + B1t + B2t2 + B3t3. 展开更多
关键词 Stainless steel CORROSION Electronic speckle pattern interferometry (ESPI) PITTING
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Shearography and its applications-a chronological review 被引量:2
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作者 Rajpal Sirohi 《Light(Advanced Manufacturing)》 2022年第1期1-30,共30页
This paper presents the activities in the field of shearography in chronological order and highlights the great potential of this holographic measurement technology.After a brief introduction,the basic theory of shear... This paper presents the activities in the field of shearography in chronological order and highlights the great potential of this holographic measurement technology.After a brief introduction,the basic theory of shearography is presented.Shear devices,phase-shift arrangements,and multiplexed shearography systems are described.Finally,the application areas where shearography has been accepted and successfully used as a tool are presented. 展开更多
关键词 Electronic speckle pattern interferometry SHEAROGRAPHY Non-destructive testing
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A DEVELOPED FULL-FIELD FEM ANALYSIS COMBINED WITH ESPI FOR THE INVESTIGATION OF DEFECT EVOLUTION IN POLYMER FILMS
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作者 Xiao-fang Liu Shuai-xia Tan +2 位作者 Xiao-li Zhang 赵宁 徐坚 《Chinese Journal of Polymer Science》 SCIE CAS CSCD 2013年第7期1022-1028,共7页
A full-field finite element method (FEM) analysis combined with electronic speckle pattern interferometry (ESPI) measurement was developed to investigate defect evolution in polymer films. Different from the previ... A full-field finite element method (FEM) analysis combined with electronic speckle pattern interferometry (ESPI) measurement was developed to investigate defect evolution in polymer films. Different from the previous reports, which only compare the ESPI experimental and FEM simulated results at several points or lines, herein the full-field FEM results were exported, subtracted with a continuous distribution. By choosing proper parameters and number of substeps, the simulated and experimental results showed excellent correspondence. Furthermore, the displacement fields vertical to the tensional direction were also presented, and the strain field was preliminarily evaluated. The current method of combination of ESPI and FEM allows for capturing the experimental fringe maps to validate and optimize FEM results simulated, and would give a higher security to structural and mechanical analysis of polymeric materials. 展开更多
关键词 Electronic speckle pattern interferometry Finite element method DEFECT In-plane displacement Polymer film.
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