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Absolute quantitative detection of genetically modified soybean MON87708×MON89788 with stacked traits by digital polymerase chain reaction 被引量:1
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作者 Junyi Xu Xin Li +4 位作者 Jinglian Bai Ying Liu Shaojie Wang Yueting Liu Chunguang Yang 《Oil Crop Science》 CSCD 2022年第4期180-188,共9页
The main advantage of digital PCR(dPCR) is that it facilitates absolute quantification of the target without reference to the standard/calibration curve.Crystal droplet dPCR has a three-color staining detection functi... The main advantage of digital PCR(dPCR) is that it facilitates absolute quantification of the target without reference to the standard/calibration curve.Crystal droplet dPCR has a three-color staining detection function,which enables multiplex PCR reaction.In this study,this technique was used to establish triple dPCR detection for the genetically modified soybean MON87708 × MON89788 with stacked traits.Specific absolute quantitative detection was accomplished for the genomic DNA extracted from the homogenized seeds of GM stack MON87708× MON89788 soybean.Our results can serve as a reference for the absolute quantitative detection of stacked events of genetically modified crops. 展开更多
关键词 Absolute quantification Digital PCR Genetically modified soybean MON87708×MON89788 Stacked event
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An advanced SEU tolerant latch based on error detection 被引量:5
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作者 Hui Xu Jianwei Zhu +1 位作者 Xiaoping Lu Jingzhao Li 《Journal of Semiconductors》 EI CAS CSCD 2018年第5期77-80,共4页
This paper proposes a latch that can mitigate SEUs via an error detection circuit.The error detection circuit is hardened by a C-element and a stacked PMOS.In the hold state,a particle strikes the latch or the error d... This paper proposes a latch that can mitigate SEUs via an error detection circuit.The error detection circuit is hardened by a C-element and a stacked PMOS.In the hold state,a particle strikes the latch or the error detection circuit may cause a fault logic state of the circuit.The error detection circuit can detect the upset node in the latch and the fault output will be corrected.The upset node in the error detection circuit can be corrected by the C-element.The power dissipation and propagation delay of the proposed latch are analyzed by HSPICE simulations.The proposed latch consumes about 77.5%less energy and 33.1%less propagation delay than the triple modular redundancy(TMR)latch.Simulation results demonstrate that the proposed latch can mitigate SEU effectively. 展开更多
关键词 single event upset(SEU) latch error detection stacked
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