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Fast statistical delay evaluation of RC interconnect in the presence of process variations
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作者 李建伟 董刚 +1 位作者 杨银堂 王增 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2010年第4期104-108,共5页
Fast statistical methods of interconnect delay and slew in the presence of process fluctuations are proposed. Using an optimized quadratic model to describe the effects of process variations, the proposed method enabl... Fast statistical methods of interconnect delay and slew in the presence of process fluctuations are proposed. Using an optimized quadratic model to describe the effects of process variations, the proposed method enables closedform expressions of interconnect delay and slew for the given variations in relevant process parameters. Simulation results show that the method, which has a statistical characteristic similar to traditional methodology, is more efficient compared to HSPICE-based Monte Carlo simulations and traditional methodology. 展开更多
关键词 process variations RC delay static delay
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