Current methodologies used for the inference of thin film stress through curvature measurements are strictly restricted to stress and curvature states which are assumed to remain uniform over the entire film/substrate...Current methodologies used for the inference of thin film stress through curvature measurements are strictly restricted to stress and curvature states which are assumed to remain uniform over the entire film/substrate system. By considering a circular thin film/substrate system subject to non-uniform, but axisymmetric misfit strain distributions in the thin film, we derived relations between the film stresses and the misfit strain, and between the plate system＇s curvatures and the misfit strain. These relations feature a “local” part which involves a direct dependence of the stress or curvature components on the misfit strain at the same point, and a “non-local” part which reflects the effect of misfit strain of other points on the location of scrutiny. Most notably, we also derived relations between the polar components of the film stress and those of system curvatures which allow for the experimental inference of such stresses from full-field curvature measurements in the presence of arbitrary radial non-uniformities. These relations also feature a “non-local” dependence on curvatures making a full-field measurement a necessity. Finally, it is shown that the interfacial shear tractions between the film and the substrate are proportional to the radial gradients of the first curvature invariant and can also be inferred experimentally.展开更多
The combined effects of void size and void shape on the void growth are studied by using the classical spectrum method. An infinite solid containing an isolated prolate spheroidal void is considered to depict the void...The combined effects of void size and void shape on the void growth are studied by using the classical spectrum method. An infinite solid containing an isolated prolate spheroidal void is considered to depict the void shape effect and the Fleck-Hutchinson phenomenological strain gradient plasticity theory is employed to capture the size effects. It is found that the combined effects of void size and void shape are mainly controlled by the remote stress triaxiality. Based on this, a new size-dependent void growth model similar to the Rice-Tracey model is proposed and an important conclusion about the size-dependent void growth is drawn： the growth rate of the void with radius smaller than a critical radius rc may be ignored. It is interesting that rc. is a material constant independent of the initial void shape and the remote stress triaxiality.展开更多
文摘Current methodologies used for the inference of thin film stress through curvature measurements are strictly restricted to stress and curvature states which are assumed to remain uniform over the entire film/substrate system. By considering a circular thin film/substrate system subject to non-uniform, but axisymmetric misfit strain distributions in the thin film, we derived relations between the film stresses and the misfit strain, and between the plate system＇s curvatures and the misfit strain. These relations feature a “local” part which involves a direct dependence of the stress or curvature components on the misfit strain at the same point, and a “non-local” part which reflects the effect of misfit strain of other points on the location of scrutiny. Most notably, we also derived relations between the polar components of the film stress and those of system curvatures which allow for the experimental inference of such stresses from full-field curvature measurements in the presence of arbitrary radial non-uniformities. These relations also feature a “non-local” dependence on curvatures making a full-field measurement a necessity. Finally, it is shown that the interfacial shear tractions between the film and the substrate are proportional to the radial gradients of the first curvature invariant and can also be inferred experimentally.
基金The project supported by the National Natural Science Foundation of China(A10102006)the New Century Excellent Talents in Universities of China.
文摘The combined effects of void size and void shape on the void growth are studied by using the classical spectrum method. An infinite solid containing an isolated prolate spheroidal void is considered to depict the void shape effect and the Fleck-Hutchinson phenomenological strain gradient plasticity theory is employed to capture the size effects. It is found that the combined effects of void size and void shape are mainly controlled by the remote stress triaxiality. Based on this, a new size-dependent void growth model similar to the Rice-Tracey model is proposed and an important conclusion about the size-dependent void growth is drawn： the growth rate of the void with radius smaller than a critical radius rc may be ignored. It is interesting that rc. is a material constant independent of the initial void shape and the remote stress triaxiality.
