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Analytical modeling and simulation of germanium single gate silicon on insulator TFET 被引量:1
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作者 T.S.Arun Samuel N.B.Balamurugan 《Journal of Semiconductors》 EI CAS CSCD 2014年第3期25-28,共4页
This paper proposes a new two dimensional(2D) analytical model for a germanium(Ge) single gate silicon-on-insulator tunnel field effect transistor(SG SOI TFET). The parabolic approximation technique is used to s... This paper proposes a new two dimensional(2D) analytical model for a germanium(Ge) single gate silicon-on-insulator tunnel field effect transistor(SG SOI TFET). The parabolic approximation technique is used to solve the 2D Poisson equation with suitable boundary conditions and analytical expressions are derived for the surfacepotential,theelectricfieldalongthechannelandtheverticalelectricfield.Thedeviceoutputtunnellingcurrent is derived further by using the electric fields. The results show that Ge based TFETs have significant improvements inon-currentcharacteristics.Theeffectivenessoftheproposedmodelhasbeenverifiedbycomparingtheanalytical model results with the technology computer aided design(TCAD) simulation results and also comparing them with results from a silicon based TFET. 展开更多
关键词 tunnel field effect transistor(TFET) analytical modelling Poisson equation surface potential electric field
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