In this paper, an extended analysis of the performance of different hybrid Rechargeable Energy Storage Systems (RESS) for use in Plug-in Hybrid Electric Vehicle (PHEV) with a series drivetrain topology is analyzed, ba...In this paper, an extended analysis of the performance of different hybrid Rechargeable Energy Storage Systems (RESS) for use in Plug-in Hybrid Electric Vehicle (PHEV) with a series drivetrain topology is analyzed, based on simulations with three different driving cycles. The investigated hybrid energy storage topologies are an energy optimized lithium-ion battery (HE) in combination with an Electrical Double-Layer Capacitor (EDLC) system, in combination with a power optimized lithium-ion battery (HP) system or in combination with a Lithium-ion Capacitor (LiCap) system, that act as a Peak Power System. From the simulation results it was observed that hybridization of the HE lithium-ion based energy storage system resulted from the three topologies in an increased overall energy efficiency of the RESS, in an extended all electric range of the PHEV and in a reduced average current through the HE battery. The lowest consumption during the three driving cycles was obtained for the HE-LiCap topology, where fuel savings of respectively 6.0%, 10.3% and 6.8% compared with the battery stand-alone system were achieved. The largest extension of the range was achieved for the HE-HP configuration (17% based on FTP-75 driving cycle). HP batteries however have a large internal resistance in comparison to EDLC and LiCap systems, which resulted in a reduced overall energy efficiency of the hybrid RESS. Additionally, it was observed that the HP and LiCap systems both offer significant benefits for the integration of a peak power system in the drivetrain of a Plug-in Hybrid Electric Vehicle due to their low volume and weight in comparison to that of the EDLC system.展开更多
The new electrical degradation phenomenon of the AlGaN/GaN high electron mobility transistor（HEMT） treated by low power fluorine plasma is discovered. The saturated current, on-resistance, threshold voltage, gate le...The new electrical degradation phenomenon of the AlGaN/GaN high electron mobility transistor（HEMT） treated by low power fluorine plasma is discovered. The saturated current, on-resistance, threshold voltage, gate leakage and breakdown voltage show that each experiences a significant change in a short time stress, and then keeps unchangeable. The migration phenomenon of fluorine ions is further validated by the electron redistribution and breakdown voltage enhancement after off-state stress. These results suggest that the low power fluorine implant ion stays in an unstable state. It causes the electrical properties of AlGaN/GaN HEMT to present early degradation. A new migration and degradation mechanism of the low power fluorine implant ion under the off-stress electrical stress is proposed. The low power fluorine ions would drift at the beginning of the off-state stress, and then accumulate between gate and drain nearby the gate side. Due to the strong electronegativity of fluorine, the accumulation of the front fluorine ions would prevent the subsequent fluorine ions from drifting, thereby alleviating further the degradation of AlGaN/GaN HEMT electrical properties.展开更多
文摘In this paper, an extended analysis of the performance of different hybrid Rechargeable Energy Storage Systems (RESS) for use in Plug-in Hybrid Electric Vehicle (PHEV) with a series drivetrain topology is analyzed, based on simulations with three different driving cycles. The investigated hybrid energy storage topologies are an energy optimized lithium-ion battery (HE) in combination with an Electrical Double-Layer Capacitor (EDLC) system, in combination with a power optimized lithium-ion battery (HP) system or in combination with a Lithium-ion Capacitor (LiCap) system, that act as a Peak Power System. From the simulation results it was observed that hybridization of the HE lithium-ion based energy storage system resulted from the three topologies in an increased overall energy efficiency of the RESS, in an extended all electric range of the PHEV and in a reduced average current through the HE battery. The lowest consumption during the three driving cycles was obtained for the HE-LiCap topology, where fuel savings of respectively 6.0%, 10.3% and 6.8% compared with the battery stand-alone system were achieved. The largest extension of the range was achieved for the HE-HP configuration (17% based on FTP-75 driving cycle). HP batteries however have a large internal resistance in comparison to EDLC and LiCap systems, which resulted in a reduced overall energy efficiency of the hybrid RESS. Additionally, it was observed that the HP and LiCap systems both offer significant benefits for the integration of a peak power system in the drivetrain of a Plug-in Hybrid Electric Vehicle due to their low volume and weight in comparison to that of the EDLC system.
基金supported by the Key Program of the National Natural Science Foundation of China(Grant No.61334002) and the National Natural Science Foundation of China(Grant Nos.61604114,61404097,and 61504099)
文摘The new electrical degradation phenomenon of the AlGaN/GaN high electron mobility transistor（HEMT） treated by low power fluorine plasma is discovered. The saturated current, on-resistance, threshold voltage, gate leakage and breakdown voltage show that each experiences a significant change in a short time stress, and then keeps unchangeable. The migration phenomenon of fluorine ions is further validated by the electron redistribution and breakdown voltage enhancement after off-state stress. These results suggest that the low power fluorine implant ion stays in an unstable state. It causes the electrical properties of AlGaN/GaN HEMT to present early degradation. A new migration and degradation mechanism of the low power fluorine implant ion under the off-stress electrical stress is proposed. The low power fluorine ions would drift at the beginning of the off-state stress, and then accumulate between gate and drain nearby the gate side. Due to the strong electronegativity of fluorine, the accumulation of the front fluorine ions would prevent the subsequent fluorine ions from drifting, thereby alleviating further the degradation of AlGaN/GaN HEMT electrical properties.
