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A Complete Critical Path Algorithm for Test Generation of Combinational Circuits
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作者 周权 魏道政 《Journal of Computer Science & Technology》 SCIE EI CSCD 1991年第1期74-82,共9页
It is known that critical path test generation method is not a complete algorithm for combinational circuits with reconvergent-fanout.In order to make it a complete algorithm,we put forward a reconvergent-fanout- orie... It is known that critical path test generation method is not a complete algorithm for combinational circuits with reconvergent-fanout.In order to make it a complete algorithm,we put forward a reconvergent-fanout- oriented technique,the principal critical path algorithm,propagating the critical value back to primary inputs along a single path,the principal critical path,and allowing multiple path sensitization if needed.Relationship among test patterns is also discussed to accelerate test generation. 展开更多
关键词 PATH A Complete Critical Path algorithm for test generation of Combinational Circuits test
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Generation method of minimal-complete-coverage interoperability test sequence based on digraph
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作者 LIN Huahui ZHAO Baohua QU Yugui 《Frontiers of Electrical and Electronic Engineering in China》 CSCD 2007年第1期29-33,共5页
Even if two implementations of a protocol pass the conformance testing,it cannot guarantee that they can interoperate properly;so direct testing of interoperation is considered indispensable.During the interoperabilit... Even if two implementations of a protocol pass the conformance testing,it cannot guarantee that they can interoperate properly;so direct testing of interoperation is considered indispensable.During the interoperability testing,a minimal number of test sequences are expected to check as many as possible implementation errors.By using minimal-complete-coverage criterion,the test sequence generation based on digraph can produce more effective test sequences. 展开更多
关键词 interoperability test interoperability equiva-lence minimal-complete-coverage criterion algorithm of test sequence generation DIGRAPH
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