A new probabilistic testability measure is presented to ease test length analyses of random testing and pseudorandom testing.The testability measure given in this paper is oriented to signal conflict of reconvergent f...A new probabilistic testability measure is presented to ease test length analyses of random testing and pseudorandom testing.The testability measure given in this paper is oriented to signal conflict of reconvergent fanouts.Test length analyses in this paper are based on a hard fault set,calculations of which are practicable and simple.Experimental results have been obtained to show the accuracy of this test length analyser in comparison with that of Savir,Chin and McCluskey,and Wunderlich by using a pseudorandom test generator combined with exhaustive fault simulation.展开更多
A global design for testability algorithm is offered in this paper. First, a test point candidate set is obtained to simplify the test point placemellt problem; the principle of selective tracing is offered to get a s...A global design for testability algorithm is offered in this paper. First, a test point candidate set is obtained to simplify the test point placemellt problem; the principle of selective tracing is offered to get a sequential test point placement solution, which is used as the initial solution of the global algorithm. Using this initial value, a branch & bound algorithm is then offered to obtain a global design for testability solution. Finally,a new test length analyser is offered to evaluate the global design for testability.展开更多
文摘A new probabilistic testability measure is presented to ease test length analyses of random testing and pseudorandom testing.The testability measure given in this paper is oriented to signal conflict of reconvergent fanouts.Test length analyses in this paper are based on a hard fault set,calculations of which are practicable and simple.Experimental results have been obtained to show the accuracy of this test length analyser in comparison with that of Savir,Chin and McCluskey,and Wunderlich by using a pseudorandom test generator combined with exhaustive fault simulation.
文摘A global design for testability algorithm is offered in this paper. First, a test point candidate set is obtained to simplify the test point placemellt problem; the principle of selective tracing is offered to get a sequential test point placement solution, which is used as the initial solution of the global algorithm. Using this initial value, a branch & bound algorithm is then offered to obtain a global design for testability solution. Finally,a new test length analyser is offered to evaluate the global design for testability.
