Via a mild thermal precipitation and aging process, polycrystalline hydrated nickel oxalate nanofibers were synthesized using nickel chloride and ammonium oxalate as raw materials, with pH 8.0 and temperature 60 ？C. ...Via a mild thermal precipitation and aging process, polycrystalline hydrated nickel oxalate nanofibers were synthesized using nickel chloride and ammonium oxalate as raw materials, with pH 8.0 and temperature 60 ？C. Atomic absorption spectrometer （AAS）, organic elemental analyzer （OEA）, fourier transform infrared spectroscopy （FT-IR）, thermogravimetry-derivative thermogravimetry （TG-DTG）, scanning electron microscopy （SEM）, and transmission electron microscopy （TEM） were used to characterize the products properties. The results demonstrated that the product was hydrated nickel oxalate. The sizes of hydrated nickel oxalate nanofibers were 100-150 nm in diameter, and 0.5-5.0 μm in length. A rational mechanism based on coordination self-assembly was discussed for the selective formation of the polycrystalline hydrated nickel oxalate nanofibers.展开更多
基于光束感生电阻变化(OBIRCH)的热激光激发定位技术广泛应用于半导体器件的失效分析,特别是大规模集成电路的短路失效定位。详细介绍了OBIRCH技术在芯片背面失效定位时的原理和方法,通过精密研磨、抛光等先进制样手段对失效样品进行开...基于光束感生电阻变化(OBIRCH)的热激光激发定位技术广泛应用于半导体器件的失效分析,特别是大规模集成电路的短路失效定位。详细介绍了OBIRCH技术在芯片背面失效定位时的原理和方法,通过精密研磨、抛光等先进制样手段对失效样品进行开封、芯片背面减薄。采用OBIRCH方法从芯片背面进行激光成像,成功对0.18μm工艺6层金属化布线的集成电路gg NMOS结构保护网络二次击穿和PMOS电容栅氧化层损伤进行了失效定位,并对背面定位图像和正面定位图像、In Ga As CCD成像进行了对比分析。结果表明,In Ga As CCD成像模糊并无法定位,OBIRCH背面定位成像比正面成像清楚,可以精确定位并观察到缺陷点。因此,OBIRCH技术用于集成电路短路的背面失效定位是准确的,可解决多层结构的正面定位难题。展开更多
基金Funded by the National Natural Science Foundation of China(51002126)the Open Project of State Key Laboratory Cultivation Base for Nonmetal Composites and Functional Materials (10zxfk30)
文摘Via a mild thermal precipitation and aging process, polycrystalline hydrated nickel oxalate nanofibers were synthesized using nickel chloride and ammonium oxalate as raw materials, with pH 8.0 and temperature 60 ？C. Atomic absorption spectrometer （AAS）, organic elemental analyzer （OEA）, fourier transform infrared spectroscopy （FT-IR）, thermogravimetry-derivative thermogravimetry （TG-DTG）, scanning electron microscopy （SEM）, and transmission electron microscopy （TEM） were used to characterize the products properties. The results demonstrated that the product was hydrated nickel oxalate. The sizes of hydrated nickel oxalate nanofibers were 100-150 nm in diameter, and 0.5-5.0 μm in length. A rational mechanism based on coordination self-assembly was discussed for the selective formation of the polycrystalline hydrated nickel oxalate nanofibers.
文摘基于光束感生电阻变化(OBIRCH)的热激光激发定位技术广泛应用于半导体器件的失效分析,特别是大规模集成电路的短路失效定位。详细介绍了OBIRCH技术在芯片背面失效定位时的原理和方法,通过精密研磨、抛光等先进制样手段对失效样品进行开封、芯片背面减薄。采用OBIRCH方法从芯片背面进行激光成像,成功对0.18μm工艺6层金属化布线的集成电路gg NMOS结构保护网络二次击穿和PMOS电容栅氧化层损伤进行了失效定位,并对背面定位图像和正面定位图像、In Ga As CCD成像进行了对比分析。结果表明,In Ga As CCD成像模糊并无法定位,OBIRCH背面定位成像比正面成像清楚,可以精确定位并观察到缺陷点。因此,OBIRCH技术用于集成电路短路的背面失效定位是准确的,可解决多层结构的正面定位难题。
