We have investigated the nonlinear optical properties, optical limiting thresholds, and figures of merits for five different phthalocyanine thin films, achieved through doping in PMMA polymer, using the Z-scan techniq...We have investigated the nonlinear optical properties, optical limiting thresholds, and figures of merits for five different phthalocyanine thin films, achieved through doping in PMMA polymer, using the Z-scan technique at 800 nm with 2 ps laser pulse excitation. From the open-aperture Z-scan data we derived that these molecules exhibit strong two photon absorption (2PA) with the nonlinear coefficients in the range of 15 - 200 cm/GW. We have also estimated the sign and magnitude of real part of third order nonlinearity through the closed aperture data. Preliminary femtosecond pump-probe data suggests that the lifetimes of excited states are in the sub-100 ps regime for all the molecules in film form. Our studies provide concrete evidence that these phthalocyanines are prospective candidates for multi-photon imaging and optical limiting applications.展开更多
A number of components installed in the secondary system of nuclear power plants are exposed to aging mechanisms such as FAC (Flow-Accelerated Corrosion), Cavitation, Flashing, and LDIE (Liquid Droplet Impingement Ero...A number of components installed in the secondary system of nuclear power plants are exposed to aging mechanisms such as FAC (Flow-Accelerated Corrosion), Cavitation, Flashing, and LDIE (Liquid Droplet Impingement Erosion). Those aging mechanisms can lead to thinning of the components. In April 2013, one inch small bore piping branched from the main steam line experienced leakage resulting from wall thinning in a 1000 MWe Korean PWR nuclear power plant. During the normal operation, extracted steam from the main steam line goes to condenser through the small bore piping. The leak occurred in the downstream of an orifice. A control valve with vertical flow path was placed in front of the orifice. This paper deals with UT thickness data, SEM images, and numerical simulation results in order to analyze the extent of damage and the cause of leakage in the small bore piping. As a result, it is concluded that the main cause of the small bore pipe wall thinning is liquid droplet impingement erosion. Moreover, it is observed that the leak occurred at the reattachment point of the vortex flow in the downstream side of the orifice.展开更多
By using the Monte Carlo method, we simulated the trajectories of coaxial backscattering electrons corresponding to a new type of scanning electron microscope. From the calculated results, we obtain a universal expres...By using the Monte Carlo method, we simulated the trajectories of coaxial backscattering electrons corresponding to a new type of scanning electron microscope. From the calculated results, we obtain a universal expression, which describes with good accuracy the backscattering coefficient versus film thickness under all conditions used. By measuring the coaxial backscattering coefficient and using this universal formula, the thickness of thin films can be determined if the composition is known.展开更多
The elastic indentation modulus and hardness of standard bulk materials and advanced thin films were determined by using the nanoindentation technique followed by the Oliver- Pharr post-treatment. After measurements w...The elastic indentation modulus and hardness of standard bulk materials and advanced thin films were determined by using the nanoindentation technique followed by the Oliver- Pharr post-treatment. After measurements with different loading/unloading schemes on chemically polished bulk titanium a substantial decrease of both modulus and hardness vs an increasing loading time was found. Then, hard nanostructured TiBN and TiCrBN thin films deposited by magnetron sputtering (using multiphase targets) on substrates of high roughness (sintered hard metal) and low roughness (silicon) were studied. Experimental modulus and hardness characterized by using two different nanoindenter tools were within the limits of standard deviation. However, a strong effect of roughness on the spread of the experimental values was observed and it was found that hardness and elastic indentation modulus obeyed a Gaussian distribution. The experimental data were discussed together with scanning probe microscopy (SPM) images of typical imprints taken after the nanoindentation tests and the local topographyls strong correlation with the results of nanoindentation was described.展开更多
A series of silica-phosphate nano-composites prepared as a host thin films Physical Properties of Nano-Composite Silica-Phosphate Thin Film Prepared by Sol Gel Technique and doped with different concentrations of Er3+...A series of silica-phosphate nano-composites prepared as a host thin films Physical Properties of Nano-Composite Silica-Phosphate Thin Film Prepared by Sol Gel Technique and doped with different concentrations of Er3+ ions have been synthesized using tetraesoxysilane TEOS, triethylphosphate TEP and erbium nitrate as precursor sources of silica, phosphorus and erbium oxides. The structural properties of pure silica-phosphate thin films and doped with different concentrations of Er3+ ions were studied, using x-ray diffraction (XRD) and Fourier Transform Infrared (FTIR). The morphology of silica-phosphate was characterized by Scanning electron microscope (SEM).展开更多
Magnetron sputtered YBa_2Cu_3O_(7-δ) superconducting thin films before and after ion implantation wereinvestigated by using high resolution electron microscopy and scanning electron microscopy. Very goodepitaxial but...Magnetron sputtered YBa_2Cu_3O_(7-δ) superconducting thin films before and after ion implantation wereinvestigated by using high resolution electron microscopy and scanning electron microscopy. Very goodepitaxial but defect-containing, effectively single crystalline films are demonstrated. The defect density concerning (001 ) plane decreases with increasing grown thickness of the film.展开更多
Micrcostructures of bulk and thin film YBa_2Cu_3O_(7-δ) superconductors were studied by using scanning elec-tron microscopy (SEM). It was confirmed that viscous technique processed bulk YBa_2Cu_3O_(7-δ) has a homoge...Micrcostructures of bulk and thin film YBa_2Cu_3O_(7-δ) superconductors were studied by using scanning elec-tron microscopy (SEM). It was confirmed that viscous technique processed bulk YBa_2Cu_3O_(7-δ) has a homoge-neous microstructure across the pellet diameter. Concerning the thin film, it was found that 2  ̄H ̄+ ion implanta-tion with a dose of 1× 10 ̄(12)cm ̄(-2) at 50 keV does not cause microstructural change of the film at a micrometrelevel. Combined with previous studies by using high resolution transmission electron microscopy, it appearsthat the structural modification is at an atomic scale.展开更多
A stripping method for the determination of hypoxanthine in the presence of copper at the submicromolar concentration levels is described. The method is based on controlled adsorptive accumulation of hypoxanthine-copp...A stripping method for the determination of hypoxanthine in the presence of copper at the submicromolar concentration levels is described. The method is based on controlled adsorptive accumulation of hypoxanthine-copper at the thin-film mercury electrode followed by a fast linear scan voltammetric measurement of the surface species. Optimum experimental conditions were found to be the use of 1.0 × 10﹣3 mol·L﹣1 NaOH solution as electrolyte supporting, an accumulation potential of ﹣0.50 V and a linear scan rate of 200 mV·s﹣1. The response of hypoxanthine-copper is linear over the concentration ranges of 10 - 60 ppb. For an accumulation time of 30 minutes, the detection limit was found to be 250 ppt (1.8 × 10﹣9 mol·L﹣1). Adequate conditions for measuring the hypoxanthine in the presence of metal ions, xanthine, uric acid and other nitrogenated bases were also investigated. The utility of the method is demonstrated by the presence of hypoxanthine associated in ATP or ssDNA.展开更多
Wurtzite hexagonal ZnO semiconductor nano-rods (NRs) thin films were grown on silicon substrates and silver wire with diameter equal 68 nm. Sol gel (SG) and aqueous chemical growth (ACG) methods by two steps of prepar...Wurtzite hexagonal ZnO semiconductor nano-rods (NRs) thin films were grown on silicon substrates and silver wire with diameter equal 68 nm. Sol gel (SG) and aqueous chemical growth (ACG) methods by two steps of preparation (seed layers and nano-rod growth) are used for samples preparation. The structural and morphological properties are evaluated using X-ray diffraction (XRD) and scanning electron microscope (SEM). The proposed iron ion sensor has shown good linearity for a wide concentration range from 0.078 M/L to 0.26 M/L of iron ions. The results show that the electrode is highly sensitive to iron ions with a slope around 47.8 mV/decade with a regression coefficient R2 = 0.96.展开更多
We report here the influence of thickness on the photosensing properties of copper sulfide (CuS) thin films. The CuS films were deposited onto glass substrate by using a simple and cost effective chemical bath deposit...We report here the influence of thickness on the photosensing properties of copper sulfide (CuS) thin films. The CuS films were deposited onto glass substrate by using a simple and cost effective chemical bath deposition method. The changes in film thickness as a function of time were monitored. The films were characterized using X-ray diffraction technique (XRD), field emission scanning electron microscopy (FE-SEM), optical measurement techniques and electrical measurement. X-ray diffraction results indicate that all the CuS thin films have an orthorhombic (covellite) structure with preferential orientation along (113) direction. The intensity of the diffraction peaks increases as thickness of the film increases. Uniform deposition having nanocrystalline granular morphology distributed over the entire glass substrate was observed through FE-SEM studies. The crystalline and surface properties of the CuS thin films improved with increase in the film thickness. Transmittance (except for 210 nm thick CuS film) together with band gap values was found to decrease with increase in thickness. I-V measurements under dark and illumination condition show that the CuS thin films give a good photoresponse.展开更多
文摘We have investigated the nonlinear optical properties, optical limiting thresholds, and figures of merits for five different phthalocyanine thin films, achieved through doping in PMMA polymer, using the Z-scan technique at 800 nm with 2 ps laser pulse excitation. From the open-aperture Z-scan data we derived that these molecules exhibit strong two photon absorption (2PA) with the nonlinear coefficients in the range of 15 - 200 cm/GW. We have also estimated the sign and magnitude of real part of third order nonlinearity through the closed aperture data. Preliminary femtosecond pump-probe data suggests that the lifetimes of excited states are in the sub-100 ps regime for all the molecules in film form. Our studies provide concrete evidence that these phthalocyanines are prospective candidates for multi-photon imaging and optical limiting applications.
文摘A number of components installed in the secondary system of nuclear power plants are exposed to aging mechanisms such as FAC (Flow-Accelerated Corrosion), Cavitation, Flashing, and LDIE (Liquid Droplet Impingement Erosion). Those aging mechanisms can lead to thinning of the components. In April 2013, one inch small bore piping branched from the main steam line experienced leakage resulting from wall thinning in a 1000 MWe Korean PWR nuclear power plant. During the normal operation, extracted steam from the main steam line goes to condenser through the small bore piping. The leak occurred in the downstream of an orifice. A control valve with vertical flow path was placed in front of the orifice. This paper deals with UT thickness data, SEM images, and numerical simulation results in order to analyze the extent of damage and the cause of leakage in the small bore piping. As a result, it is concluded that the main cause of the small bore pipe wall thinning is liquid droplet impingement erosion. Moreover, it is observed that the leak occurred at the reattachment point of the vortex flow in the downstream side of the orifice.
文摘By using the Monte Carlo method, we simulated the trajectories of coaxial backscattering electrons corresponding to a new type of scanning electron microscope. From the calculated results, we obtain a universal expression, which describes with good accuracy the backscattering coefficient versus film thickness under all conditions used. By measuring the coaxial backscattering coefficient and using this universal formula, the thickness of thin films can be determined if the composition is known.
基金supported by the "Communauté Franaise de Belgique-ARC 04/09-310"was done in the context of the EC VI FW international EXCELL Project
文摘The elastic indentation modulus and hardness of standard bulk materials and advanced thin films were determined by using the nanoindentation technique followed by the Oliver- Pharr post-treatment. After measurements with different loading/unloading schemes on chemically polished bulk titanium a substantial decrease of both modulus and hardness vs an increasing loading time was found. Then, hard nanostructured TiBN and TiCrBN thin films deposited by magnetron sputtering (using multiphase targets) on substrates of high roughness (sintered hard metal) and low roughness (silicon) were studied. Experimental modulus and hardness characterized by using two different nanoindenter tools were within the limits of standard deviation. However, a strong effect of roughness on the spread of the experimental values was observed and it was found that hardness and elastic indentation modulus obeyed a Gaussian distribution. The experimental data were discussed together with scanning probe microscopy (SPM) images of typical imprints taken after the nanoindentation tests and the local topographyls strong correlation with the results of nanoindentation was described.
文摘A series of silica-phosphate nano-composites prepared as a host thin films Physical Properties of Nano-Composite Silica-Phosphate Thin Film Prepared by Sol Gel Technique and doped with different concentrations of Er3+ ions have been synthesized using tetraesoxysilane TEOS, triethylphosphate TEP and erbium nitrate as precursor sources of silica, phosphorus and erbium oxides. The structural properties of pure silica-phosphate thin films and doped with different concentrations of Er3+ ions were studied, using x-ray diffraction (XRD) and Fourier Transform Infrared (FTIR). The morphology of silica-phosphate was characterized by Scanning electron microscope (SEM).
文摘Magnetron sputtered YBa_2Cu_3O_(7-δ) superconducting thin films before and after ion implantation wereinvestigated by using high resolution electron microscopy and scanning electron microscopy. Very goodepitaxial but defect-containing, effectively single crystalline films are demonstrated. The defect density concerning (001 ) plane decreases with increasing grown thickness of the film.
文摘Micrcostructures of bulk and thin film YBa_2Cu_3O_(7-δ) superconductors were studied by using scanning elec-tron microscopy (SEM). It was confirmed that viscous technique processed bulk YBa_2Cu_3O_(7-δ) has a homoge-neous microstructure across the pellet diameter. Concerning the thin film, it was found that 2  ̄H ̄+ ion implanta-tion with a dose of 1× 10 ̄(12)cm ̄(-2) at 50 keV does not cause microstructural change of the film at a micrometrelevel. Combined with previous studies by using high resolution transmission electron microscopy, it appearsthat the structural modification is at an atomic scale.
文摘A stripping method for the determination of hypoxanthine in the presence of copper at the submicromolar concentration levels is described. The method is based on controlled adsorptive accumulation of hypoxanthine-copper at the thin-film mercury electrode followed by a fast linear scan voltammetric measurement of the surface species. Optimum experimental conditions were found to be the use of 1.0 × 10﹣3 mol·L﹣1 NaOH solution as electrolyte supporting, an accumulation potential of ﹣0.50 V and a linear scan rate of 200 mV·s﹣1. The response of hypoxanthine-copper is linear over the concentration ranges of 10 - 60 ppb. For an accumulation time of 30 minutes, the detection limit was found to be 250 ppt (1.8 × 10﹣9 mol·L﹣1). Adequate conditions for measuring the hypoxanthine in the presence of metal ions, xanthine, uric acid and other nitrogenated bases were also investigated. The utility of the method is demonstrated by the presence of hypoxanthine associated in ATP or ssDNA.
文摘Wurtzite hexagonal ZnO semiconductor nano-rods (NRs) thin films were grown on silicon substrates and silver wire with diameter equal 68 nm. Sol gel (SG) and aqueous chemical growth (ACG) methods by two steps of preparation (seed layers and nano-rod growth) are used for samples preparation. The structural and morphological properties are evaluated using X-ray diffraction (XRD) and scanning electron microscope (SEM). The proposed iron ion sensor has shown good linearity for a wide concentration range from 0.078 M/L to 0.26 M/L of iron ions. The results show that the electrode is highly sensitive to iron ions with a slope around 47.8 mV/decade with a regression coefficient R2 = 0.96.
文摘We report here the influence of thickness on the photosensing properties of copper sulfide (CuS) thin films. The CuS films were deposited onto glass substrate by using a simple and cost effective chemical bath deposition method. The changes in film thickness as a function of time were monitored. The films were characterized using X-ray diffraction technique (XRD), field emission scanning electron microscopy (FE-SEM), optical measurement techniques and electrical measurement. X-ray diffraction results indicate that all the CuS thin films have an orthorhombic (covellite) structure with preferential orientation along (113) direction. The intensity of the diffraction peaks increases as thickness of the film increases. Uniform deposition having nanocrystalline granular morphology distributed over the entire glass substrate was observed through FE-SEM studies. The crystalline and surface properties of the CuS thin films improved with increase in the film thickness. Transmittance (except for 210 nm thick CuS film) together with band gap values was found to decrease with increase in thickness. I-V measurements under dark and illumination condition show that the CuS thin films give a good photoresponse.