Pulsed eddy current （PEC） non-destructive test- ing and evaluation （NDT＆E） has been around for some time and it is still attracting extensive attention from researchers around the globe, which can be witnessed th...Pulsed eddy current （PEC） non-destructive test- ing and evaluation （NDT＆E） has been around for some time and it is still attracting extensive attention from researchers around the globe, which can be witnessed through the reports reviewed in this paper. Thanks to its richness of spectral components, various applications of this technique have been proposed and reported in the lit- erature covering both structural integrity inspection and material characterization in various industrial sectors. To support its development and for better understanding of the phenomena around the transient induced eddy currents, attempts for its modelling both analytically and numeri- cally have been made by researchers around the world. This review is an attempt to capture the state-of-the-art development and applications of PEC, especially in the last 15 years and it is not intended to be exhaustive. Future challenges and opportunities for PEC NDT＆E are also presented.展开更多
In response to the growing complexity and performance of integrated circuit(IC),there is an urgent need to enhance the testing and stability of IC test equipment.A method was proposed to predict equipment stability us...In response to the growing complexity and performance of integrated circuit(IC),there is an urgent need to enhance the testing and stability of IC test equipment.A method was proposed to predict equipment stability using the upper side boundary value of normal distribution.Initially,the K-means clustering algorithm classifies and analyzes sample data.The accuracy of this boundary value is compared under two common confidence levels to select the optimal threshold.A range is then defined to categorize unqualified test data.Through experimental verification,the method achieves the purpose of measuring the stability of qualitative IC equipment through a deterministic threshold value and judging the stability of the equipment by comparing the number of unqualified data with the threshold value,which realizes the goal of long-term operation monitoring and stability analysis of IC test equipment.展开更多
基金Ministry of Higher Education of Malaysia for funding the project on PEC NDT at IIUM through the research grant FRGS16-059-0558supported by the National Natural Science Foundation of China under research grants 51677187 and 51307172
文摘Pulsed eddy current （PEC） non-destructive test- ing and evaluation （NDT＆E） has been around for some time and it is still attracting extensive attention from researchers around the globe, which can be witnessed through the reports reviewed in this paper. Thanks to its richness of spectral components, various applications of this technique have been proposed and reported in the lit- erature covering both structural integrity inspection and material characterization in various industrial sectors. To support its development and for better understanding of the phenomena around the transient induced eddy currents, attempts for its modelling both analytically and numeri- cally have been made by researchers around the world. This review is an attempt to capture the state-of-the-art development and applications of PEC, especially in the last 15 years and it is not intended to be exhaustive. Future challenges and opportunities for PEC NDT＆E are also presented.
基金the National Natural Science Foundation of China(61306046,61640421)the Yicheng Elite Project(202371)+3 种基金the Open Project of National Local Joint Engineering Laboratory of RF Integration and Micro-assembly Technology(KFJJ20230101)the National Key Laboratory of Integrated Chips and Systems Project(SLICS-K202316)the Anhui University Research Project(2023AH050481)the Research on Testing Methods and Accuracy of High Frequency Signal Chips(2023AH050500)。
文摘In response to the growing complexity and performance of integrated circuit(IC),there is an urgent need to enhance the testing and stability of IC test equipment.A method was proposed to predict equipment stability using the upper side boundary value of normal distribution.Initially,the K-means clustering algorithm classifies and analyzes sample data.The accuracy of this boundary value is compared under two common confidence levels to select the optimal threshold.A range is then defined to categorize unqualified test data.Through experimental verification,the method achieves the purpose of measuring the stability of qualitative IC equipment through a deterministic threshold value and judging the stability of the equipment by comparing the number of unqualified data with the threshold value,which realizes the goal of long-term operation monitoring and stability analysis of IC test equipment.
