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XPS、AFM和ToF-SIMS的工作原理及在植物纤维表面分析中的应用 被引量:7
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作者 雷晓春 林鹿 李可成 《中国造纸学报》 EI CAS CSCD 2006年第4期97-101,共5页
介绍了先进的表面分析仪器化学分析电子能谱(XPS)、原子力显微镜(AFM)、含飞行时间分析器的二次离子质谱仪(ToF-SIMS)的工作原理,回顾了近年来它们在植物纤维表面分析中的成功应用,综合利用XPS、AFM及ToF-SIMS方法,可分析和解决制浆造... 介绍了先进的表面分析仪器化学分析电子能谱(XPS)、原子力显微镜(AFM)、含飞行时间分析器的二次离子质谱仪(ToF-SIMS)的工作原理,回顾了近年来它们在植物纤维表面分析中的成功应用,综合利用XPS、AFM及ToF-SIMS方法,可分析和解决制浆造纸过程中的现象和问题。 展开更多
关键词 XPS AFM ToF—SIMS 原理 纤维表面
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现代表面分析技术用于纤维表面研究的新进展 被引量:5
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作者 张正健 胡惠仁 《中国造纸》 CAS 北大核心 2007年第12期53-58,共6页
阐述了原子力显微镜(AFM)、化学力显微镜(CFM)、X射线光电子能谱(XPS)、飞行时间二次离子质谱(ToF-SIMS)几种先进表面分析技术的基本原理以及用于纸浆纤维表面研究的新进展。
关键词 纤维表面 原子力显微镜 化学力显微镜 X射线光电子能谱 飞行时间二次离子质谱
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表面残留有机沾污物的TOF-SIMS及XPS研究
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作者 邓朝辉 林晶 +1 位作者 任云珠 宗祥福 《分析测试学报》 CAS CSCD 1996年第2期1-5,共5页
飞行时间次级离子质谱(TOF-SIMS)结合X射线光电子能谱(XPS)分析了用化学方法清洗后、银片上残留的未知的有机物。结果显示,有机沾污物主要是一些含18~30碳原子、碳链饱和度很高的酮类和酯类化合物;个别有机物可... 飞行时间次级离子质谱(TOF-SIMS)结合X射线光电子能谱(XPS)分析了用化学方法清洗后、银片上残留的未知的有机物。结果显示,有机沾污物主要是一些含18~30碳原子、碳链饱和度很高的酮类和酯类化合物;个别有机物可能是硬脂酰胺。这种结构特点使有机物中的C=O基团易于采取氧原子指向基体表面的取向,通过带部分负电荷的氧原子与金属基体镜像力的作用而增强粘附。TOF-SIMS二维离子像显示有机沾污物在银片表面上呈极稀薄的均匀分布。 展开更多
关键词 tof-sims XPS 有机沾污物 银片
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空气中分子沾污(AMC)的实时监测 被引量:2
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作者 沈健 《洁净与空调技术》 2004年第2期49-52,共4页
简要地介绍了AiM监测器的原理及应用效果,该系统可以对沉积于SiO2表面的空气分子沾污AMC进行实时监测,所获得的数据对于了解洁净室内的工艺过程与产生AMC间的相互关系特别有用。通过监测吸附物总量的长期变化趋势,可以确定洁净室内环境... 简要地介绍了AiM监测器的原理及应用效果,该系统可以对沉积于SiO2表面的空气分子沾污AMC进行实时监测,所获得的数据对于了解洁净室内的工艺过程与产生AMC间的相互关系特别有用。通过监测吸附物总量的长期变化趋势,可以确定洁净室内环境沾污的基本值,以便有利于对新污染源的早期确认。 展开更多
关键词 空气分子沾污 洁净室 AMC 石英晶体微平衡计 声表面波 实时监测
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Low-resistance ohmic contacts on InAlN/GaN heterostructures with MOCVD-regrown n+-InGaN and mask-free regrowth process
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作者 郭静姝 祝杰杰 +9 位作者 刘思雨 刘捷龙 徐佳豪 陈伟伟 周雨威 赵旭 宓珉瀚 杨眉 马晓华 郝跃 《Chinese Physics B》 SCIE EI CAS CSCD 2023年第3期467-471,共5页
This paper studied the low-resistance ohmic contacts on InAlN/GaN with metal–organic chemical vapor deposition(MOCVD)regrowth technique.The 150-nm regrown n-InGaN exhibits a low sheet resistance of 31Ω/□,resulting ... This paper studied the low-resistance ohmic contacts on InAlN/GaN with metal–organic chemical vapor deposition(MOCVD)regrowth technique.The 150-nm regrown n-InGaN exhibits a low sheet resistance of 31Ω/□,resulting in an extremely low contact resistance of 0.102Ω·mm between n^(+)-InGaN and InAlN/GaN channels.Mask-free regrowth process was also used to significantly improve the sheet resistance of InAlN/GaN with MOCVD regrown ohmic contacts.Then,the diffusion mechanism between n^(+)-InGaN and InAlN during regrowth process was investigated with electrical and structural characterizations,which could benefit the further process optimization. 展开更多
关键词 InAlN/GaN low-resistance ohmic contacts metal–organic chemical vapor deposition(MOCVD) n^(+)-InGaN time of flight secondary ion mass spectrometry(tof-sims)
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Inhibition of galvanic corrosion in Al/Cu coupling model by synergistic combination of 3-Amino-1,2,4-triazole-5-thiol and cerium chloride
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作者 Inime Ime Udoh Hongwei Shi +2 位作者 Mohammad Soleymanibrojeni Fuchun Liu En-Hou Han 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2020年第9期102-115,共14页
Asynergistic inhibition study was carried out on an aluminium/copper galvanic coupling model in neutral aerated NaCl solution using scanning vibrating electrode technique(SVET).The approach allows the simulation of th... Asynergistic inhibition study was carried out on an aluminium/copper galvanic coupling model in neutral aerated NaCl solution using scanning vibrating electrode technique(SVET).The approach allows the simulation of the local micro-galvanic cells of AA2024-T3 obtained from the potential difference between the intermetallic particles(IMPs)and the aluminium matrix.The inhibition effect of CeCl3 and 3-Amino-1,2,4-triazole-5-thiol(ATAT)was demonstrated by the reduction in the galvanic current density over Al and Cu surfaces.An improved inhibition from positive synergistic effect was revealed by the combination of the two inhibitors after 24 h of immersion,with the best inhibition recorded for Ce1.5ATAT3.5.Scanning electron microscopy(SEM),X-ray photoelectron spectroscopy(XPS)and time of flight secondary ion mass spectrometry(ToF-SIMS)were used to characterize the Ce-and ATAT-based complex film formed and to illustrate the mechanism of inhibition. 展开更多
关键词 Aluminium alloy Galvanic corrosion Neutral inhibition Scanning vibrating electrode technique (SVET) X-ray photoelectron spectroscopy(XPS) time of flight secondary ion mass spectrometry(tof-sims)
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Multimodal element(including lithium)mapping in a Mg-9Li-4Al-1Zn alloy
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作者 Yu Zhang Yang Liu +3 位作者 Zhuoran Zeng Nick Birbilis Philip N.H.Nakashima Laure Bourgeois 《Journal of Magnesium and Alloys》 2024年第11期4468-4480,共13页
Determining the distribution of alloying elements,particularly lithium,is crucial for a holistic understanding of magnesium-lithium-based alloys.In this work,a bespoke ratio spectrum-imaging method based on electron e... Determining the distribution of alloying elements,particularly lithium,is crucial for a holistic understanding of magnesium-lithium-based alloys.In this work,a bespoke ratio spectrum-imaging method based on electron energy-loss spectroscopy,in combination with time-of-flight secondary ion mass spectrometry,energy-dispersive X-ray spectroscopy and Z-contrast imaging,was applied to an as-rolled LAZ941 alloy(Mg-9Li-4Al-1Zn in wt.%).This was done to characterize the distribution of alloying elements,including the distribution of solute in the magnesium matrix.The applications of different mapping techniques revealed that precipitates with two different morphologies are rich in Li,Al and Zn,compared to their surrounding matrix.Additionally,it was confirmed that theβ-phase of the alloy contains higher Li and lower Mg concentrations when compared to theα-phase.This study demonstrated the effectiveness and accuracy of the ratio spectrum-imaging method for mapping the elemental distribution(including lithium)in a range of Li-containing materials. 展开更多
关键词 Magnesium alloys Lithium distribution mapping Solute content mapping Phase determination Electron energy-loss spectroscopy(EELS) time-of-flight secondary ion mass spectrometry(tof-sims) Scanning transmission electron microscopy(STEM)
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