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4500 V SPT^+ IGBT optimization on static and dynamic losses
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作者 戴庆芸 田晓丽 +2 位作者 张文亮 卢烁今 朱阳军 《Journal of Semiconductors》 EI CAS CSCD 2015年第9期75-78,共4页
This paper concerns the need for improving the static and dynamic performance of the high voltage insulated gate bipolar transistor (HV IGBTs). A novel structure with a carrier stored layer on the cathode side, know... This paper concerns the need for improving the static and dynamic performance of the high voltage insulated gate bipolar transistor (HV IGBTs). A novel structure with a carrier stored layer on the cathode side, known as an enhanced planar IGBT of the 4500 V voltage class is investigated. With the adoption of a soft punch through (SPT) concept as the vertical structure and an enhanced planar concept as the top structure, signed as SPT+ IGBT, the simulation results indicate the turn-off switching waveform of the 4500 V SPT+ IGBT is soft and also realizes an improved trade-off relationship between on-state voltage drop (Von) and turn-off loss (Eoff) in comparison with the SPT IGBT. Attention is also paid to the influences caused by different carrier stored layer doping dose on static and dynamic performances, to optimize on-state and switching losses of SPT+ IGBT. 展开更多
关键词 IGBT SPT+ carrier stored layer on-state voltage drop turn-off loss trade off characteristic
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