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A Reflectron Time-of-Flight Mass Spectrometer with a Nano-Electrospray Ionization Source for Study of Metal Cluster Compounds
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作者 吴小虎 谢华 +3 位作者 刘志凌 苏海峰 林水潮 唐紫超 《Chinese Journal of Chemical Physics》 SCIE CAS CSCD 2016年第4期401-406,I0001,共7页
An experiment facility has been set up for the study of metal cluster compounds in our laboratory, which consists of a nano-electrospray ionization source, an ion transmission and focus system, and a reflectron time-o... An experiment facility has been set up for the study of metal cluster compounds in our laboratory, which consists of a nano-electrospray ionization source, an ion transmission and focus system, and a reflectron time-of-fight mass spectrometer. Taking advantage of the nano-electrospray ionization source, polyvalent ions are usually produced in the "ionization" process and the obtained mass resolution of the equipment is over 8000. The molecular ion peaks of metal cluster compounds [Au20(PPhpy2)10Cl2](SbF6)4, where PPhpy2=bis(2- pyridyl)phenylphosphine, and [AuaAg2(C)L6](BF4)4, where L=2-(diphenylphosphino)-5- methylpyridine, are distinguished in the respective mass spectrum, accompanied by some fragment ion peaks. In addition, the mass-to-charge ratios of the parent ions are determi- nated. Preliminary results suggest that the device is a powerful tool for the study of metal cluster compounds. It turns out that the information obtained by the instrumentation serves as an essential supplement to single crystal X-ray diffraction for structure characterization of metal cluster compounds. 展开更多
关键词 Nano-electrospray ionization source Ion transmission and focus system Reflectron time-of-flight mass spectrometer Metal cluster compounds Single crystal X-ray diffraction
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