Recovery of waste rare earth fluorescent powders by two steps acid leaching

The effects of the acid leaching and alkali fusion on the leaching efficiency of Y,Eu,Ce,and Tb from the waste rare earth fluorescent powders were investigated in this paper.The results show that hydrochloric acid is better than sulfuric acid in the first acid leaching,and NaOH is better than Na2CO3in the alkali fusion.In the first acid leaching,the Wloss is 20.94%when the waste rare earth fluorescent powders are acid leached in H?concentration 3 mol L-1and S/L ratio 1:3 for 4 h due to red powders dissolved.The better results of the alkali fusion can be got at 800℃ for 2 h when the NaOH is used.The blue powders and the green powders can be dissolved into NaAlO2and oxides such as rare earth oxide(REO).The REO can be dissolved in H?concentration 5 mol L-1,S/L1:10 for 3 h in the second acid leaching.The leaching rates of the Y,Eu,Ce,and Tb are 99.06%,97.38%,98.22%,and 98.15%,respectively.The leaching rate of the total rare earth is 98.60%.

TWO STEPS CHEMICAL-MECHANICAL POLISHING OF RIGID DISK SUBSTRATE TO GET ATOM-SCALE PLANARIZATION SURFACE

In order to get atomic smooth rigid disk substrate surface, ultra-fined alumina slurry and nanometer silica slurry are prepared, and two steps chemical-mechanical polishing （CMP） of rigid disk substrate in the two slurries are studied. The results show that, during the first step CMP in the alumina slurry, a high material removal rate is reached, and the average roughness （Ra） and the average waviness （Wa） of the polished surfaces can be decreased from previous 1.4 nm and 1.6 nm to about 0.6 nm and 0.7 nm, respectively. By using the nanometer silica slurry and optimized polishing process parameters in the second step CMP, the Ra and the Wa of the polished surfaces can be further reduced to 0.038 nm and 0.06 am, respectively. Atom force microscopy （AFM） analysis shows that the final polished surfaces are ultra-smooth without micro-defects.

FRACTIONAL-STEP FINITE ELEMENT METHOD FOR CALCULATION OF 3-D FREE SURFACE PROBLEM USING LEVEL SET METHOD

A two-step Taylor-Galerkin fractional-step finite element method, which is of second order accuracy in space and time, was proposed for the three-dimensional free surface problem. With this method, the intermediate velocity was explicitly obtained by neglecting pressure gradient term, and then the velocity was corrected by adding the effects of pressure once the pressure field had been obtained from the pressure Poisson equation. The level set approach was applied to track implicitly the free surface. In order to track the free surface, the transport equation of the level set function was solved at each time step and the level set function is reinitialized through iteration to maintain it as a distance function. The governing equations of the system were discretized by the two- step Taylor-Galerkin method, which is of high-order accuracy and easy to be used. The validity and reliability of this method in this article were proved by two numerical examples.